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    REFRACTIVE SCANNING INTERFEROMETER
    31.
    发明公开
    REFRACTIVE SCANNING INTERFEROMETER 审中-公开

    公开(公告)号：US20230375409A1

    公开(公告)日：2023-11-23

    申请号：US18136786

    申请日：2023-04-19

    Applicant: Rapid Phenotyping Pty Limited

    Inventor： Selene Rodd-Routley

    IPC: G01J3/453 ,  G01J3/14 ,  G01J9/02

    CPC classification number: G01J3/4537 ,  G01J3/14 ,  G01J9/02 ,  G01J2009/0284 ,  G01J2009/0288

    Abstract: Embodiments are disclosed relating to a refractively-scanning interferometer comprising an aperture that receives an incident light beam at a receiving angle, a beam splitter configured to split the incident light beam into a first beam and a second beam, a first and a second reflector arranged to reflect the first beam and second beam, respectively, towards a combining optical element, and a refractive Optical Path Difference (rOPD) assembly interposed between the beam splitter and the first reflector, wherein the rOPD Assembly refracts the first light beam an even number of times with induced phase discrepancy being a vector sum of a first phase discrepancy induced by a first refraction and a second phase discrepancy induced by a second refraction, the rOPD Assembly being configured such that the first phase discrepancy is substantially opposite in direction to the second phase discrepancy, a portion of the first and second phase discrepancies cancelling one another out to decrease magnitude of the phase discrepancy.

    MACH-ZEHNDER INTERFEROMETER HAVING A DOUBLY-CORRUGATED SPOOFED SURFACE PLASMON POLARITON WAVEGUIDE
    33.
    发明申请
    MACH-ZEHNDER INTERFEROMETER HAVING A DOUBLY-CORRUGATED SPOOFED SURFACE PLASMON POLARITON WAVEGUIDE 有权
    MACH-ZEHNDER干扰仪具有双重修正的表面等离子体POLARITON WAVEGUIDE

    公开(公告)号：US20150330838A1

    公开(公告)日：2015-11-19

    申请号：US14315933

    申请日：2014-06-26

    Applicant: The Regents of The University of Michigan

    Inventor： Pinaki Mazumder ,  Zhao Xu

    IPC: G01J9/02 ,  G02B6/125 ,  G02B6/122

    CPC classification number: G01J9/02 ,  G01J2009/0288 ,  G02B6/1226 ,  G02B2006/12159 ,  G02F2202/30 ,  G02F2203/10 ,  G02F2203/13

    Abstract: A Mach-Zehnder interferometer (MZI) structure based on a doubly-corrugated spoofed surface plasmon polariton (DC-SSPP) waveguide is presented. The dependence of phase change on the dielectric loading of the DC-SSPP structure causes the output from both arms to interfere and enhance features on the transmission spectrum of the MZI. The proposed MZI structure can be used for tag-free bio-molecular sensing. The highly localized electro-magnetic field at frequencies close to SSPP resonance is shown to reduce the sample amount needed to produce interference patterns without affecting the selectivity of the sensing structure.

    Abstract translation: 提出了基于双波纹欺骗表面等离子体激元（DC-SSPP）波导的马赫 - 曾德干涉仪（MZI）结构。 相变对DC-SSPP结构的介电负载的依赖性导致两臂的输出干扰和增强MZI透射光谱上的特征。 所提出的MZI结构可用于无标签生物分子检测。 显示出接近SSPP共振频率的高度局部化的电磁场，以减少产生干涉图案所需的样品量，而不影响感测结构的选择性。

    APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT METHOD
    34.
    发明申请
    APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT METHOD 有权
    非对称干涉仪系统和非平衡干涉测量方法

    公开(公告)号：US20130222810A1

    公开(公告)日：2013-08-29

    申请号：US13882800

    申请日：2011-11-02

    Applicant: Herve Lefevre ,  Cedric Molucon ,  Jean-Jacques Bonnefois ,  Karl Aubry

    Inventor： Herve Lefevre ,  Cedric Molucon ,  Jean-Jacques Bonnefois ,  Karl Aubry

    IPC: G01B9/02

    CPC classification number: G01B9/02055 ,  G01J9/0246 ,  G01J2009/023 ,  G01J2009/0261 ,  G01J2009/0288

    Abstract: An interferometric system includes a polarization separation element (10), a first polarization conversion element (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arms connected to one another by a first (6) and second (7) ends in order for a first and second beams (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion element (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining element (10), and a detection element (8) suitable for detecting an output beam (25).

    Abstract translation: 干涉测量系统包括偏振分离元件（10），第一偏振转换元件（11），马赫曾德尔干涉仪（2），其包括通过第一（6）和第二（6）彼此连接的第一（4）和第二（5） ）和第二（7）端部，以使具有相同偏振的第一和第二光束（20,21）分别以相反的传播方向以相互的方式穿过干涉仪，以便形成第一和第二干涉仪 光束（22,23），用于获得其偏振变换的干涉光束（24）的第二偏振转换元件（11），偏振组合元件（10）和适于检测的检测元件（8） 输出光束（25）。

    Electromagnetic radiation detector utilizing an electromagnetic radiation absorbing element in a Mach-Zehnder interferometer arrangement
    35.
    发明授权
    Electromagnetic radiation detector utilizing an electromagnetic radiation absorbing element in a Mach-Zehnder interferometer arrangement 失效
    电磁辐射探测器利用马赫 - 策德尔干涉仪装置中的电磁辐射吸收元件

    公开(公告)号：US5349437A

    公开(公告)日：1994-09-20

    申请号：US954521

    申请日：1992-09-30

    Applicant: Lloyd C. Bobb

    Inventor： Lloyd C. Bobb

    IPC: G01J5/58 ,  G01J9/02 ,  G01B9/02

    CPC classification number: G01J5/58 ,  G01J9/02 ,  G01J2009/023 ,  G01J2009/0288

    Abstract: Apparatus is provided to detect electromagnetic radiation, in which a radion-absorbing element is disposed on a short section of an optical waveguide to provide a thermal interface therebetween. Radiation is absorbed by the element, which thereby heats the waveguide, causing it to change its optical pathlength in proportion to the radiation absorbed. Interferometer apparatus is connected to measure this change in optical pathlength as a change in the interference condition. This device is highly sensitive and can be operated at room temperature.

    Abstract translation: 提供了用于检测电磁辐射的装置，其中辐射吸收元件设置在光波导的短部分上以在其间提供热界面。 辐射被元件吸收，从而加热波导，导致其与吸收的辐射成比例地改变其光程长度。 连接干涉仪装置以测量光路长度的变化作为干扰条件的变化。 该设备高度灵敏，可在室温下运行。

    Passive quadrature phase detection system for coherent fiber optic systems
    36.
    发明授权
    Passive quadrature phase detection system for coherent fiber optic systems 失效
    用于相干光纤系统的被动平衡相位检测系统

    公开(公告)号：US5200795A

    公开(公告)日：1993-04-06

    申请号：US401175

    申请日：1989-08-31

    Applicant: Byoung Y. Kim ,  Hee G. Park ,  Shangyuan Huang

    Inventor： Byoung Y. Kim ,  Hee G. Park ,  Shangyuan Huang

    IPC: G01J9/02 ,  G02B6/34 ,  H04B10/2581

    CPC classification number: H04B10/2581 ,  G01J9/02 ,  G01J2009/0226 ,  G01J2009/0288 ,  G02B6/02047 ,  G02B6/29352

    Abstract: A passive quadrature phase detection system for coherent fiber systems includes first and second optical detectors positioned to receive an output signal from the output end of an optical signal apparatus such as an interferometer, or the like. The optical signal from the apparatus includes light propagating in two propagation modes. As the light propagates away from the output end of the apparatus from the near field to the far field, the light in the two modes undergoes a relative phase shift of .pi./2 in accordance with the Guoy effect. The two detectors are positioned such that the first detector detects the intensity of light resulting from the interference between the two modes in the near field of the output signal, and such that the second detector detects the intensity of light resulting from the interference between the two modes in the far field of the output signal. The additional .pi./2 phase difference introduced between the two modes as the light propagates from the near field light to the far field causes the detected light intensities to be in phase quadrature. Electrical signals proportional to the detected light intensities can be processed to determine changes in the phase difference between the two modes within the apparatus. In preferred embodiments, the detection of the near field light intensity is accomplished at a position optically displaced from the output end of the apparatus.

    Abstract translation: 用于相干光纤系统的无源正交相位检测系统包括第一和第二光学检测器，其定位成从诸如干涉仪之类的光信号装置的输出端接收输出信号。 来自该装置的光信号包括以两种传播模式传播的光。 当光从设备的输出端从近场传播到远场时，两种模式中的光根据Guoy效应经历pi / 2的相对相移。 两个检测器被定位成使得第一检测器检测由输出信号的近场中的两个模式之间的干扰产生的光的强度，并且使得第二检测器检测由两者之间的干扰导致的光的强度 输出信号的远场模式。 当光从近场光传播到远场时，在两种模式之间引入的额外的π/ 2相位差导致检测到的光强度相位正交。 可以处理与检测到的光强度成比例的电信号，以确定装置内的两种模式之间的相位差的变化。 在优选实施例中，近场光强度的检测是在从设备的输出端光学位移的位置处完成的。

    Finetuning of embedded wavelength monitor
    38.
    发明公开
    Finetuning of embedded wavelength monitor 审中-公开
    Feineinstellung eine integriertenWellenlängenmonitors

    公开(公告)号：EP1850170A1

    公开(公告)日：2007-10-31

    申请号：EP06300846.0

    申请日：2006-08-01

    Applicant: Alcatel Lucent

    Inventor： Pfeiffer, Thomas, Dr.

    IPC: G02F1/225 ,  G01J9/02 ,  H01S5/0687

    CPC classification number: G01J9/0246 ,  G01J2009/0226 ,  G01J2009/0288 ,  G02B6/12007 ,  G02B6/29355 ,  G02B6/29385 ,  G02B6/4246 ,  G02F2001/212 ,  G02F2203/21 ,  H01S5/0687

    Abstract: The present invention relates to a method for fine-tuning an optical device (10, 110, 210) comprising two Mach Zehnder devices being detuned with respect to each other. The invention also relates to an optical device (10, 110, 210) comprising two Mach Zehnder devices. A first optical delay (ΔL opt ) is introduced into a path (12, 112, 212) common to both Mach Zehnder devices in order to introduce a path length difference which is common to both Mach Zehnder devices and which amounts to said first optical delay (ΔL opt ). A second optical delay (δl) is introduced into at least one path which belongs to only one of the Mach Zehnder devices, in order to detune the two Mach Zehnder devices with respect to each other.

    Abstract translation: 本发明涉及一种用于微调包括相对于彼此失谐的两个马赫曾德设备的光学装置（10,110,210）的方法。 本发明还涉及一种包括两个马赫曾德尔装置的光学装置（10,110,210）。 将第一光延迟（“L opt”）引入到两个Mach Zehnder装置共同的路径（12,112,212）中，以便引入两个Mach Zehnder装置通用的路径长度差，并且相当于所述第一光学延迟 延迟（“L opt”）。 将第二光延迟（'1）引入到仅属于马赫曾德器件中的一个的至少一个路径中，以便使两个Mach Zehnder器件相对于彼此失谐。

    A WAVELENGTH-INDEPENDENT INTERFEROMETER FOR OPTICAL SIGNAL PROCESSING
    40.
    发明授权
    A WAVELENGTH-INDEPENDENT INTERFEROMETER FOR OPTICAL SIGNAL PROCESSING 失效
    用于光信号处理的波长独立干涉仪

    公开(公告)号：EP0356443B1

    公开(公告)日：1992-12-02

    申请号：EP88902896.5

    申请日：1988-03-31

    Applicant: Secretary of State for Defence in Her Britannic Majesty's Gov. of the United Kingdom of Great Britain and Northern Ireland

    Inventor： SUTTON, Philip

    IPC: G01J9/02

    CPC classification number: G01J9/0215 ,  G01J3/18 ,  G01J2009/0288 ,  G01J2009/0296

    Abstract: A wavelength-independent-interferometer comprises means to receive light (10) from a field of view, means (BS1) to separate the light into two beams (11, 12), means (BS2) to combine the two beams, and dispersive means (30) interposed in the path (12) of one of the two beams to produce a wavelength-dependent shear. The dispersive means may be a transmission diffraction grating or a reflection grating. In the arrangement shown the optical elements are combined in a modified Mach-Zehnder interferometer. When the conventional Mach-Zehnder interferometer is illuminated with coherent light the separation of interference fringes produced in the interference plane is inversely proportional to the wavelength. By introducing a dispersive element in the invention the detector is sensitised to a pre-determined fringe separation. A moveable reticle is placed in front of a detector to sensitise the detector to the fringe pattern.

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