Abstract:
In one embodiment the disclosure relates to a method and a system for determining the corrected wavelength of a photon scattered by a sample. The method includes the steps of determining a wavelength of a photon scattered from a sample exposed to illuminating photons and passed through a tunable filter and correcting the determined wavelength of the photon as a function of the temperature of the tunable filter and as a function of the bandpass set point of the tunable filter. The step of correcting the determined wavelength can further include determining an offset and adding the offset to the determined wavelength of the photon.
Abstract:
The disclosure is generally directed to a method and apparatus for providing an image of a sample. The apparatus includes an illuminating source for transmitting photons to a sample. The transmitted photons illuminate the sample or are scattered upon reaching the sample. A lens collects the scattered photons and transmits the scattered photons to a tunable filter for forming an image. The illuminating photons traveling from the illuminating source to the sample do not pass through the lens.
Abstract:
Bei einem konfokalen Laserscanningmikroskop zur Raman- Spektroskopie mit einer Beleuchtungsanordnung (2), die einen Beleuchtungsstrahl zum Beleuchten eines Probenbereichs (23) bereitstellt, einer Scananordnung (3, 4), die den Beleuchtungsstrahl scannend über die Probe führt, und einer Detektoranordnung (5), die über die Scananordnung (3, 4) den beleuchteten Probenbereich (23) mittels einer konfokalen Blende (26) auf mindestens eine Detektoreinheit (28) abbildet ist vorgesehen, daß die Beleuchtungsanordnung (2) der Scananordnung (3, 4) einen linienförmigen Beleuchtungsstrahl bereitstellt, die Scananordnung (3, 4) den linienförmigen Beleuchtungsstrahl scannend über die Probe f führt und die konfokale Blende als Schlitzblende (26) oder als konfokale Blende wirkender schlitzförmiger Bereich (28, 48) der Detektoreinheit (28) ausgebildet ist.
Abstract:
A spectrometer (20) has a source of illumination radiation (21) having a plurality of spectral wavelengths, a bandpass filter (14), a dispersive beamsplitter (28), an illumination radiation rejection filter (34), and a spectrograph (32) each tunable in correspondences to a selected one of the plurality of spectral wavelengths of the source of illumination radiation. Any one of the tunable elements can comprise a holographic volume dispersion distraction grating and a mirror, both having fixed orientation displacement with respect to each other and being rotable for tuning around an avis corresponding to the interaction of the two planes coincident with the surfaces of said mirror and said grating.
Abstract:
A spectrometer (100) for characterizing a radiation beam, the spectrometer (100) comprising an optical radiation guiding system comprising a collimator (110) for collimating the radiation beam into a collimated radiation beam, and a beam shaper (120) for distributing the power of the collimated radiation beam over a discrete number of line shaped fields, and a spectrometer chip (130) wherein the spectrometer chip (130) is adapted for processing the radiation in a discrete number of line shaped fields coming from the beam shaper (120).
Abstract:
A Raman spectroscopy system has a filter arrangement comprising two filters (16, 26A) in series, to reject light of the illuminating wavenumber from the scattered light of interest. The filters are tilted and have different characteristics for light of first and second different polarisation states. To counter this, the filters are arranged so that their respective effects on the respective polarisation states at least partially cancel each other out. This may for example be done by arranging their tilt axes (32, 34) orthogonally to each other.
Abstract:
Low cost and form factor spectrometers are disclosed. A spectrometer comprises a substrate, a plurality of optical sensors (979), a plurality of spectral filters (977), an optical manifold (976) and one or more processing elements (980). The plurality of spectral filters (977) and the one or more processing elements (980) are mounted on the substrate. The spectral filters (977) are fixedly positioned over at least a group of the optical sensors (979) and fixedly positioned with respect to the substrate. An optical manifold (976) is fixedly positioned over the spectral filters (977). The optical manifold (976) has a plurality of exit ports and an entrance port, wherein light entering the entrance port is transmitted to an interior portion of the optical manifold (976) and a portion of the light is transmitted from the exit ports through some of the spectral filters (977). The spectrometers are disclosed embedded in printing and scanning devices, computer companion devices, scope-type devices and the like.
Abstract:
A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.
Abstract:
A spectrometer (20) has a source of illumination radiation (21) having a plurality of spectral wavelengths, a bandpass filter (14), a dispersive beamsplitter (28), an illumination radiation rejection filter (34), and a spectrograph (32) each tunable in correspondences to a selected one of the plurality of spectral wavelengths of the source of illumination radiation. Any one of the tunable elements can comprise a holographic volume dispersion distraction grating and a mirror, both having fixed orientation displacement with respect to each other and being rotable for tuning around an avis corresponding to the interaction of the two planes coincident with the surfaces of said mirror and said grating.