Ion trapping
    33.
    发明授权
    Ion trapping 失效
    离子捕获

    公开(公告)号:US06744042B2

    公开(公告)日:2004-06-01

    申请号:US09883841

    申请日:2001-06-18

    CPC classification number: H01J3/40 H01J49/027 H01J49/406 H01J49/4245

    Abstract: A method for trapping of a plurality of charged particles in a charged particle trap. The trap includes first and second electrode mirrors having a common optical axis, the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.

    Abstract translation: 一种用于在带电粒子阱中捕获多个带电粒子的方法。 该陷阱包括具有共同的光轴的第一和第二电极反射镜,该反射镜在两端配置成对准。 当施加电压时,反射镜能够产生由关键场参数定义的各个电场。 电场被配置为反射带电粒子,导致它们在反射镜之间振荡。 该方法包括沿着光轴将多个带电粒子作为具有预定的键束参数的光束引入陷阱。 该方法还包括为至少一个反射镜选择关键场参数,以便在光束中的带电粒子之间引起聚束。

    Positron trap beam source for positron microbeam production

    公开(公告)号:US06630666B2

    公开(公告)日:2003-10-07

    申请号:US09912372

    申请日:2001-07-26

    Abstract: A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is extracted from the cloud and is smaller in cross-sectional area than the cloud. The positron beam is to be transmitted to a focusing apparatus which transmits the positron beam onto a solid target. The vacuum chamber is to include a cooling gas to be supplied into the vacuum chamber and a compressing device for the positron cloud is to include a rotating electric field. A method for compressing the positron cloud to produce a thin positron beam, which is to be transmitted to a solid for the purpose of analyzing properties of the solid, comprises the steps of supplying a source of positrons within a vacuum environment, forming and containing the positron cloud within a Penning Trap, producing a positron beam, and focusing of that positron beam onto a solid. The method is also to include adding of a cooling gas within the vacuum environment.

    Dust collector in a cathode ray tube
    35.
    发明授权
    Dust collector in a cathode ray tube 失效
    阴极射线管中的集尘器

    公开(公告)号:US5371432A

    公开(公告)日:1994-12-06

    申请号:US889968

    申请日:1992-05-29

    CPC classification number: H01J3/40 H01J29/84

    Abstract: A dust collector for collecting dust in a cathode ray tube includes collecting parts which form a collecting space for collecting dust in the cathode ray tube. One of the collecting parts is formed by a retainer for retaining the collecting parts in the cathode ray tube. The dust collector improves the internal voltage characteristics of the CRT and the picture quality.

    Abstract translation: 用于在阴极射线管中收集灰尘的集尘器包括形成用于收集阴极射线管中的灰尘的收集空间的收集部分。 其中一个收集部分由用于将收集部分保持在阴极射线管中的保持器形成。 集尘器改善了CRT的内部电压特性和图像质量。

    Arrangement for preventing the alteration of the primary beam by
unwanted particles, such as sputter products, charged ions and
electrons and their secondary processes
    36.
    发明授权
    Arrangement for preventing the alteration of the primary beam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes 失效
    用于防止由不需要的颗粒(例如溅射产物,带电离子和电子)改变主光束的布置及其二次工艺

    公开(公告)号:US4123655A

    公开(公告)日:1978-10-31

    申请号:US827307

    申请日:1977-08-24

    CPC classification number: H01J3/40 G21K1/025 H01J37/09 H01J37/3002 H01J49/482

    Abstract: An arrangement relating to the prevention of the alteration of the primaryeam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes, and to the resulting local improvement in the operational vacuum in electron-beam devices, ion-beam devices and in electron-energy analyzers and ion-mass analyzers using only three-dimensional metallic microstructures known as particle traps. Substantially all the flat parts of the components of the instrument seen by the beams, such as electrodes, diaphragms, screening plates, housing walls and the like, consist of a metal having a low atomization rate and a very low desorption rate, such as titanium or zirconium or similar substances and their alloys. Apertures of less than 0.5 mm in diameter, situated close beside one another and extending substantially perpendicular to the surface, are provided in the surfaces of the components of the instrument, between which apertures a lattice structure remains located in the surface, the depth of the apertures being equal to or larger than their opening cross-section and the total cross-sectional area of the apertures corresponding to at least half the metal surface occupied thereby.

    Abstract translation: 与防止由不需要的颗粒(例如溅射产物,带电离子和电子)及其次要过程的主要束的改变以及由此导致的电子束装置中的操作真空的局部改进,离子束 器件和电子能量分析仪和离子质量分析仪仅使用三维金属微结构称为颗粒捕集阱。 基本上由梁观察到的仪器部件的所有平面部分,例如电极,隔膜,筛板,壳体壁等都由具有低雾化速率和非常低的解吸速率的金属组成,例如钛 或锆或类似物质及其合金。 在仪器部件的表面中设置直径小于0.5mm的孔径,彼此靠近并且基本上垂直于表面延伸,在孔的表面中,格子结构保持位于表面中,孔的深度 孔径等于或大于其开口横截面,并且孔的总横截面积对应于由此占据的金属表面的至少一半。

    ION GUIDE ELECTRODE CONFIGURATIONS FOR POLARITY-INDEPENDENT ION CONTAINMENT

    公开(公告)号:US20240038476A1

    公开(公告)日:2024-02-01

    申请号:US17877781

    申请日:2022-07-29

    Inventor: Michael W. Senko

    CPC classification number: H01J3/40

    Abstract: An ion guide includes a first arrangement of electrodes on a first surface, a second arrangement of electrodes on a second surface, and an ion containment space in a gap therebetween. The first arrangement includes first electrodes and second electrodes. Each first electrode includes a first main portion and a first edge portion. The first edge portion is wider than the first main portion. The second arrangement includes third electrodes and fourth electrodes. Each fourth electrode includes a fourth main portion and a fourth edge portion. The fourth edge portion is wider than the fourth main portion. The first edge portions are positioned opposite the fourth edge portions. The first electrodes and the third electrodes are configured to receive first RF voltages and the second electrodes and the fourth electrodes are configured to receive second RF voltages that are phase-shifted with respect to the first RF voltages.

    MASS SPECTROMETER
    39.
    发明申请
    MASS SPECTROMETER 审中-公开

    公开(公告)号:US20170323773A1

    公开(公告)日:2017-11-09

    申请号:US15520112

    申请日:2014-10-20

    Inventor: Shiro MIZUTANI

    Abstract: A high-voltage power source for applying high voltage to a nozzle of an ESI ion source includes a charge release assistant section (26) including switch circuits (62 and 65) and other elements for forcing electric charges accumulated at output terminals to be discharged in a polarity-switching operation, whereby the positive/negative switching of the polarity of the output voltage can be quickly performed. In the mass spectrometer according to the present invention, for example, when the voltage applied to the nozzle needs to be changed from Vi to V2 (where V1 and V2 are positive, and V1>V2), a voltage control section (20) under the command of a main controller (9) operates a positive voltage generation section (21) and negative voltage generation section (23) so as to temporarily provide a negative output voltage. After a predetermined period of time, the voltage control section operates the positive voltage generation section (21) and negative voltage generation section (23) so as to provide voltage V2. If the voltage was simply changed from V1 to V2, the voltage would decrease slowly and require considerable time for the change. The positive/negative switching of the polarity induces the discharging of the electric charges accumulated at the output terminals, and consequently, the voltage-switching operation from V1 to V2 is quickly performed.

    Electrostatic orbital trap mass spectrometer
    40.
    发明授权
    Electrostatic orbital trap mass spectrometer 有权
    静电轨道陷阱质谱仪

    公开(公告)号:US08796619B1

    公开(公告)日:2014-08-05

    申请号:US13915264

    申请日:2013-06-11

    CPC classification number: H01J3/40 H01J49/425

    Abstract: An orbital ion trap for electrostatic field ion trapping which includes an electrode structure defining an internal volume of the trap with at least some of electrode surfaces shaped to substantially follow equipotential lines of an ideal quadro-logarithmic electric potential around a longitudinal axis z. The ideal electric potential has an inner potential canyon, an outer potential canyon, and a low potential passage therebetween. The trap includes a trapping voltage supply which provides trapping voltages on the electrodes to generate a trapping electrostatic potential within the internal volume of the trap. The trapping electrostatic potential closely approximates at least a part of the ideal electric potential in at least a part of the internal volume of the trap.

    Abstract translation: 一种用于静电场离子捕获的轨道离子阱,其包括限定阱的内部体积的电极结构,其中至少一些电极表面被成形为基本上沿着纵向轴线z围绕理想的二次对数电位的等电位线。 理想的电位具有内部潜在的峡谷,外部的潜在峡谷以及它们之间的低电位通道。 陷阱包括捕获电压源,其在电极上提供捕获电压,以在陷阱的内部体积内产生捕获静电势。 陷阱静电势在阱的内部体积的至少一部分中紧密接近理想电位的至少一部分。

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