Abstract:
A memory device according to the technical object of the present invention includes a memory cell array which includes a plurality of memory cells and a page buffer unit which performs the logic operation of read data based on reading directions in the different voltage levels and data which is successively read in different voltage levels with regard to the memory cells. [Reference numerals] (10A) Memory controller; (11) ECC processor; (12) Read voltage control unit; (20A) Memory device; (21) Memory cell array; (22) Page buffer unit
Abstract:
A program method of a non-volatile memory device including multi-level cells which store multi-bit data performs a free program which programs the multi-level cells in mediate states. The method performs a main program which programs the multi-level cells in program states corresponding to the multi-bit data.
Abstract:
PURPOSE: Memory system and programming method thereof are provided to improve the performance by setting up data for main program operation in an optimal main program method. CONSTITUTION: Whether a required main program operation is normal main program operation or not is judged (S400). When the required main program operation is judged as normal main program operation, a normal main program method is selected (S410). When the required main program operation is not judged as normal main program operation, the time for executing the required main program operation is calculated (S420). According to the calculated time, one of the plurality of main program schemes is selected (S430).
Abstract:
PURPOSE: A non-volatile memory device and a memory system including the same are provided to improve the read operation speed of a partial page by implementing as an all bit line. CONSTITUTION: A memory cell array (110) is connected to multiple bit lines and multiple word lines. A page buffer circuit (130) senses memory cells connected to the selected word line through the multiple bit lines. A voltage generator (160) provides a read voltage to the selected word line. A control logic (150) controls the page buffer circuit and the voltage generator to sense the memory cells connected to the selected word line. The number of memory cells which are simultaneously sensed in a first read mode and a second read mode are different.
Abstract:
PURPOSE: A memory system including abrasion control logic, a data storage device, a memory card, and a solid state drive are provided to improve the performance of the memory system by reducing an ECC error rate and an increase rate of an erasing loop number. CONSTITUTION: A memory system(100) includes a non-volatile memory(110) and an abrasion control logic(126). The non-volatile memory has a user area and a buffer area. The abrasion control logic controls an operation for converting a part of a memory block in the user area into the buffer area based on abrasion information of the non-volatile memory.
Abstract:
PURPOSE: A method of operating a non-volatile memory device and a memory system including the same are provided to rapidly recover read errors regarding a reading operation by rapidly calculating the variation of data. CONSTITUTION: First data read from a target page is stored in a first page buffer(41) using a first read voltage level. Second data read from the target page is stored in a second page buffer(43) using a second read voltage level. Third data stored in a third page buffer(45) is changed through the first data transmitted from the first page buffer and the second data transmitted from the second page buffer in order to generate the same data as bit-wise XOR data.
Abstract:
PURPOSE: A memory system and a controlling method thereof are provided to efficiently prevent the overlap of a peak current from a plurality of semiconductor memory devices and minimize the operation delay of each semiconductor memory device. CONSTITUTION: Memory devices(MDEV1-MDEVn) include an internal clock generator and a memory. The internal clock generator(IGEN) generates an internal clock by synchronizing with a processor clock in response to the processor clock received from a controller(CNT). A memory is synchronized with the internal clock to generate a peak current. Two or more memory devices generate the internal clock which is activated in a different edge of the processor clock.
Abstract:
PURPOSE: An address mapping table management method and a memory device thereof are provided to extend the lifetime of the memory device and improve the performance by managing an address mapping table to reduce the elimination frequency of the memory device. CONSTITUTION: The first memory cell array(10) stores data. A wear-leveling controller(40) manages a ware-level. The second memory cell array(60) stores an address mapping table. If a conversion physical address mapped in a physical address of the first memory cell array is changed, a memory control unit(30) stores the movement quantity of an address which has to be moved based on the conversion physical address prior to the change in the address mapping table. The memory control unit maps the physical address to the changed conversion physical address with reference to the address mapping table.
Abstract:
A multi level cell flash memory device and a program method thereof are provided to perform flexible program for various requirements of a system, by performing the program regardless of the sequence of bits of multi bit data. According to a program method of a multi level cell flash memory device, a memory cell selected through plural program procedures is programmed with multi bit data(11,10,01,00). Data to be stored in the selected memory cell in the present program procedure is determined by the data of the selected memory cell and the present program procedure. According to the present program procedure, an address of bits programmed in the present program procedure is detected. The data of the selected memory cell is read. Target data is determined by referring to the detected address and the data of the selected memory cell.
Abstract:
An advanced sector protection scheme is provided to improve convenience and stability by restricting write operation for write protection state of sectors through a master cell. A memory cell array is constituted with sectors. A read/write circuit performs read and write operations of the memory cell array. A write protection control block(700) generates a write protection flag signal for a sector to be written. A control logic operates in response to the write protection flag signal, and controls the read/write circuit to perform write operation for the sector to be written selectively. The write protection control block includes a latch circuit(710), a cell array(720) and a check circuit(790). The latch circuit stores write state or write protection state of each sector temporarily. The cell array stores write state or write protection state of each sector permanently. The check circuit outputs the write protection flag signal.