Abstract:
PROBLEM TO BE SOLVED: To provide a sheetlike probe and its manufacturing method capable of obtaining a stable connection state with a circuit device having a fine pitch electrode, capable of obtaining durability of the electrode structure without dropout from an insulation film and capable of preventing positional misalignment between the electrode structures and an electrodes to be tested caused by temperature variation in a burn-in test. SOLUTION: The sheetlike probe is provided with a porous film in which a plurality of through holes are provided on each position of the contact film is penetratingly supported and at the same time the periphery of the contact film and the porous film are unitized with an insulation layer of flexible resin in the minute hole of the porous film, on the insulation layer a plurality of electrode structures are penetratively supported. Each electrode structure is composed of: a surface electrode part exposed to the surface of the insulation layer; a rear face electrode part exposed to the rear face of the insulation layer; a short circuit part extending from the base part of the surface electrode continuously through the insulation layer in a thickness direction to the rear face electrode for being connected; a retainer part extending outward from the base part of the surface electrode continuously along the surface of the insulation layer; and a support for supporting the insulation layer. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a sheet-like probe allowing certain prevention of a positional shift of electrode structures and inspected electrodes caused by a temperature change in a burn-in test even if an inspection target is a large-area wafer of a diameter ≥8 inches or a circuit device having the inspected electrodes of an extremely small pitch to stably maintain an excellent electric connection state, and to provide a manufacturing method therefor and application thereof. SOLUTION: In this sheet-like probe, the plurality of electrode structures respectively disposed according to a pattern corresponding to the electrodes to be connected, each having an exposed front face electrode part in the front face and an exposed rear face electrode part in the rear face each have a contact film held by an insulating film of a soft resin and a frame plate supporting the contact film. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an anisotropic conductive connector and an electric inspection device for a circuit device equipped with the same capable of performing expected electrical inspection even for a circuit device having a clock frequency of, for example, 1 GHz or higher. SOLUTION: The anisotropy conductive connector is equipped with a plurality of connecting conductive parts extending in a thickness direction arranged according to a pattern corresponding to the electrodes to be connected, and an elastic anisotropic conductive membrane having an insulating part for insulating the connecting conductive parts from each other. High frequency shielding conductive parts extending in the thickness direction are formed on the elastic anisotropy conductive membrane. The electric inspection device for the circuit device is equipped with the anisotropy conductive connector. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a sheet-like connector in which electrode structures provided with surface electrode sections having small diameters, high projecting heights/diameters, and high dimensional accuracy can be formed with high positional accuracy and with which an electrically connected stable state can be obtained even to electrodes arranged in short pitches, and to provide a method of manufacturing the connector and a probe device. SOLUTION: The sheet-like connector has an insulating sheet 11 and a plurality of electrode structures 15 which are arranged on the sheet 11 separately from each other in the facial direction, and each of which is constituted by connecting a projecting surface electrode 16 and a rear electrode to each other through a short-circuiting section. The insulating sheet 11 is composed of a material in which through holes can be formed by etching. The short-circuiting sections are formed by packing a metal in the through holes formed in the sheet 11 by etching. The surface electrodes 16 are formed by packing a metal in the patterned holes of a resist film formed on the surface of the insulating sheet 11. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide an anisotropically conductive connector capable of maintaining satisfactory conductivity for a long period of time even if the connector is used repeatedly in a large number of times, or the connector is used repeatedly in high temperature environments, and to provide applications of the same. SOLUTION: The anisotropically conductive connector has an elastic anisotropically conductive film in which a plurality of conductive portions for connection, capable of expanding in the thickness direction, are formed. Supposing the total number of the conductive portions for connection is Y, the electrical resistance of the conductive portions is R 1g when a weight of Y×1g is added to the thickness direction of the elastic anisotropically conductive film; and the electrical resistance of the conductive portions is R 6g when a weight of Y×6g is added to the thickness direction of the elastic anisotropically conductive film. Then, the elastic anisotropically conductive film has the following initial characteristics that the number of the conductive parts having R 1g of less than 1Ω is greater than or equal to 90% of the total number of the conductive parts, the number of the conductive parts having R 6g of less than 0.1Ω is greater than or equal to 95% of the total number of the conductive parts, and the number of the conductive parts having R 6g of greater than or equal to 0.5Ω is less than or equal to 1% of the total number of the conductive parts. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a thermal conduction plate to which a heating element or a heat receiving body can be adhered sufficiently close and which can highly efficiently conduct heat. SOLUTION: This thermal conduction plate is provided with a metallic substrate and a thermal conduction layer integrally provided on at least one surface of the substrate. The thermal conduction layer is composed of a flexible macromolecular material containing magnetic and nonmagnetic thermal conduction particles. The magnetic thermal conduction particles are contained in the layer in an oriented state where the particles are arranged in the thickness direction of the layer.
Abstract:
PROBLEM TO BE SOLVED: To provide a sheetlike probe and its manufacturing method capable of attaining a stable connection state for a circuit device having minute and fine pitch electrodes, capable of obtaining highly durable electrode structure without dropout from an insulation layer, capable of preventing positional misalignment between the electrode structures and testing electrodes caused by a temperature variation in a burn-in test to a wafer of large area or the circuit device with small pitch inspection electrodes, and capable of stably maintaining excellent connection state. SOLUTION: Each of electrode structure exposed to the surface of the insulation layer and protruding from the surface of the insulation layer is composed of: the front electrode part, the diameter of which becomes smaller according to the elevation from the base to the top; a rear electrode part exposed to the rear surface of insulation surface; the short circuit part extending continuously from the base end of the front electrode part in the thickness direction through the insulation layer and connected with the rear electrode. The sheetlike probe is characterized in that the base diameter of the front electrode is larger than that of the contact part of the short circuit part, and the thickness of the short circuit part is larger than that of the insulation layer. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a sheetlike probe of a high durability capable of surely attaining a stable electric connection state even for a circuit device provided with thick insulation layer and an electrode structure having a front electrode part of small diameter formed in small pitch. SOLUTION: Each of electrode structure exposed to the surface of the insulation layer and protruding from the surface of the insulation layer is composed of: the front electrode part, the diameter of which becomes smaller according to the elevation from the base to the top; a rear electrode part exposed to the rear surface of insulation surface; the short circuit part extending continuously from the base end of the front electrode in the thickness direction through the insulation layer and connected with the rear electrode. The sheetlike probe is characterized in that the base diameter of the front electrode is larger than that of the contact part of the short circuit part. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a miniaturized wafer inspection device wherein the useful life of an inspection circuit substrate thereof is not shortened, by which the inspection of many electrodes to be inspected can be carried out collectively, which has good electric characteristics, and by which an electric inspection of a high-functionality integrated circuit can be carried out; and to provide an anisotropically conductive connector for use in that device. SOLUTION: The anisotropically conductive connector comprises an elastic anisotropically conductive film consisting of a plurality of connecting conductors which are spaced apart from each other and extending in the thickness direction, and insulating portions formed between them; and a frame plate for supporting it. The frame plate consists of a metal material having a linear thermal expansion coefficient of 3×10 -6 -3×10 -5 K -1 . The connecting conductor is formed by densely filling conductive particles exhibiting magnetic properties having a numerical average diameter of 20-80 μm into an elastic polymeric material. A coating layer consisting of a noble metal having a thickness not less than 20 nm is formed on the surface of the conductive particle. The durometer hardness of the connecting conductor is 10-35. The electric resistance between the connecting conductors is not less than 10 MΩ. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an anisotropically conductive connector which is high in durability with a long service life for a long time, while keeping a proper conductivity when used repeatedly for many times in electrical inspection for a plurality of integrated circuits formed on a wafer, and to provide applications of the anisotropically conductive connector. SOLUTION: The anisotropically conductive connector is provided with an elastically anisotropic conductive film, formed with a plurality of conductive parts containing conductive particles and extending in the thickness direction, wherein the conductive particles contained in the conductive parts are laminated with coating layers of high conductive metal over core particles representing magnetism, and the coating layer is of high hardness. COPYRIGHT: (C)2005,JPO&NCIPI