Abstract:
PROBLEM TO BE SOLVED: To provide an aqueous dispersing element for chemical mechanical polishing having excellent polishing performance for metal films such as copper, barrier metal films such as tantalum, and insulation films, and which can be repeatedly used through a simple step; a method of manufacturing an aqueous dispersing element for chemical mechanical polishing; and a chemical mechanical polishing method. SOLUTION: The aqueous dispersing element for chemical mechanical polishing used for polishing the wiring layer composed of copper or copper alloy disposed on the electrooptic display substrate contains (A) abrasive particles; (B) organic acid; and (C) copper ions. The ratio of a long diameter Rmax of the abrasive particles (A) to their short diameter Rmin, namely Rmax/Rmin, is 1.0 to 1.5. The ingredient (C) is 5.0×10 4 to 2.0×10 5 ppm. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To secure high film flatness by forming a first dielectric thin film and a second dielectric thin film that is provided by applying a dielectric-forming composition onto the first dielectric thin film so that a dense layer is formed on the surface of the first dielectric thin film. SOLUTION: A dielectric-forming composition containing an organic solvent and at least one compound selected from the group consisting of a metal alkoxide including a metal species A and a metal species B, a metal carboxylate, a metal complex, and a metal hydroxide is applied onto a dielectric thin film 31 having an ABOx-type perovskite crystalline structure with voids of 10 nm or more, and is heated to form a dielectric thin film 32, thereby obtaining a dielectric film 3 having an ABOx-type perovskite crystalline structure. The dielectric-forming composition fills the voids 42 in the dielectric thin film 31 so that the voids in the surface of the dielectric thin film 31 are filled with the dielectric thin film 32, thereby obtaining a dense film in the region. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an electrode mechanism in a dielectric material film capacitor which assures close contact between a lower electrode and a layer under the lower electrode and is not easily oxidized and thermally stable. SOLUTION: The dielectric material film capacitor 20 comprises a lower electrode 22 in the thickness of 10 to 100 nm formed of a material including platinum, a dielectric material film 24 formed on the upper part of the lower electrode 22 and including an oxide having the type ABOx peroviskite structure, and an upper electrode 26 provided on the upper part of the dielectric material film 24. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To obtain a composition for forming a dielectric film which enables easy thickening of the film. SOLUTION: The composition for forming the dielectric film contains (A) a particle having an ABOx type crystalline structure (wherein A is at least one metal species chosen from Li, Na, Ca, Sr, Ba and La; and B is at least one metal species chosen from Ti, Zr, Ta and Nb), (B) at least one metal compound, (C) at least one hydrophilic organic solvent and (D) an organic polymer. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a composition for forming a dielectric film for forming the dielectric film having excellent dielectric characteristics and leak characteristics and a method for manufacturing the same. SOLUTION: The composition for forming the dielectric film includes (A) particles having a crystal structure of an ABOx type wherein a metal kind A is at least one kind of metal selected from Li, Na, Ca, Sr, Ba, and La and a metal kind B is at least one kind of metal selected from Ti, Zr, Ta and Nb, (B) at least one kind of a compound selected from a metal alkoxide, a metal carboxylate, metal complex and metal hydroxide, and (C) an organic solvent. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide coating solution to form a ferro-electric thin film on a substrate. SOLUTION: The coating solution for forming ferro-electric thin film, which contains (A) compound containing boron atoms and (B) organo-metallic compound having at least one selected from Ta, Bi, Sr, Nb, Pb, Zr and Ti as a constituent element. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a composition for film formation capable of forming a coating film having uniform thickness, excellent in mechanical strength, clack resistance, resistance to CMP(chemical Mechanical Polishing) and low in dielectric constant as a layer insulation material of a semiconductor element. SOLUTION: This composition for film formation includes (A) a hydrolyzate and/or a condensate of one or more kind of compounds selected from (A-1) R1aSi(OR2)4-a, (e.g. phenyltrimethoxy silane or the like), (A-2) R3bSi(OR4)4-b, (e.g. tetramethoxy silane or the like), (A-3) R5c(R6O)3-cSi-(R9)e-Si(OR7)3-dR8d, (e.g. hexamethoxydisiloxane or the like), and (B) a radical generator and/or a triazene compound having two or more -N=N-NR10R11 groups (e.g. bis(3,3- dimethyl-triazenylphenyl) ether or the like).
Abstract:
PROBLEM TO BE SOLVED: To improve the balance of uniformity, the dielectric constant characteristic and preservation stability of an application film and adhesion property against a base by continuously or intermittently adding water to specified compound, the chelate compound of specified metal and mixture containing organic solvent. SOLUTION: A composition for forming film is a compound shown by R1nSi(OR2)4-n. In a formula, R1 and R2 can be the same or different and they show a 1-5C alkyl group or a 6-20C aryl group. Then, (n) is the integer of 0-2 or the composition is the chelate compound of metal, which is shown by R3tM (OR4)s-t. In the formula, R3 is chelate solution, M is a metallic atom, R4 is the 2-5C alkyl group or the 6-20C aryl group, (s) is the valence of metal M and (t) is the integer of 1-s. The mixture containing an organic solvent and water are continuously or intermittently added to the compounds.
Abstract:
PROBLEM TO BE SOLVED: To provide a thermosetting resin composition excellent in storage stability in the form of a solution, capable of being cured without cracking, and capable of forming a cured product excellent in adhesion to various substrates, heat resistance, wet-heat resistance, electrical insulation properties, etc. SOLUTION: This composition comprises (A) a hydrolyzate of a hydrolyzable organosilane compound and/or a partial condensate thereof, and (B) a polyamic acid being a polyimide having carboxyl groups as polymer side chains and/or a precursor thereof, and desirably, (C) a chelate compound of a metal selected from the group consisting of zirconium, titanium and aluminum and/or an alkoxide compound of the same metal.