Abstract:
A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order sorting filter (7), a microplate receptacle (12) and a controller (6). The order sorting filter (7) of the spectrometer (1) comprises a substrate (23), a first optical thin film (24) and a second optical thin film (25), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23). A spectrometer (1) equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells (14) of microplates (13).
Abstract:
An optical filter having a variable spectral transmittance function of selectable shape is described which includes a spectrum forming element for dispersing a light beam into a characteristic spectrum, an optical system for forming an image of the spectrum and directing the image into a multi-element electronic spatial light modulator, such as a liquid crystal display or electrophoretic display, and an optical system for projecting the spectrally filtered light as a directed beam.
Abstract:
An optical system for a multidetector array spectrophotometer which includes multiple light sources for emitting light of selected wavelength ranges and means for selectively transmitting the selected wavelength ranges of light to respective slits of a multi-slit spectrograph for multiple wavelength range detection. The spectrograph has two or more slits which direct the selected wavelength ranges of the light spectra to fall upon a dispersive and focusing system which collects light from each slit, disperses the light by wavelength and refocuses the light at the positions of a single set of detectors.
Abstract:
An optical instrument of very high resolution is provided that can be used for monitoring semiconductor processes. Very high resolution may be considered in this application space to be resolutions sufficient to permit resolving of individual molecular rovibrational emission lines. In one example an optical instrument is provided that includes: (1) an optical interface that receives an optical fiber, (2) a narrow band pass filter that filters out a portion of an optical signal received via the optical fiber, (3) optical components that are selectively combined to process at least a portion of the unfiltered optical signal, wherein the optical components include a sensor that receives the unfiltered optical signal, and (4) one or more processors that process electrical signals from the sensor. The optical instrument can be a spectrometer suitable for a process control instrument.
Abstract:
The present invention relates to a lamella grating interferometer capable of being employed in a Fourier transform infrared (FTIR) spectrometer, the interferometer including a reflective surface in a circular shape and provided with a fixed portion including fixed mirrors and a movable portion including movable mirrors that are arranged with the fixed mirrors in a crossing manner to form a lamella structure with the fixed mirrors, a plurality of driving units disposed at outside the reflective surface and configured to apply driving forces for moving the movable portion, and a plurality of driving arms connecting the driving units to the movable portion of the reflective surface, respectively, and configured to move the movable portion in response to the driving forces applied by the driving units, wherein each of the plurality of driving arms is formed in a structure of repeating a preset bent shape plural times.