-
公开(公告)号:DE10246276B4
公开(公告)日:2007-03-01
申请号:DE10246276
申请日:2002-10-02
Applicant: LEICA MICROSYSTEMS
Inventor: SCHWAAB KLAUS , GANSER MICHAEL
IPC: G02B21/26
-
公开(公告)号:DE102005036529A1
公开(公告)日:2007-02-15
申请号:DE102005036529
申请日:2005-08-03
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WEIS ALBRECHT
Abstract: The method involves repeatedly recording an image of an object (5) using an imaging system such as a microscope. A marking (3) is imaged together with the object, where consecutive imaging of the marking is compared. Compensation of deviations of the respective markings takes place in the recorded object image. The marking is situated on a microscope slide (2), on which the object is captured. An independent claim is also included for a marking plate that is utilized in a method for imaging an object such as living cell.
-
公开(公告)号:DE102004026093A1
公开(公告)日:2005-12-22
申请号:DE102004026093
申请日:2004-05-25
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL
Abstract: A system for acquiring and displaying images of preparations is provided. The system includes a first and second illumination device, each including an illumination source defining a respective illumination beam path amid configured to emit light to illuminate the preparation. A camera and a display for displaying a portion of the preparation are further provided. The preparation can be placed on a stage that is movable in x and y coordinate directions. The frame is also provided with a combining device configured to combine the first imaging beam path and the second imaging beam path, and direct them to the camera.
-
公开(公告)号:DE10257521A1
公开(公告)日:2004-07-15
申请号:DE10257521
申请日:2002-12-10
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WEIS ALBRECHT
-
公开(公告)号:DE10250775A1
公开(公告)日:2003-06-12
申请号:DE10250775
申请日:2002-10-30
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WESNER JOACHIM
Abstract: A method for blind deconvolution of microscopic images, wherein a single parameter is varied in order to estimate the PSF. The single parameter takes into account the optical characteristics of the environment of the object (40) between the lens (20) of the microscope (1) and the region above the object. The individual parameter represents a functional context of the parameters of the individual layers.
-
公开(公告)号:AU2002365466A1
公开(公告)日:2003-06-10
申请号:AU2002365466
申请日:2002-11-28
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WESNER JOACHIM
Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object ( 40 ) between the objective ( 20 ) of the microscope ( 1 ) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.
-
57.
公开(公告)号:AU2002233157A1
公开(公告)日:2002-07-30
申请号:AU2002233157
申请日:2002-01-10
Applicant: LEICA MICROSYSTEMS
Inventor: WEISS ALBRECHT , GANSER MICHAEL
-
公开(公告)号:AU7383801A
公开(公告)日:2001-10-30
申请号:AU7383801
申请日:2001-04-10
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WEISS ALBRECHT , STENZEL RUDIGER
Abstract: The invention relates to a method and a device for laser cutting microscopic samples. The device for laser cutting microscopic samples comprises a microscope (1) having at least one lens (6) for observing a sample (12) that is to be cut The lens (6) defines an optical axis (14) and a lens aperture (34). A laser (4) is also connected to the microscope (1). The laser (4) generates a laser beam (41) that is injected into the lens (6) by means of at least one optical system (16). A diaphragm (18) is provided, which generates a dimmed laser beam (4b), whereby the laser aperture (36) generated by the lens (6) is smaller than the lens aperture (34) of the lens (6) itself.
-
公开(公告)号:AU5210701A
公开(公告)日:2001-10-30
申请号:AU5210701
申请日:2001-03-21
Applicant: LEICA MICROSYSTEMS
Inventor: GANSER MICHAEL , WEISS ALBRECHT , STENZEL RUDIGER
Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table ( 2 ) that defines a table surface ( 4 ). A holding device ( 14 ) for accommodating an object support ( 6 ) with a preparation ( 8 ) is arranged above the table surface ( 4 ) and is joined to the XY table ( 2 ) in a manner that permits it to be displaced in the Y direction ( 20 a) in the X direction ( 22 a). An open working space ( 16 ) is defined between the holding device ( 14 ) and the table surface ( 4 ). A catching device ( 10 ), which has at least one receptacle ( 12 ) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.
-
-
-
-
-
-
-
-