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公开(公告)号:FR2955391B1
公开(公告)日:2012-03-16
申请号:FR1050301
申请日:2010-01-18
Applicant: XENOCS
Inventor: PANINE PIERRE , HOGHOJ PETER
IPC: G01N23/201
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公开(公告)号:AT511695T
公开(公告)日:2011-06-15
申请号:AT07823313
申请日:2007-07-20
Applicant: XENOCS
Inventor: BOULEE PASCAL , CENDA DAN MIHAI , HOGHOJ PETER
IPC: G21K1/04 , G01N23/223 , H05G1/02
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公开(公告)号:FR2918501A1
公开(公告)日:2009-01-09
申请号:FR0756227
申请日:2007-07-02
Applicant: XENOCS SOC PAR ACTIONS SIMPLIF
Inventor: HOGHOJ PETER , BOULEE PASCAL , NTOVA PARASKEVI
Abstract: La présente invention concerne le domaine de l'instrumentation analytique par rayons X (RX). Elle concerne plus précisément un dispositif de délivrance d'un faisceau de rayons X à haute énergie, typiquement supérieure à 4 keV, pour des applications analytiques par rayons X.
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公开(公告)号:DE60226973D1
公开(公告)日:2008-07-17
申请号:DE60226973
申请日:2002-05-31
Applicant: XENOCS
Inventor: HOGHOJ PETER
Abstract: One aspect of the invention relates to a multi-layered reflective optical system for the reflection of X rays at a low angle of incidence, producing a two-dimensional optical effect. The inventive optical system comprises: a component having a surface which is reflective in such a way that a first optical effect is produced according to a first direction in space; and means for producing a second optical effect according to a second direction in space which is different from the first direction, characterized in that said means for producing a second optical effect are borne by the reflective surface. A second aspect of the invention relates to a method for the production of said optical system.
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公开(公告)号:FR2841371B1
公开(公告)日:2004-10-22
申请号:FR0207546
申请日:2002-06-19
Applicant: XENOCS
Inventor: HOGHOJ PETER , DARIEL AURELIEN , RODRIGUES SERGIO
IPC: G21K1/06
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公开(公告)号:AU2002344277A1
公开(公告)日:2002-12-09
申请号:AU2002344277
申请日:2002-05-31
Applicant: XENOCS
Inventor: HOGHOJ PETER
IPC: G02B5/08 , G02B5/10 , G02B5/18 , G02B5/26 , G02B5/28 , G03F1/00 , G03F7/20 , G21K1/06 , C23C14/22 , G03F1/14
Abstract: One aspect of the invention relates to a multi-layered reflective optical system for the reflection of X rays at a low angle of incidence, producing a two-dimensional optical effect. The inventive optical system comprises: a component having a surface which is reflective in such a way that a first optical effect is produced according to a first direction in space; and means for producing a second optical effect according to a second direction in space which is different from the first direction, characterized in that said means for producing a second optical effect are borne by the reflective surface. A second aspect of the invention relates to a method for the production of said optical system.
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公开(公告)号:AU2002314278A1
公开(公告)日:2002-12-09
申请号:AU2002314278
申请日:2002-05-31
Applicant: XENOCS
Inventor: HOGHOJ PETER
Abstract: One aspect of the invention relates to a multi-layered reflective optical system for the reflection of X rays at a low angle of incidence, producing a two-dimensional optical effect. The inventive optical system comprises: a component having a surface which is reflective in such a way that a first optical effect is produced according to a first direction in space; and means for producing a second optical effect according to a second direction in space which is different from the first direction, characterized in that said means for producing a second optical effect are borne by the reflective surface. A second aspect of the invention relates to a method for the production of said optical system.
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公开(公告)号:FR2825298A1
公开(公告)日:2002-12-06
申请号:FR0107229
申请日:2001-06-01
Applicant: XENOCS
Inventor: HOGHOJ PETER
IPC: C23C14/46 , G03F1/00 , G03F1/24 , B05D1/12 , B05B1/26 , B05C19/04 , B05D1/06 , B05D5/06 , B05D7/24
Abstract: The invention relates to a method for covering a support (30) with a layer of particles arising from a target entity (20), said method comprising the implementation of an ion source (10) for directing an ion beam (100) towards said target entity in order to create a particle flux (F) arising from the interaction between the ion beam and the target entity, with a view to depositing at least one part of the particle flux on the support, characterized in that the method involves setting the ion beam into motion between the ion source and the target entity in order to scan the target entity in such a way that coverings are created, said coverings having a controlled thickness according to a desired profile.The invention also relates to a structure and a filter made according to said method.
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公开(公告)号:US11796485B2
公开(公告)日:2023-10-24
申请号:US17621005
申请日:2020-12-29
Applicant: XENOCS SAS
Inventor: Peter Hoghoj , Blandine Lantz
IPC: G01N23/201 , G01N23/041 , G01N23/207
CPC classification number: G01N23/041 , G01N23/201 , G01N23/207 , G01N2223/054 , G21K2201/067
Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.
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公开(公告)号:US20230012833A1
公开(公告)日:2023-01-19
申请号:US17783183
申请日:2020-12-29
Applicant: XENOCS SAS
Inventor: Karsten JOENSEN , Peter HOGHOJ , Ronan MAHE
IPC: G01N23/041 , G01N23/201
Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.
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