-
公开(公告)号：KR1020160084888A
公开(公告)日：2016-07-15
申请号：KR1020150001090
申请日：2015-01-06
Applicant: 삼성디스플레이 주식회사
CPC classification number: H04N17/04 , G09G3/20 , G09G2360/145 , H04N5/225 , H04N17/02 , G01M11/00 , G01N21/84 , G01N2201/06
Abstract: 표시패널의발광상태측정방법은, 카메라의촬영범위가표시패널의하나의분할영역을포함하도록카메라의위치를설정하는단계, 카메라가하나의분할영역을촬영하여인식패턴촬영결과를생성하는단계, 카메라가하나의분할영역을촬영하여단색촬영결과를생성하는단계, 인식패턴촬영결과에기초하여단색촬영결과를수정하여하나의분할영역에상응하는수정된단색촬영결과를생성하는단계, 복수의분할영역들에상응하는복수의수정된단색촬영결과들을모두생성할때까지상기단계들을반복하는단계및 복수의수정된단색촬영결과들을조합하여표시패널의전체단색촬영결과를생성하는단계를포함한다.
Abstract translation: 本发明的目的是提供一种使用具有比显示面板更窄的拍摄范围的照相机来测量整个显示面板的发光状态的方法。 测量显示面板的发光状态的方法包括：设置相机的位置使得相机的拍摄范围包括显示面板的单个划分区域的步骤; 拍摄单个划分区域的步骤，以及通过照相机产生识别图案拍摄结果; 拍摄单个划分区域的步骤，以及通过照相机产生单色摄影结果; 基于识别图案拍摄结果修改单色拍摄结果的步骤，并且生成对应于单个划分区域的修改的单色拍摄结果; 重复上述步骤的步骤直到全部产生对应于多个划分区域的多个修改的单色摄影结果; 以及复合修改的单色摄影结果的步骤，并且生成显示面板的整体单色摄影结果。
-
公开(公告)号：US11977023B2
公开(公告)日：2024-05-07
申请号：US17765138
申请日：2020-09-24
Applicant: MICRO DIGITAL CO., LTD.
Inventor： Kyung Nam Kim
CPC classification number: G01N21/31 , G01J3/42 , G01N21/255 , G01N2021/035 , G01N2201/025 , G01N2201/06
Abstract: Provided is a spectrophotometric device including a base plate including a first surface to accommodate a sample thereon, a rotatable plate including a second surface corresponding to and spaced a certain distance apart from the first surface, a test beam radiator connected to the first surface through a first beam guide to radiate a test beam to the sample accommodated on a beam path between the first and second surfaces, a spectrophotometer connected to the second surface through a second beam guide to analyze spectroscopic properties of the sample by analyzing a characteristic beam having passed through the sample accommodated on the beam path, and a state determiner provided near the beam path to determine whether the sample accommodated between the first and second surfaces is in a state in which analysis of optical properties is enabled.
-
公开(公告)号：US20190025226A1
公开(公告)日：2019-01-24
申请号：US16037088
申请日：2018-07-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Akio ISHIKAWA , Ken OZAWA , Kwang-Soo KIM , Sean PARK , Mitsunori NUMATA
CPC classification number: G01N21/8806 , G01N21/956 , G01N2201/06 , G02B27/42 , G06T7/0002 , G06T2207/10152
Abstract: An imaging apparatus includes an illumination light source to output an illumination light, an illumination optical system to transmit the illumination light toward a sample, an imaging optical system to transmit light reflected from the sample, a stage to move the sample in a predetermined transfer direction, and a photographing unit to receive the reflected light. The imaging apparatus may include one or more diffraction grids located at conjugate focal planes of the sample. The operation of the photographing unit may be synchronized with a movement of the sample by the stage to obtain an image in accordance with a time delay integration method.
-
公开(公告)号：US09773304B2
公开(公告)日：2017-09-26
申请号：US15382762
申请日：2016-12-19
Applicant: Keyence Corporation
Inventor： Norimasa Mayumi
CPC classification number: H04N13/207 , G01N21/88 , G01N21/8803 , G01N21/8806 , G01N2201/06 , G06K9/18 , G06T7/0004 , G06T7/586 , G06T2207/10016 , G06T2207/10152 , G06T2207/20016 , G06T2207/30164 , H04N5/2256
Abstract: A photometric processing part calculates a normal vector of a surface of a workpiece from a plurality of luminance images acquired by a camera in accordance with the photometric stereo method, and performs synthesis processing of synthesizing at least two images out of an inclination image made up of pixel values based on the normal vector calculated from the plurality of luminance images and at least one reduced image of the inclination image, to generate an inspection image showing a surface shape of the inspection target. In particular, a characteristic size setting part sets a characteristic size which is a parameter for giving weight to a component of a reduced image at the time of performing the synthesis processing. The photometric processing part can generate a different inspection image in accordance with the set characteristic size.
-
公开(公告)号：US09719940B2
公开(公告)日：2017-08-01
申请号：US14875084
申请日：2015-10-05
Applicant: KLA-TENCOR CORPORATION
Inventor： Amnon Manassen , Andrew Hill , Avi Abramov
CPC classification number: G01N21/8806 , G01J1/0228 , G01J3/02 , G01J3/021 , G01J3/0218 , G01J3/0229 , G01J3/2823 , G01N21/47 , G01N21/8851 , G01N21/9501 , G01N21/956 , G01N21/95623 , G01N2021/8848 , G01N2201/06 , G03F7/70633
Abstract: Methods and systems are provided, which pattern an illumination of a metrology target with respect to spectral ranges and/or polarizations, illuminate a metrology target by the patterned illumination, and measure radiation scattered from the target by directing, at a pupil plane, selected pupil plane pixels from a to respective single detector(s) by applying a collection pattern to the pupil plane pixels. Single detector measurements (compressive sensing) has increased light sensitivity which is utilized to pattern the illumination and further enhance the information content of detected scattered radiation with respect to predefined metrology parameters.
-
Patent Agency Ranking
公开(公告)号：US20170115206A1
公开(公告)日：2017-04-27
申请号：US15301749
申请日：2015-03-31
CPC classification number: G01N21/0303 , G01N21/05 , G01N21/552 , G01N21/7746 , G01N21/8483 , G01N2021/0321 , G01N2021/0367 , G01N2201/06 , G01N2201/0873 , G02B6/34 , G02B6/4225
Abstract: The present disclosure concerns an apparatus (10) and method for reading out an optical chip (20). A light source (13) is arranged for emitting single mode source light (S1) from its emitter surface (A1) towards an optical input (21) of the optical chip (20). A light detector (14) is arranged for receiving measurement light (S2) impinging onto its receiver surface (A2) from an optical output (22) of the optical chip (20), and measuring said received measurement light (S2). The emitted source light (S1) is aligned to enter the optical input (21) of the optical chip (20) and the measurement light (S2) is aligned back onto the receiver surface (A2). The receiver surface (A2) is larger than the emitter surface (A1) for facilitating the overall alignment.
-
公开(公告)号：US20170003222A1
公开(公告)日：2017-01-05
申请号：US15106856
申请日：2014-12-10
Applicant: Koninklijke Philips N.V.
IPC: G01N21/552
CPC classification number: G01N21/552 , G01N15/1436 , G01N21/27 , G01N2015/1452 , G01N2201/06 , G02B21/18
Abstract: The invention relates to a detection apparatus (1) for detecting particles on or close to a particles detection surface (5) in a first optical detection mode and in a second optical detection mode, wherein a component of a light detection system (8) and/or a component of an optical system (9) of the detection apparatus is arranged to be used in the first detection mode and in the second detection mode. Since a component of the light detection system and/or a component of the optical system is arranged to be used in the first detection mode and in the second detection mode, this component does not need to be provided twice, i.e. for being used in the first detection mode and for being used in the second detection mode. This can lead to a reduced number of components and can make the detection apparatus technically less complex.
Abstract translation: 本发明涉及一种用于在第一光学检测模式和第二光学检测模式中检测颗粒检测表面（5）上或附近的颗粒的检测装置（1），其中光检测系统（8）和 /或检测装置的光学系统（9）的部件被布置成在第一检测模式和第二检测模式中使用。 由于光检测系统的组件和/或光学系统的组件被布置成在第一检测模式和第二检测模式中使用，所以该组件不需要提供两次，即用于 第一检测模式并用于第二检测模式。 这可能导致部件数量减少，并且可以使检测装置技术上不那么复杂。
-
58.发明申请Image Inspection Apparatus, Image Inspection Method, Image Inspection Program, Computer-Readable Recording Medium And Recording Device 有权图像检查装置，图像检查方法，图像检查程序，计算机可读记录介质和记录装置公开(公告)号：US20150355101A1
公开(公告)日：2015-12-10
申请号：US14716901
申请日：2015-05-20
Applicant: KEYENCE CORPORATION
Inventor： Zhuoli Sun
CPC classification number: G01N21/8806 , G01N2201/06 , G06T7/0004 , G06T7/0008 , G06T7/586 , G06T2207/10152 , G06T2207/30164 , H04N13/207 , H04N13/254
Abstract: An image inspection apparatus includes: an imaging section for capturing an image of a workpiece from a certain direction; an illumination section for illuminating the workpiece from different directions at least three times; an illumination controlling section for sequentially turning on the illumination sections one by one; an imaging generating section for driving the imaging section to generate a plurality of images; a normal vector calculating section for calculating a normal vector with respect to the surface of the workpiece at each of pixels by use of a pixel value of each of pixels having a corresponding relation among the plurality of images; and a contour image generating section for performing differential processing in an X-direction and a Y-direction on the calculated normal vector at each of the pixels, to generate a contour image that shows a contour of inclination of the surface of the workpiece.
Abstract translation: 图像检查装置包括：成像部，用于从特定方向捕获工件的图像; 用于从不同方向照射工件至少三次的照明部分; 照明控制部分，用于逐个依次打开照明部分; 成像产生部分，用于驱动成像部分以产生多个图像; 法线矢量计算部，其通过使用在所述多个图像中具有对应关系的每个像素的像素值来计算相对于每个像素处的所述工件的表面的法线矢量; 以及轮廓图像生成部件，用于在每个像素上对所计算的法线矢量在X方向和Y方向上执行差分处理，以生成表示工件表面的倾斜轮廓的轮廓图像。
-
公开(公告)号：US20130289919A1
公开(公告)日：2013-10-31
申请号：US13457952
申请日：2012-04-27
Applicant: David J. Wilson, JR. , Douglas Morris
Inventor： David J. Wilson, JR. , Douglas Morris
CPC classification number: B01D46/0086 , G01N21/59 , G01N2201/06
Abstract: A clogged filter detector has a transmitter and a sensor which are held in place by a transmitter bracket and a sensor bracket, respectively. The transmitter emits a beam of electromagnetic radiation, and the sensor is positioned in the path of this beam at a point such that the beam travels through a filter between the transmitter and the sensor. The transmitter and sensor are misaligned with the air flow at the point where the beam contacts the filter. The transmitter alternates between a transmitting mode and a dormant mode, and the transmitter emits a plurality of electromagnetic pulses during each transmitting mode.
Abstract translation: 堵塞的过滤器检测器具有分别由变送器支架和传感器支架保持在适当位置的变送器和传感器。 发射器发射电磁辐射束，并且传感器定位在该光束的路径中，使得光束传播通过发射器和传感器之间的滤光器。 变送器和传感器与光束接触过滤器的点处的气流不对齐。 发射机在发射模式和休眠模式之间交替，并且发射机在每个发射模式期间发射多个电磁脉冲。
-
公开(公告)号：US20130223056A1
公开(公告)日：2013-08-29
申请号：US13740590
申请日：2013-01-14
Applicant: Bio-Rad Laboratories, Inc.
Inventor： James W. Hillendahl , Evelio Perez
IPC: F21V21/005 , F21V13/02 , F21V9/08
CPC classification number: F21V21/005 , F21V9/083 , F21V13/02 , G01N21/255 , G01N21/6452 , G01N21/6456 , G01N27/447 , G01N2021/6463 , G01N2021/6471 , G01N2201/06 , G01N2201/0626 , G01N2201/0635
Abstract: A planar sample, particularly of the type used in biological laboratories for detection and sometimes analysis of two-dimensional arrays of proteins, nucleic acids, or other biological species, is illuminated by epi-illumination using optically filtered line lights that are arranged along opposing parallel sides of a rectangle in which the sample array resides, with two coaxial line lights on each side of the rectangle, and the two on any given side being separated by a gap whose optimal width depends on the wavelength band transmitted by the optical filter. Surprisingly, the gap eliminates the peak in intensity at the center of the sample area and the decrease that occurs from the center outward that would otherwise occur with a single continuous filtered line light, producing instead a substantially uniform intensity along the direction parallel to the line lights.
Abstract translation: 平面样品，特别是用于生物实验室中用于检测和有时分析蛋白质，核酸或其他生物物种的二维阵列的类型的样品，通过使用沿着相对的平行排列的光学滤波的线光照射外照射 样品阵列所在的矩形的边，在矩形的每一侧上具有两根同轴线灯，并且任意给定侧上的两根被间隔开，该间隙的最佳宽度取决于由滤光器传输的波长带。 令人惊奇的是，间隙消除了样品区域中心处的强度峰值以及从中心向外发生的减少，否则会出现与单个连续过滤线条光线相反的方向，沿着平行于该线条的方向产生基本均匀的强度 灯光
-
-
-
-
-
-
-
-
-
Search Results
138
records
(took 0.026 seconds)
