Abstract:
The invention relates to a characterization device (50) for characterizing a sample (S) comprising: - a memory (MEM) storing a mesured spectrum (A s+p ) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (A p ), - a processing unit (PU) configured to: * determine a spectral energy (E s+p ) of the measured spectrum (A s+p ) of the sample through the translucent material (A s+p ), * estimate a coefficient ( γ̂ ) from said spectral energy (E s+p ) and, * determine a corrected spectrum (Â s ) of the sample from the measured spectrum (A s+p ) of the sample through the translucent material and from a corrected spectrum of the translucent material (Â p ),
said corrected spectrum of the translucent material (Â p ) being determined from the measured spectrum of the translucent material (Â p ) and from the estimated coefficient ( γ̂ ).
Abstract:
In order to enable increase in a measurement range for an interference substance regardless of before or after mixing of a reagent with a sample, and further to realize measurement of the level of the interference substance and measurement of the sample under the same measurement conditions, this automatic analysis device is provided with (1) a measurement mechanism having a light measuring unit having installed therein a reaction container in which the sample is dispensed, a light source which emits light to the reaction container, and a detection unit that detects scattered light from the sample in the reaction container, (2) an amplifier circuit unit having an adder-subtractor that adds or subtracts a correction signal to or from a first measurement signal from the detection unit, and an amplifier circuit which amplifies the output signal by the adder-subtractor at a fixed amplification rate to output a second measurement signal, and (3) an arithmetic operation unit which calculates the correction signal on the basis of a difference between the signal level of the second measurement signal and a target value, and which executes an analysis action on the basis of the second measurement signal after correction by means of the correction signal.
Abstract:
The present invention relates to a method for generating a compensation matrix during a substrate inspection. The method comprises the steps of: selecting information of N1 (N1 ‰§2) feature objects which are randomly predetermined within a field of view (FOV) on a substrate; generating a first compensation matrix on the basis of information of the feature objects which are extracted on the substrate; comparing an offset value of each of all the feature objects with a predetermined reference value by applying all the feature objects within the FOV to the compensation matrix to count the number of the feature objects of which the offset value of the each of all the feature objects is less than the predetermined reference value; and repeatedly performing the above steps N2 times (N2‰§1), and generating a second compensation matrix using information of the feature objects which have the offset value which is less than the predetermined reference value, in case the number of the counted feature objects is the maximum.
Abstract:
The present invention relates to a method for generating a compensation matrix during a substrate inspection. The method comprises the steps of: selecting information of N1 (N1 ≧2) feature objects which are randomly predetermined within a field of view (FOV) on a substrate; generating a first compensation matrix on the basis of information of the feature objects which are extracted on the substrate; comparing an offset value of each of all the feature objects with a predetermined reference value by applying all the feature objects within the FOV to the compensation matrix to count the number of the feature objects of which the offset value of the each of all the feature objects is less than the predetermined reference value; and repeatedly performing the above steps N2 times (N2≧1), and generating a second compensation matrix using information of the feature objects which have the offset value which is less than the predetermined reference value, in case the number of the counted feature objects is the maximum.
Abstract:
The invention relates to a method of controlling a product analysis spectrometer, the method comprising steps consisting in: acquiring a measurement (LFL, TPL) representative of the operation of a light source (LS), determining as a function of the measurement a value of supply current (LCx) of the light source, and/or a value of duration of integration (ITy) of photosensitive cells (y) of a sensor (OPS), which are disposed on a path of a light beam (LB) emitted by the light source and having interacted with a product to be analyzed, and if the value of duration of integration and/or of supply current lies between threshold values, providing to the light source a supply current corresponding to the determined value of supply current, adjusting the duration of integration of a photosensitive cell to the determined value of duration of integration, and acquiring measurements of luminous intensity (MSy) which are provided by the sensor, making it possible to form a spectrum.
Abstract:
Methods and apparatus are provided for determining weight percent of solids in a suspension using Raman spectroscopy. The methods can be utilized to acquire Raman spectral data from the suspension and to determine weight percent of solids in a process being carried out, for example, in a vessel, without the need to remove samples for analysis. The weight percent of the solids can be determined with a desired accuracy in a relatively short time, typically 10 minutes or less. The acquired Raman spectral data may be processed by chemometric software using, for example, a Partial Least Squares algorithm and data pretreatment to provide a predicted value of weight percent solids. In some embodiments, the invention is used to determine the weight percent of microparticles of a diketopiperazine in an aqueous solution.
Abstract:
L'invention propose un procédé et un dispositif de détection d'espèces gazeuses minoritaires dans un mélange par spectroscopie d'émission optique au moyen d'un spectromètre optique (8), dans lequel on utilise la radiation émise par un plasma (4) présent dans le mélange gazeux à analyser, et on retient, dans le spectre de cette radiation, les raies d'une espèce gazeuse majoritaire dont l'amplitude est sensible à la présence de l'espèce minoritaire, et on déduit de l'amplitude de cette ou de ces raies sensibles une information sur la concentration de l'espèce gazeuse minoritaire. Il est alors possible d'assurer une surveillance d'espèces gazeuses minoritaires en temps réel.
Abstract:
Methods and apparatus are provided for determining weight percent of solids in a suspension using Raman spectroscopy. The methods can be utilized to acquire Raman spectral data from the suspension and to determine weight percent of solids in a process being carried out, for example, in a vessel, without the need to remove samples for analysis. The weight percent of the solids can be determined with a desired accuracy in a relatively short time, typically 10 minutes or less. The acquired Raman spectral data may be processed by chemometric software using, for example, a Partial Least Squares algorithm and data pretreatment to provide a predicted value of weight percent solids. In some embodiments, the invention is used to determine the weight percent of microparticles of a diketopiperazine in an aqueous solution.