Abstract:
PROBLEM TO BE SOLVED: To obtain a coating solution for forming a ferroelectric thin film, with which the ferroelectric film that has no cracks and uniformity is formed by one time coating and baking on a substrate such as platinum, iridium, and iridium oxide. SOLUTION: This coating solution for forming the ferroelectric thin film contains a solvent expressed by a general formula (1), R 1 O(CHCH 3 CH 2 O) 2 R 2 (each of R 1 and R 2 expresses a monovalent organic group independently selected among hydrogen atom, 1-4C alkyl group or CH 3 CO-) and an organometallic compound. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To obtain a composition for film formation capable of obtaining a coating film low in relative dielectric constant and high in elastic modulus usable as an interlayer insulation film material for semiconductor devices, or the like, and even when a varnish is used together therewith, generating less foreign material even after long term storage. SOLUTION: The composition for film formation is characterized in that it contains (A) a hydrolytic condensate obtained when an alkoxysilane undergoes hydrolysis and condensation in the presence of a metal chelate compound and/or an acid catalyst and water, (B) a hydrolytic condensate obtained when an alkoxysilane undergoes hydrolysis and condensation in the presence of an alkali catalyst and water, (C) an organic solvent, and (D) water.
Abstract:
PROBLEM TO BE SOLVED: To provide a composition for silica film formation capable of sintering in a short time, and excellent in cracking resistance and moisture absorption property as an interlayer insulating material for a semiconductor element, etc., and a silica film. SOLUTION: This composition for film formation contains a compound (A) prepared by hydrolyzing and condensating at least a compound selected from the group represented by general formulae RaSi(OR1)4-a....(1), Si(OR2)4....(2) and R3b(R4O)3-bSi-(R7)d-Si(OR5)3-cR6c....(3), in the presence of a metal chelating compound and/or an alkali catalyst, an alkali compound (B), and an organic solvent (C). In the formula, R is H, F, or a monovalent organic group, R1 to R6 are each a monovalent organic group, R7 is O, a phenylene group, or -(CH2)n-, a is an integer of 1-2, b and c are each a number of 0-2, d is a number of 0 or 1, and n is an integer of 1-6.
Abstract:
PROBLEM TO BE SOLVED: To obtain a thermosetting resin composition excellent in preservation stability as a solution without causing cracks when cured and capable of forming a cured product excellent in transparency, adhesion to various substrates, heat and wet heat resistances, electrical insulating properties, etc. SOLUTION: This thermosetting resin composition comprises (A) a hydrolyzate of a hydrolyzable organosilane compound and/or its partial condensate, (B) a polyimide obtained by reacting a compound having >=3 amino groups with a compound having a carboxylic acid dianhydride group and a diamine compound and having >=1 kinds of groups having reactivity and/or a polyamic acid which is its precursor and preferably further (C) a chelate compound and/or an alkoxide compound of a metal selected from the group of zirconium, titanium and aluminum.
Abstract:
PROBLEM TO BE SOLVED: To improve the uniformity of a coating film, dielectric characteristics, oxygen plasma resistance and adhesive proparty to a substrate by incorporating a specific alkyl alkoxysilane partially hydrolyzed product and/or partially condensation product, a chelate compound of titanium or zirconium and an organic solvent. SOLUTION: This film forming composition is obtained by blending 100 pts.wt. alkyl alkoxysilane partially hydrolyzed product and/or partialiy condensation product expressed by a formula, R n Si(OR )4-n (each of R represents a 1-5C alkyl or a 6-20C aryl and (n) represents 1-2), 0.5-300 mmol, preferably 0.5-200 mol chelate compound selected from a titanium chelate compound and a zirconium chelate compound expressed by a formula, R 4 M(OR )4-t (R represents a chelating agent, M represents titanium or zirconium, R represents a 2-5C alkyl or a 6-20C aryl and (t) represents 1-4) and 20-4,000 pts.wt. at least one kind of the organic solvent selected from ethyl lactate, mthoxymethyl propionate and ethoxyethyl propionate.
Abstract:
PROBLEM TO BE SOLVED: To provide an insulating film having a low dielectric constant and a high heat resistance, high moisture resistance, etc., and a semiconductor device which has the insulating film on a wiring layer, does not consume much electric power, and has a high-speed operability, high reliability, etc. SOLUTION: An insulating film 4 is composed of the cured material of a curable resin composition containing at least one kind of component selected out of a group composed of (A) the hydrolytic product of a hydrolytic organosilane compound and/or its partial condensate, (B) a hydrolytic silyl group and/or polyamic acid having a carboxylic acid anhydride group, and the hydrolytic silyl group and/or polyimide having the carboxylic acid anhydride group. A semiconductor device has the above-mentioned insulating film on a wiring layer 3.