公开(公告)号：DE10233549A1

公开(公告)日：2004-02-12

申请号：DE10233549

申请日：2002-07-23

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  SEYFRIED VOLKER ,  KNEBEL WERNER

IPC: G02B21/00 ,  G02B21/06

Abstract: Scanning microscope has a light source that generates an illuminating beam for illumination of a sample. A beam deflection device is provided with which the illumination beam can be directed through or over the sample. A detection beam from the sample is detected using a detector. An additional manipulation light beam is provided for probe handling and positioning, with the manipulation light beam being adjusted with the same beam deflection device as the sample illumination beam. An Independent claim is made for a scanning microscopy method.

公开(公告)号：DE10229407A1

公开(公告)日：2004-01-15

申请号：DE10229407

申请日：2002-06-29

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL

IPC: G01N21/64 ,  G01N23/225 ,  G02B21/00

Abstract: The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. After an image of the specimen is acquired at least one image quality feature is inputted by a user and is converted by the control computer into at least one system parameter of the scanning microscope.

公开(公告)号：DE10225838A1

公开(公告)日：2003-12-24

申请号：DE10225838

申请日：2002-06-11

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  SEYFRIED VOLKER

IPC: G01N21/64 ,  G02B21/00 ,  G02B21/06 ,  G02B21/16 ,  G02B21/24

Abstract: In a method for scanning microscopy an illuminating light beam that contains at least first light of a first wavelength and second light of a second wavelength, is coded. The coded illuminating light beam is directed onto a specimen and detection light proceeding from the specimen is decoded.

公开(公告)号：GB2368743B

公开(公告)日：2003-03-26

申请号：GB0120663

申请日：2001-08-24

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  ENGELHARDT JOHANN ,  BIRK HOLGER

IPC: G02B26/06 ,  G02B21/00 ,  G02B21/06 ,  G02F1/01 ,  H01S3/00

Abstract: A method for illuminating an object with light (2) from a laser light source (3), preferably in a confocal scanning microscope (1). With the method according to the invention, it is possible to reduce the coherence length of the laser light, so that disruptive interference phenomena can be substantially eliminated. Should interference phenomena nevertheless be formed, these are to be influenced in such a way that they have no effect on the detection. The method according to the invention is characterized in that the phase angle of the light field is varied by a modulator in such a way that interference phenomena do not occur in the optical beam path, or occur only to an undetectable extent, within a predeterminable time interval.

公开(公告)号：GB2368743A

公开(公告)日：2002-05-08

申请号：GB0120663

申请日：2001-08-24

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  ENGELHARDT JOHANN ,  BIRK HOLGER

IPC: G02B26/06 ,  G02B21/00 ,  G02B21/06 ,  G02F1/01 ,  H01S3/00

Abstract: A method for illuminating an object with light 2 from a laser light source 3, preferably in a confocal scanning microscope 1. With the method according to the invention, it is possible to reduce the coherence length of the laser light, so that disruptive interference phenomena can be substantially eliminated. Should interference phenomena be formed, these are to be influenced in such a way that they have no effect on the detection. The method is characterized in that the phase angle of the light field is varied by a modulation means 4 in such a way that interference phenomena do not occur in the optical beam path, or occur only to an undetectable extent, within a predeterminable time interval. Modulation means 4 may comprise an electro optical modulation (EOM), mirror, lens or beam splitter. Alternatively, the modulation means 4 may modulate the laser directly by switching it on and off, changing laser intensity and so on.

公开(公告)号：DE10115590A1

公开(公告)日：2001-12-20

申请号：DE10115590

申请日：2001-03-29

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  ENGELHARDT JOHANN ,  MOELLMANN KYRA

IPC: G02B6/00 ,  G02B5/00 ,  G02B5/04 ,  G02B5/18 ,  G02B5/22 ,  G02B6/02 ,  G02B6/12 ,  G02B6/122 ,  G02B6/255 ,  G02B21/00 ,  G02B21/06 ,  G02B27/00 ,  G02F1/39 ,  H01S3/00 ,  H01S3/16 ,  G02F2/02

Abstract: The arrangement has a scanning microscope e.g. confocal microscope, and a laser formed as a pulsed laser (1). An optical component is positioned between the laser and a lens (12), where light generated by the laser is spectrally processed by a unique cycle such that a spectral illumination light is emitted from the laser. An optical fiber (20) forms the optical component, and is comprised of photonic-bad-gap material. An optical diode is provided between the laser and fiber for suppressing back reflection of light rays originated from ends of the fiber.

公开(公告)号：DE102004047519B4

公开(公告)日：2021-08-12

申请号：DE102004047519

申请日：2004-09-28

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  SEYFRIED VOLKER

IPC: G02B21/00 ,  G06T7/30 ,  G06T7/32

Abstract: Verfahren zur Überlagerung optischer Informationen bei einem Scan-Mikroskop, wobei mindestens eine CCD-Aufnahme A mit mindestens einer weiteren Bildinformation B überlagert wird, wobei eine Transformationsmatrix T bestimmt wird, welche die Überlagerung der optischen Informationen der mindestens einen CCD-Aufnahme A und der mindestens einen Bildinformation B ermöglicht, wobei die Transformationsmatrix T zur Berücksichtigung jeweils unabhängiger Einflussgrößen durch Multiplikation einzelner Matrizen gebildet ist, so dass T=T1*T2*..., und wobei mindestens eine Matrix T1, T2, ... nichtlineare Abweichungen aufgrund nicht perfekter Galvanometer-Bewegungen berücksichtigt.

公开(公告)号：AT484001T

公开(公告)日：2010-10-15

申请号：AT04725288

申请日：2004-04-02

Applicant: LEICA MICROSYSTEMS

Inventor： BIRK HOLGER ,  STORZ RAFAEL ,  SEYFRIED VOLKER

IPC: G02B21/06 ,  G01T1/29 ,  G02B21/26

公开(公告)号：DE50115464D1

公开(公告)日：2010-06-10

申请号：DE50115464

申请日：2001-06-01

Applicant: LEICA MICROSYSTEMS

Inventor： BIRK HOLGER ,  STORZ RAFAEL

IPC: G02B6/00 ,  G02B21/00 ,  G02B5/00 ,  G02B5/04 ,  G02B5/18 ,  G02B5/22 ,  G02B6/02 ,  G02B6/12 ,  G02B6/122 ,  G02B6/255 ,  G02B21/06 ,  G02B27/00 ,  G02F1/39 ,  H01S3/00 ,  H01S3/16

Abstract: The arrangement has a scanning microscope e.g. confocal microscope, and a laser formed as a pulsed laser (1). An optical component is positioned between the laser and a lens (12), where light generated by the laser is spectrally processed by a unique cycle such that a spectral illumination light is emitted from the laser. An optical fiber (20) forms the optical component, and is comprised of photonic-bad-gap material. An optical diode is provided between the laser and fiber for suppressing back reflection of light rays originated from ends of the fiber.

公开(公告)号：DE502004003515D1

公开(公告)日：2007-05-31

申请号：DE502004003515

申请日：2004-07-21

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  KNEBEL WERNER

IPC: G02B21/00 ,  G02B21/06

Abstract: The scanning microscope (1) has an incoupling apparatus (31) with which light (33) other than the light (17) proceeding from the sample (7) is coupled into the detection beam path and conveyed to the detector (21). A closure apparatus automatically closes off the incoupling apparatus from the outside, in largely light-tight fashion, when the light guide (37) guiding the other light to the incoupling apparatus is removed. An independent claim is also included for confocal scanning microscope.