Abstract:
This invention provides a miniaturized silicon thermal flow sensor with improved characteristics, based on the use of two series of integrated thermocouples (6, 7) on each side of a heater (4), all integrated on a porous silicon membrane (2) on top of a cavity (3). Porous silicon (2) with the cavity (3) underneath provides very good thermal isolation for the sensor elements, so as the power needed to maintain the heater (4) at a given temperature is very low. The formation process of the porous silicon membrane (2) with the cavity (3) underneath is a two-step single electrochemical process. It is based on the fact that when the anodic current is relatively low, we are in a regime of porous silicon formation, while if this current exceeds a certain value we turn into a regime of electropolishing. The process starts at low current to form porous silicon (2) and it is then turned into electropolishing conditions to form the cavity (3) underneath. Various types of thermal sensor devices, such as flow sensors, gas sensors, IR detectors, humidity sensors and thermoelectric power generators are described using the proposed methodology. Furthermore the present invention provides a method for the formation of microfluidic channels (16) using the same technique of porous silicon (17) and cavity (16) formation.
Abstract:
A micromechanical component is described which includes a substrate (1); a monocrystalline layer (10), which is provided above the substrate (1) and which has a membrane area (10a); a cavity (50) that is provided underneath the membrane area (10a); and one or more porous areas (150; 150null), which are provided inside the monocrystalline layer (10) and which have a doping (nnull; pnull) that is higher than that of the surrounding layer (10).
Abstract translation:描述了一种微机械部件,其包括基板(1); 单晶层(10),其设置在所述基板(1)的上方,并且具有膜区域(10a); 设置在膜区域(10a)下方的空腔(50); 以及一个或多个多孔区域(150; 150'),其设置在单晶层(10)的内部并且具有比周围层(10)的掺杂(n +; p +)更高的掺杂 )。
Abstract:
A microelectromechanical structure is formed by depositing sacrificial and structural material over a substrate to form a structural layer on a component electrically attached with the substrate. The galvanic potential of the structural layer is greater than the galvanic potential of the component. At least a portion of the structural material is covered with a protective material that has a galvanic potential less than or equal to the galvanic potential of the component. The sacrificial material is removed with a release solution. At least one of the protective material and release solution is surfactanated, the surfactant functionalizing a surface of the component.
Abstract:
A structure having projections is provided. The structure having projections comprises a first projection formed on a first layer containing a first material, and a plurality of second projections formed around the first projection and containing a material capable of being subjected to anodic oxidation.
Abstract:
An inertia force sensor having a mass body (11) which moves when force is applied to the sensor, at least one holding beam (12) for holding the mass body (11), and an anchor portion (13) for fixing an end portion of the holding beam (12), the sensor being designed to detect inertia force, which acts on the mass body (11), on the basis of a movement of the mass body (11). The sensor is characterized in that the mass body (11) is composed of a free standing structure (9) which is formed by removing an inner part of a silicon substrate (1) therefrom by means of an etching process within a single step, and the anchor portion (13) is composed of at least a part of a main body of the silicon substrate. Because the inertia force sensor is composed of single crystal silicon, its mechanical properties and reliability may be highly improved.
Abstract:
PROBLEM TO BE SOLVED: To enable a relatively fast and stable etching rate of a sacrificial layer provided between electrodes and increase of device productivity in a capacitive electromechanical transducer device. SOLUTION: In a method of manufacturing the capacitive electromechanical transducer device, a first electrode 8 is formed on a substrate 4, an insulating layer 9 which is provided with openings 6 leading to the first electrode is formed on the first electrode 8, and a sacrificial layer is formed on the insulating layer. A vibration film 3 having a second electrode 1 is formed on the sacrificial layer. The vibration film includes an opening through which an etchant enters. The sacrificial layer is etched to form a cavity 10, and the opening through which the etchant enters is sealed. Electrolytic etching is performed that passes current between the first electrode 8 and an externally provided counter electrode via the opening 6 and opening of the sacrificial layer and vibration film. COPYRIGHT: (C)2010,JPO&INPIT