Abstract:
본 발명은 콜렉터 상층구조 Npn 이종접합 쌍극자 트랜지스터의 멀티-콜렉터에서 콜렉터 간의 전기적 분리를 절연막에 의해 이루어지도록 하므로써 멀티-콜렉터의 분리 특성을 개선하여, 전류이득이 크고, 평탄화된 구조를 갖도록 하고, 쌍극자 트랜지스터의 베이스 저항을 낮추고, 베이스-콜렉터 접합의 파괴전압을 증가시킬 수 있는 I 2 L 소자 제조방법을 제공하고자 하는 것으로, 본 발명은 첫째, 멀티-콜렉터에서 콜렉터 간의 전기적 분리를 절연막에 의해 이루어지도록 하여 멀티-콜렉터의 분리 특성을 개선할 수 있고, 둘째, 콜렉터 상층구조 Npn 이종접합 쌍극자 트랜지스터의 에미터층까지 깊게, 그리고 수평으로 형성된 콜렉터 및 에미터 영역을 갖도록 pnp 쌍극자 트랜지스터를 형성할수 있어, 단면적이 증가하므로 전류이득을 증가시킬수 있게 하고 , 세째, 입력전극 및 출력전극과 더불어 접지전극이 기판의 동일한 일면에 형성되도록 하여 완전한 평탄화를 이룰수 있으며, 네째, 수평 pnp 쌍극자 트랜지스터의 베이스가 콜렉터 상층구조 npn 이종접합 쌍극자 트랜지스터의 콜렉터층이 아닌 별도의 에피층에 형성되도록 하여 수평 pnp 쌍극자 트랜지스터의 베이스 영역의 n형 불순물 도핑농도를 최적화하여, 수평 pnp 쌍극자 트랜지스터의 베이스 영역의 저항을 낮추고, 베이스-콜렉터 접합의 파괴전압 및 전류이득을 증가시킨다.
Abstract:
PURPOSE: A method for forming an ohmic contact layer of a hetero-junction bipolar transistor is provided to improve efficiency of a fabricating process and reduce a fabricating cost by forming simultaneously ohmic electrodes on an emitter, a base, and a collector. CONSTITUTION: A buffer layer, a sub-collector layer, a collector layer, a base layer, an emitter layer, and an emitter cap layer are grown on a compound semiconductor substrate. A surface of the base layer is exposed by etching the emitter cap layer and the emitter layer. A surface of the sub-collector layer is exposed by patterning the base layer and the collector layer. An ohmic electrode is formed simultaneously on an emitter region, a base region, and a collector region. A Ti metal layer(8), a Ti nitride metal layer, a compositionally graded tungsten nitride metal layer, and a tungsten metal layer are deposited sequentially on the substrate. A titanium metal layer(8) and a platinum metal layer are formed thereon. An n type emitter and an n type collector ohmic electrode and a p type base ohmic electrode are formed simultaneously by performing an etch process. An isolation region is formed by performing a mesa etch process. A dielectric insulating layer(17) is applied on a whole surface of the above structure. A metal line including the titanium layer and an aurum layer(18) is formed by performing selectively the etch process.
Abstract:
PURPOSE: A method is provided to fabricate an emitter enhancement heterojunction bipolar transistor and a varactor diode with a low leakage current on the same plane by etching a compound semiconductor epi layer and a regrown N+/N-/N+ compound semiconductor epi layer. CONSTITUTION: According to the method, a sub collector layer(22), a collector layer(23), a base layer(24), an emitter layer(25) and an emitter cap layer(26) of a heterojunction bipolar transistor are grown on a semi-insulating compound semiconductor substrate(21). The emitter cap layer and the emitter layer of the heterojunction bipolar transistor are etched, and after an insulation film(27) is deposited on the whole wafer, the insulation film on a region where a varactor diode is to be formed is etched. An N+ compound semiconductor epi layer(28), an N- compound semiconductor epi layer(29) and an N+ compound semiconductor epi layer(30) are continuously regrown, and the compound semiconductor layer regrown on the insulation film is etched. And an ohmic bottom electrode(34) region of the varactor diode is formed by etching a part of the regrown N+/N-/N+ compound semiconductor epi layer. The base layer and the collector layer of the emitter enhancement heterojunction bipolar transistor are etched. And, an emitter electrode(31), a base electrode(32) and a collector electrode(33) of the heterojunction bipolar transistor are formed in sequence by a lift-off method.
Abstract translation:目的:通过蚀刻化合物半导体外延层和再生长的N + / N / N +化合物半导体外延层,提供了在同一平面上制造发射极增强异质结双极晶体管和具有低漏电流的变容二极管的方法。 构成:根据该方法,生长异相双极晶体管的副集电极层(22),集电极层(23),基极层(24),发射极层(25)和发射极盖层(26) 在半绝缘化合物半导体衬底(21)上。 蚀刻异质结双极晶体管的发射极帽层和发射极层,并且在整个晶片上沉积绝缘膜(27)之后,蚀刻在要形成变容二极管的区域上的绝缘膜。 将N +化合物半导体外延层(28),N-化合物半导体外延层(29)和N +化合物半导体外延层(30)连续重新生长,并且蚀刻在绝缘膜上再生长的化合物半导体层。 并且通过蚀刻一部分再生长的N + / N / N +化合物半导体外延层来形成变容二极管的欧姆底部电极(34)区域。 蚀刻发射极增强异质结双极晶体管的基极层和集电极层。 并且,通过剥离方法依次形成异质结双极晶体管的发射电极(31),基极(32)和集电极(33)。
Abstract:
PURPOSE: A heterojunction bipolar transistor and a method for manufacturing the heterojunction bipolar transistor are provided to improve high speed characteristic of the device by removing parasitic effect between emitters and bases. CONSTITUTION: The heterojunction bipolar transistor manufacturing method includes following steps. At first, a cushion layer, an auxiliary collector layer, a base layer, an emitter layer and an emitter cap layer are sequentially grown to form an HBT(heterojunction bipolar transistor) epi-structure on a semiconductor substrate. Then, a 3-layer metallic layer(18) is vaporized on the portion of the HBT epi-structure to form an emitter ohmic contact. At third, overall emitter cap layer and a portion of the emitter layer is etched by using the 3-layer metallic layer as a mask and a thin emitter layer remains. Then, the emitter layer is removed by a base electrode pattern and a base electrode is formed. At fifth, the emitter layer, base layer and the collector layer are etched to form a collector electrode on the auxiliary collector layer to define a device isolation region. Then, each electrodes is wired to form the device.
Abstract:
PURPOSE: A method for manufacturing a heterojunction bipolar transistor(HBT) is provided to effectively cope with a problem of generation of a surface reunion current in the outside base region significantly affecting an electric characteristic of the HBT device. CONSTITUTION: A method for manufacturing a heterojunction bipolar transistor(HBT) prepares a HBT epitaxial substrate(1). An emitter region and a base region of the HBT epitaxial substrate are defined. A photosensitive film and a dielectric thin film grown at low temperature are formed on the HBT epitaxial substrate and are experienced by twice plasma etching to form a surface projection for lifting off metal. A resistant-heat ohmic electrode is formed on the surface of the emitter and base regions. An AlGaAs depletion layer(14) is again grown on the surface of the base using the ohmic electrode as a mask layer. A collector electrode is formed on the resulting surface. Separation between the devices is performed to produce a unit HBT.
Abstract:
PURPOSE: A method for fabricating a hetero-junction bipolar transistor is provided to reduce collector resistance, by making small a step difference between a base electrode and a collector electrode, and by preventing hydrogen ions from being implanted into a sub-collector layer in an ion implantation process. CONSTITUTION: A sub-collector layer(202), a collector layer(203), a base layer(204), an emitter layer(205) and an emitter cap layer(206) are sequentially formed on a half-insulated compound semiconductor substrate(201). The emitter cap layer and the emitter layer are formed with the predetermined first pattern. The base layer and the collector layer are formed with the second pattern so that the first pattern is formed on the second pattern. The first epi-layer(208) and the second epi-layer(209) are sequentially formed to the height of the second pattern on the sub-collector layer exposed by forming the second pattern. The second epi-layer formed at a side of the second pattern is selectively etched. H+ ions are selectively implanted to do damage to an extrinsic collector region. An emitter electrode, a base electrode and a collector electrode of a hetero-junction bopolar transistor are sequentially formed by a lift-off method.
Abstract:
본 발명은 I 2 L 소자를 구성하는 pnp 쌍극자 트랜지스터와 콜렉터 상층구조 이종접합 쌍극자 트랜지스터 각각에 대하여 전류이득이 크고, 평탄화된 구조를 갖도록 하는 I 2 L 소자 제조방법을 제공하고자 하는 것으로, 이를 위한 본 발명의 I 2 L 소자 제조방법은, 첫째, 콜렉터 상층구조 Npn 이종접합 쌍극자 트랜지스터의 에미터층까지 깊게, 그리고 수평적으로 형성된 콜렉터 및 에미터 영역을 갖도록 pnp 쌍극자 트랜지스터를 형성할수 있어, 단면적이 증가하므로 전류이득을 증가시킬수 있게 하고, 둘째, 입력전극 및 출력전극과 더불어 접지전극이 기판의 동일한 일면에 형성되도록 하여 완전한 평탄화를 이룰수 있도록 하며, 셋째, 수평 pnp 쌍극자 트랜지스터의 베이스가 콜렉터 상층구조 Npn 이종접합 쌍극자 트랜지스터의 콜렉터층이 아닌 별도의 에피층 에 형성되도록 하여 수평 pnp 쌍극자 트랜지스터의 베이스 영역의 n형 불순물 도핑농도를 최적화하여, 수평 pnp 쌍극자 트랜지스터의 베이스 영역의 저항을 낮추고, 베이스-콜렉터 접합의 파괴전압 및 전류이득을 증가시킬 수 있다.
Abstract:
본 발명은 화합물 반도체 이종접합 쌍극자 트랜지스터 제조 방법에 관한 것으로, 반절연 화합물 반도체 기판에 부콜렉터, 콜렉터, 베이스, 에미터, 에미터캡 에피층을 순차적으로 성장시키는 단계와, 절연막을 웨이퍼 전면에 증착 하고 감광막을 마스크로 하여 에미터 측벽영역의 절연막을 식각 하는 단계와, 절연막을 마스크로 하여 식각된 절연막 하부의 에미터캡층과 에미터층을 화학 식각하는 단계와, 식각된 에미터캡층과 에미터층 영역에 도핑시키지 않은 화합물 반도체층을 에미터캡층 높이까지 재성장시키는 단계와, 절연막을 전부 식각하고 감광막을 마스크로 하여 재성장시킨 에미터캡층과 에미터층 외부의 에미터캡층과 에미터층을 식각하는 단계와, 리프트 오프(lift-off)법에 의해 에미터 전극과 베이스 전극을 동시에 형성시키는 단계와, 감 광막을 마스크로 하여 베이스층과 콜렉터층을 식각하는 단계 및 리프트 오프법에 의해 콜렉터 전극을 형성하는 단계로 이루어져, 이종접합쌍극자 트랜지스터의 에미터 면적이 감소함에 따라 전류이득이 감소하는 에미터 크기 효과(size effect)를 감소시킬 수 있다.
Abstract:
PURPOSE: A magnetic field effect dual-junction bipolar transistor device is provided to improve the high speed operation characteristic of the device by giving force through the magnetic field effect in the proper direction shifting to the collector thin film from the emitter thin film through the base thin film. CONSTITUTION: A magnetic field layer(202) is formed to shift electrons to outer terminal, a sub-collector layer(204) is formed on a part of the magnetic field layer selected, a metal resistant collector electrode(211) is for connecting the sub-collector and the magnetic field layer electrically, a collector layer(205) is formed on the selected part of the sub-collector layer, a base layer thin film(206) is formed on the selected part of the collector layer, a metal resistant base electrode(210) is electrically connected to the base layer and formed on the selected part of the base. An emitter layer(207) is formed on the selected part of the base layer. An emitter cap layer thin film(208) is formed on the selected part of the emitter layer. A metal resistant emitter electrode(209) is formed on the selected part of the emitter cap layer, electrically connected to the emitter cap layer. An electrode wiring is formed to connect each metal electrode to outside.
Abstract:
PURPOSE: An integrated injection logic fabrication method is provided to increase current gains and breakdown voltage of base-collector junction and to reduce a base resistance by using a vertical PNP transistor and an NPN HBT(heterojunction bipolar transistor). CONSTITUTION: An integrated injection logic comprises an NPN HBT of collector structure and a vertical PNP bipolar transistor. In the NPN HBT, B+ ions are injected up to an emitter layer(203) through a sub-collector(206), a collector layer(205) and a base layer(204), so that up-beta current gains are increased and multi-collector regions are electrically isolated each other. In the vertical PNP bipolar transistor, compound semiconductor epitaxial layers(209-212) used for a collector, a base and an emitter are re-grown on the NNP HBT, so that base-collector breakdown voltages are increased. Then, Si+ ions are injected up to the emitter cap layer(212) and a grounded electrode(219) is formed on the emitter cap layer.