Abstract:
In some embodiments, substrate processing apparatus may include a chamber body; a lid disposed atop the chamber body; a target assembly coupled to the lid, the target assembly including a target of material to be deposited on a substrate; an annular dark space shield having an inner wall disposed about an outer edge of the target; a seal ring disposed adjacent to an outer edge of the dark space shield; and a support member coupled to the lid proximate an outer end of the support member and extending radially inward such that the support member supports the seal ring and the annular dark space shield, wherein the support member provides sufficient compression when coupled to the lid such that a seal is formed between the support member and the seal ring and the seal ring and the target assembly.
Abstract:
Embodiments of the invention generally relate to a grounding kit for a semiconductor processing chamber, and a semiconductor processing chamber having a grounding kit. More specifically, embodiments described herein relate to a grounding kit which creates an asymmetric grounding path selected to significantly reduce the asymmetries caused by an off center RF power delivery.
Abstract:
It is provided a device for supporting a rotatable target (1) of a deposition apparatus for sputtering material onto a substrate (20), wherein the device includes a drive unit (2) for rotating the rotatable target (1); a ring-shaped part (3) connected to the drive unit (2) for attaching the drive unit to the rotatable target (1); and, a shield (4) for covering the ring- shaped part (3). The shield (4) is adapted for rotating together with the ring-shaped part (3) and includes a plurality of parts assembled together. Furthermore, a sputtering apparatus and a method for supporting a rotatable target are provided.
Abstract:
Embodiments of the invention generally provide a processing chamber used to perform a physical vapor deposition (PVD) process and methods of depositing multi-compositional films. The processing chamber may include: an improved RF feed configuration to reduce any standing wave effects; an improved magnetron design to enhance RF plasma uniformity, deposited film composition and thickness uniformity; an improved substrate biasing configuration to improve process control; and an improved process kit design to improve RF field uniformity near the critical surfaces of the substrate. The method includes forming a plasma in a processing region of a chamber using an RF supply coupled to a multi-compositional target, translating a magnetron relative to the multi-compositional target, wherein the magnetron is positioned in a first position relative to a center point of the multi-compositional target while the magnetron is translating and the plasma is formed, and depositing a multi-compositional film on a substrate in the chamber.
Abstract:
One aspect of the invention includes an auxiliary magnet ring positioned outside of the chamber wall of a plasma sputter reactor and being disposed at least partially radially outwardly of an RF coil used to inductively generate a plasma, particularly for sputter etching the substrate being sputter deposited. Thereby, a magnetic barrier prevents the plasma from leaking outwardly to the coil and improves the uniformity of sputter etching. The magnetic field also acts as a magnetron when the coil, when made aspect of the same material as the primary target, is being used as a secondary target. Another aspect of the invention includes a one-piece inner shield extending from the target to the pedestal with a smooth inner surface and supported by an annular flange in a middle portion of the shield. The shield may be used to support the RF coil.
Abstract:
A shield (22) for protecting chamber walls (14) of a sputter reactor (10) comprising foam metal shaped into a desired shield shape. The foam metal inserts (24) are easily configured for mounting within the sputter reactor chamber. The foam metal shield material provides more surface area and better adhesion of the sputter coated particles, thereby reducing particulate emission and allowing longer use before replacement. The shields are also relatively inexpensive to fabricate. Once the shield is coated with sputter particles, the foam metal shield can be removed from the sputter chamber and heated in a thermite reaction, thereby reducing the particles collected on the foam metal shield to an elemental metal and thus facilitating recovery of the deposited sputter material. The apparatus has a target (12), vacuum pump (21), pedestal (18), substrate (16), gas supply system (20), clips (25), insulating ring (26), DC power supply (24), and metal layer (28).
Abstract:
Arcing in a plasma process is reduced by shaping the target (40) and dark space shield (13) so that their peripheral regions curve away from each other, reducing electric fields and the propensity for arcing between the target and dark space shield. Also disclosed is an improved system for detecting arcing and presenting data related to detected arcs for analysis; the system generates a graph of the number of arcs, or rate of arcing, as a function of total power consumed, or alternatively a histogram of bars (120) each indicating the number of arcs having an associated magnitude.
Abstract:
A rotating cylindrical sputtering target surface (29) as part of a magnetron has cylindrical shields (70) adjacent each end of the target (29) that are shaped at their respective inner edges (70) to maximize etching and to prevent condensation and subsequent arcing that undesirably occurs when certain materials, particularly dielectrics, are being sputtered. If two or more rotating targets (29) are employed in a single magnetron system, each is similarly shielded. In an alternative form, the target (29) is provided with a single cylindrical shield (69) that is cut away for a significant portion of the distance around the cylinder to provide an opening through which a sputtering region of the target is accessible, while maintaining shielding of the target end regions. This alternative single shield (69) is similarly shaped at portions of its inner edges adjacent to the opening to maximize etching and to prevent undesired condensation and subsequent arcing. The preferred shield structure (69) is rotatable in order to allow the position of the sputtering activity to be selected.
Abstract:
Embodiments of methods and apparatus for co-sputtering multiple target materials are provided herein. In some embodiments, a process chamber includes: a substrate support to support a substrate; a plurality of cathodes coupled to a carrier and having a corresponding plurality of targets to be sputtered onto the substrate; and a process shield coupled to the carrier and extending between adjacent pairs of the plurality of targets.