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公开(公告)号：DE10334145A1
公开(公告)日：2005-02-24
申请号：DE10334145
申请日：2003-07-26
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER
Abstract: The invention relates to a scanning microscope with a light source, defining an illumination light beam, and a spectral detector for detection of the detection light coming from the sample, which defines a detection beam and which contains a spectral splitter component. The scanning microscope is characterized in that the spectral splitting component separates the illumination and the detection beams.
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公开(公告)号：DE10120424B4
公开(公告)日：2004-08-05
申请号：DE10120424
申请日：2001-04-26
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , KNEBEL WERNER , ULRICH HEINRICH
Abstract: A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.
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公开(公告)号：DE10257120A1
公开(公告)日：2004-07-08
申请号：DE10257120
申请日：2002-12-05
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , BIRK HOLGER , STORZ RAFAEL
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公开(公告)号：DE10253609A1
公开(公告)日：2004-05-27
申请号：DE10253609
申请日：2002-11-15
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , STORZ RAFAEL
IPC: G02B21/00
Abstract: A scanning microscope, having a detector, arranged in a detection beam path, for receiving detection light proceeding from a sample, has between the sample and the detector an optical shutter means with which the detection beam path can be blocked. A control means for controlling the shutter means is provided. The detection light beam path can be blocked automatically outside the scanning operation and in the event of an excessive detection light power level.
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公开(公告)号：DE10247249A1
公开(公告)日：2004-04-22
申请号：DE10247249
申请日：2002-10-10
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER
Abstract: A scanning microscope having a light source that emits an illuminating light beam, for illumination of a sample. The illuminating light beam extends along an illumination beam path and can be guided over and/or through the sample using a beam deflection device. A mirror which can be introduced in guided fashion into the illumination beam path directs a manipulating light beam via the beam deflection device onto the sample.
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Patent Agency Ranking
公开(公告)号：DE19949272C2
公开(公告)日：2003-09-11
申请号：DE19949272
申请日：1999-10-12
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , ULRICH HEINRICH
Abstract: The confocal laser scan microscope has in addition to the laser source (1) a second non single mode light source (5) for the ultraviolet (UV) band which illuminates the object without focussing object and the scan (15) parameters of the objective are adjusted to achieve the required signal to noise ratio.
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公开(公告)号：DE10139754A1
公开(公告)日：2003-03-06
申请号：DE10139754
申请日：2001-08-13
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER
Abstract: When specimens are illuminated in a scanning microscope, it is often necessary to use radiations of different wavelengths in order to examine the sample. A device and a method for illumination of specimens in a scanning microscope is proposed, a laser being used to generate a laser beam, and an optical system being used to image the laser beam onto the specimen. The optical system comprises a switchable beam deflection device that can direct the laser beam onto the specimen either along a first beam path or along an alternative beam path. In addition, a device for frequency conversion is arranged in the beam path of the alternative beam path.
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公开(公告)号：DE10120424A1
公开(公告)日：2002-11-07
申请号：DE10120424
申请日：2001-04-26
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , KNEBEL WERNER , ULRICH HEINRICH
Abstract: A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.
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公开(公告)号：DE10065784A1
公开(公告)日：2002-07-11
申请号：DE10065784
申请日：2000-12-30
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER
Abstract: Method for locating regions of interest within a microscopic sample (13) to which stimuli can be applied. According to the method, stimulation specific ink is introduced into the sample which is then illuminated with a light beam (7). A stimulus is applied and stimulation specific light (16) is detected and evaluated to determine the originating position of the light. Light of at least two emission wavelengths corresponding to two stimulation specific inks are detected. The invention also relates to a corresponding device.
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公开(公告)号：DE10046199A1
公开(公告)日：2002-03-28
申请号：DE10046199
申请日：2000-09-19
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER , HOFFMANN JUERGEN
Abstract: Method has the following steps: selection (30) of a section of the signature to examine, scanning (32) of the selected area using a light beam in a number of planes, blocking off (34) of light not originating from the focussed region, planar detection (36) of light from the focal region and production (38) of a 3-D depiction of the focal region using the detected data. The invention also relates to a device for use with the above method having a light source, shutters, microscope optics, beam deflector and multi-band detection optics.
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