Abstract:
Methods for determining whether certain compounds, in particular crystals, are present in a sample of a biological fluid that indicates an individual has a particular disease or condition, such as but not limited to gout, pseudogout or urinary tract stones. In some embodiments, the methods include the steps of digestion and filtration of a sample of synovial fluid in order to isolate, if present, monosodium urate monohydrate (MSU), calcium pyrophosphate dihydrate (CPPD), or calcium phosphate crystals from the sample, wherein the filtrate is analyzed with a Raman device to ascertain the presence and type of the crystals. Devices for performing steps of the method are disclosed.
Abstract:
An instrument for processing and/or measuring a biological process contains a sample processing system, an excitation source, an excitation optical system, an optical sensor, and an emission optical system. The sample processing system is configured to retain a first sample holder and a second sample holder, wherein the number of sample cells is different for each sample holder or a characteristic dimension for the first sample cells is different from that of the second sample holder. The instrument also includes an excitation source temperature controller comprising a temperature sensor that is coupled to the excitation source. The temperature controller is configured to produce a first target temperature when the first sample holder is retained by the instrument and to produce a second target temperature when the second sample holder is retained by the instrument.
Abstract:
Disclosed herein is a process and system to correct reflective distortions of an optical spectrum. In addition, a spectroscopy system that compensates for reflective distortions is disclosed.
Abstract:
Die Erfindung bezieht sich auf ein Verfahren zur Ermittlung eines Formkorrekturwertes F für Labor-Flüssigkeitsanalyse-Küvetten (10) mit einem im Querschnitt kreisrunden Kuvettenkörper (12) für die fotometrische Flüssigkeitsanalyse, und sieht folgende Verfahrensschritte vor: optisches Messen des Innen- oder Außen-Durchmessers d 1 ;d 0 des Küvettenkörpers (12), Errechnen eines Formkorrekturwertes F aus dem vermessenen Küvettenkörper- Durchmesser d 1 ;d 0 , und Hinterlegung des Formkorrekturwertes F an dem Küvettenkörper (12).
Abstract:
The invention relates to an actuation and evaluation circuit for a laser diode (1) and a photodiode (3) for determining the concentration of a gas. The laser diode, for example a variable frequency semi-conductor laser in the form of a DFB semi-conductor laser, can generate light in the range of an absorption line of the gas. The circuit comprises a driver (10, 11, 12, 13) for generating a driver signal (17) for the laser diode (1), an assembly (8, 9) for generating a reference signal (20), and a subtractor (5) for subtracting the reference signal (20) from the signal (21) supplied by the photodiode, in order to compensate the non-linear characteristic lines of the semi-conductor laser. The invention further relates to a measuring device for determining the concentration of a gas by way of such an actuation and evaluation circuit. Finally, the invention relates to a corresponding method.
Abstract:
An improved gas analyzer system and method for detecting and displaying the constituent gases of a respiratory gas stream, the system comprising an optical bench (109) comprising a gas pathway for the flow of a gas stream, a flow shaping inlet, three infrared detection channel assemblies for measuring the partial pressures of constituent gases, and measuring sensitivity changes in the detectors of the three infrared detection channel assemblies, a pressure sensor for measuring the pressure within the gas pathway, a temperature sensor for measuring the temperature within the optical bench, a flow rate sensor for measuring the gas flow rate through the gas pathway; analog processing circuitry (124) for processing the detected partial gas pressures, sensitivity changes, the measured values for pressure, temperature, and flow rate, and display processing circuitry (128).
Abstract:
A wafer inspection tool comprising an illumination system having: a field of view (FOV); a light source pupil having a size and shape; a central optical axis; and one or more field angle defining a shape of said FOV extending away from said light source pupil; an objective lens arrangement including an objective and a plurality of interchangeable telescopes coupled thereto, the objective lens arrangement being configured to collect light reflected off a plurality of field points on the wafer and to onwardly transmit a light beam formed from the collected light; and a light separator having a first reflective surface with a transmissive region formed therein and a second surface, wherein said transmissive region is arranged to allow therethrough a central portion of said light beam transmitted from said objective lens arrangement corresponding to the brightfield channel while said reflective surface is arranged to reflect a peripheral portion of said light beam transmitted from said objective lens arrangement corresponding to the darkfield channel; a relay module configured to relay said light source pupil to said transmissive region; wherein said transmissive region has a shape defined as a geometric intersection volume between a model of said illumination light and said reflective surface and said second surface; wherein said model includes a plurality of solids each solid having a cross section of said light source pupil and angled to a field angle of said one or more field angle.
Abstract:
A device for analyzing a sample includes a measurement area at which the sample is to be located, an illumination arrangement, and first and second spectral sensors. The illumination arrangement illuminates the measurement area such that the illumination is incident on the sample. Each of the first and second spectral sensors is oriented toward the measurement area to collect illumination arriving from the measurement area. The first spectral sensor performs a spectral measurement of the sample in response to the incident illumination so as to produce spectral measurement data. The second spectral sensor measures background noise so as to produce background measurement data that provides at least a partial correction for noise in the spectral measurement data. In certain embodiments, operation of the first and second spectral sensors is switched such that the second spectral sensor performs a spectral measurement and the first spectral sensor measures background noise.
Abstract:
A defect inspection device in which an optical axis of a detection optical system is inclined with respect to a surface of a sample, and an imaging sensor is inclined with respect to the optical axis, a height variation amount of an illumination spot in a normal direction of the surface of the sample is calculated based on an output of a height measuring unit, a deviation amount of the focusing position with respect to the light receiving surface in an optical axis direction of the detection optical system is calculated based on the height variation amount of the illumination spot, the deviation amount of the focusing position being generated accompanying a height variation of the illumination spot, and the focus actuator is controlled based on the deviation amount of the focusing position, and scattered light intensities at the same coordinates of the sample are added.
Abstract:
A method can be used for correcting background signals in captured measurement values of analog detectors, wherein measurement values of an object captured over a reference time period are analyzed and characteristic values of captured background signals are determined. What is characteristic of this is that a threshold value is determined on the basis of at least one characteristic value and by applying a calculation specification; the threshold value is applied to captured measurement values of an analog detector, and only those measurement values which are greater than the threshold value are used for a subsequent signal evaluation. A microscope for carrying out the method according to the invention is also provided.