기판 처리 방법, 기록 매체 및 기판 처리 장치
    1.
    发明公开
    기판 처리 방법, 기록 매체 및 기판 처리 장치 有权
    基板处理方法,记录介质和基板处理装置

    公开(公告)号:KR1020070116598A

    公开(公告)日:2007-12-10

    申请号:KR1020077020305

    申请日:2007-03-29

    Abstract: Provided is a substrate processing method by which a water mark is prevented from being generated on a substrate at a low cost. At the time of processing the substrate by using a chemical, humidity at the periphery of the substrate is adjusted corresponding to the type of the chemical. The humidity is adjusted at least in a drying process for drying the substrate (W). In one example, the humidity at the periphery of the substrate is adjusted at the time of supplying the substrate (W) with a fluid including IPA, i.e., a drying fluid, after processing the substrate (W) by using the chemical.

    Abstract translation: 提供了以低成本防止在基板上产生水痕的基板处理方法。 在使用化学品处理基板时,根据化学品的类型调整基板周围的湿度。 至少在干燥基材(W)的干燥过程中调节湿度。 在一个实例中,在通过使用该化学品处理衬底(W)之后,在用包括IPA的流体(即干燥流体)供应衬底(W)时调节衬底周边的湿度。

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