Abstract:
잉크젯 프린트헤드의 노즐 플레이트 표면에 소수성 코팅막을 형성하는 방법이 개시된다. 개시된 소수성 코팅막 형성 방법은, 다수의 노즐이 형성된 노즐 플레이트를 준비하는 단계와, 노즐 플레이트의 표면에 금속층을 형성하는 단계와, 금속층을 덮는 보호막을 형성하는 단계와, 보호막을 선택적으로 식각하여 금속층 중 노즐 플레이트의 바깥쪽 표면에 형성된 부분을 노출시키는 단계와, 노즐 플레이트를 황 화합물이 함유된 용액 내에 침지하여 노출된 금속층의 표면에 황 화합물로 이루어진 소수성 코팅막을 형성하는 단계를 구비한다. 이와 같은 본 발명에 의하면, 노즐 플레이트의 바깥쪽 표면에만 선택적으로 균일한 소수성 코팅막을 용이하게 형성할 수 있게 되므로, 노즐을 통한 잉크 액적의 토출 성능이 향상된다.
Abstract:
PURPOSE: Provided are an optical polyimide monomer and an optical polyimide compound, having low light-absorption loss and high heat-resistance and preventing cleavage of a thin film in an etching process, and a preparation thereof. CONSTITUTION: The optical polyimide monomer (formula 1) is produced by a process comprising the steps of: dissolving diol and 2-chloro-5-nitrobenzotrifluoride in N,N-dimethylacetamide; adding potassium carbonate, t-butylammonium chloride, and copper powder to the resultant and heating; eliminating the copper from the resultant and precipitating and recrystallizing in acetic acid to obtain a dinitro compound; dissolving the dinitro compound in tetrahydrofurane and reducing in the presence of a catalyst. And the polyimide compound (formula 3) is produced by a process comprising the steps of: dissolving the polyimide monomer (formula 1) and a dianhydride (formula 2) in dimethylacetamide; stirring the resultant under nitrogen to form polyamic acid; coating a silicon substrate with the polyamic acid; heating the polyamic acid coated substrate. In the formula, X is chlorine, bromine, or halogenated alkyl, Ar is an aromatic ring group or a halogenated aromatic ring group, Z is partially/wholly fluorinated or chlorinated aromatic cyclic group, partially/wholly fluorinated or chlorinated ring type aliphatic group, partially/wholly fluorinated or chlorinated aliphatic group, or a connection structure thereof connected by a hetero atom.
Abstract:
PURPOSE: A novel single organic metal precursor compound is provided to enhance volatility and to usefully deposit single metal oxide(TiO_2,ZrO_2,HfO_2), and complex metal oxide(ZrSiOx,HfSiOx) thin film. CONSTITUTION: An organic metal precursor compound for deposition of a metal oxide or metal-silicon oxide thin film is denoted by chemical formula 1. The organic metal precursor compound o chemical formula 1 contains an organic metal precursor of chemical formulas 2 or 3. A thin film deposition method is used for forming metal thin film, metal oxide thin film or metal-silicon oxide thin film using the precursor compound. The thin film is performed by ALD(atomic layer deposition) or MOCVD(metal organic chemical vapor deposition).
Abstract:
A mask pattern obtained by a dipole aperture illumination system is provided to prevent merging in photoresist by reducing the size of a mask pattern in the direction of dipole aperture arrangement and widening the space between the mask patterns, and thus to reduce or minimize faults in overlay measurement. The overlay mask pattern obtained by dipole aperture illumination comprises a plurality of dot type patterns(110) with a certain size and space, which are periodically formed on a wafer, wherein the space between the dot type patterns is at least 0.4 micrometers or more in the direction of dipole aperture arrangement.
Abstract:
PURPOSE: A method for fabricating an optical connecting element is provided to connect an optical block and an optical element of the different height and the different width to each other by optimizing structures of an input portion and an output portion of the optical connecting element. CONSTITUTION: A method for fabricating an optical connecting element includes a lower cladding forming process, a core layer forming process, a patterning process, and an annealing process. The lower cladding forming process is to form a lower cladding layer on a substrate. The core layer forming process is to form a core layer on the lower cladding layer. The patterning process is to pattern the core layer. The annealing process is to anneal the patterned core layer and optimize the height and the width of the optical connecting element.
Abstract:
PURPOSE: A polyimide having low light absorption loss at a near infrared light wavelength range, easy to control reflected indexes, excellent in solubility to an organic solvent and processability and capable of effectively protecting the increase of light absorption loss and the lowering of adhesion property and coatability of a film is provided which is very useful as an optical material in the optical communication field using light of a near infrared light region. CONSTITUTION: A polyimide for optical communications has a monomer, represented by the formula (1), as a repeating unit. In formula, R1, R2, R3 and R4 are selected from the group consisting of H, Cl, F, I, Br, CF3, CCl3, a nonsubstituted aromatic ring and a halogenated aromatic ring, n is an integer from 1 to 39. The use of the polyimide as materials for forming a waveguide layer extends the selection width for buffer layer material.
Abstract:
포토 마스크의 디자인 방법을 제공한다. 이 방법은 스크라이브 레인 내에 키들의 배치 가능 여부를 스크라이브 레인의 총 길이와 배치해야할 키의 총 길이를 비교하여 판단하는 것을 특징으로 한다. 따라서 일일이 키들을 임의배치하지 않아도 배치 가능 여부를 판단할 수 있으므로 시간을 절약할 수 있다. 스크라이브 레인
Abstract:
A method for manufacturing a semiconductor device is provided to increase manufacturing efficiency of the semiconductor device by facilitating alignment between a photomask and a wafer. Plural photomasks are used to sequentially perform exposure processes on a semiconductor wafer. The photomask includes alignment marks(120a-120f) and patterns for discriminating alignment marks(160a-160f). The patterns for discriminating alignment marks are formed on one surface of the aligned marks. The alignment marks and the patterns for discriminating the alignment marks are formed on a scribe line on the wafer during the sequential exposure processes. When the alignment marks are matched, the patterns for discriminating the alignment marks are formed on one side of the alignment marks.
Abstract:
PURPOSE: A reticle bar code structure is provided to be capable of maintaining the career of a reticle for preventing the duplicate fabrication of the same reticle. CONSTITUTION: A reticle bar code structure is provided with a mass-production line code(1) for showing a mass-production line number, a product code(2) for showing a product group, and a plurality of version codes(3,4) of a device. The reticle bar code structure further includes a plurality of layer codes(5,6) of the product group, a plurality of reticle ID(IDentification) codes(7,8), a scale sorting code(9), and a set order code(10) for showing a reticle fabrication order number. Preferably, the set order code shows the fabrication number of the same reticles. Preferably, the product code, the version code, and the scale sorting code are fixed codes. Preferably, the mass-production line code, the layer code, and the reticle ID code are variable codes.