Abstract:
A method for manufacturing a thin film transistor substrate is provided to prevent on current of the thin film transistor formed through a lower temperature process from lowering by adjusting a mixing rate of gas to improve a gate insulation layer and a semiconductor layer. A method for manufacturing a thin film transistor substrate includes the steps of: forming a gate electrode(120) on a substrate(110); forming a gate insulation layer(130) on the substrate with the gate electrode by using gas containing H2 and SiH4 which are mixed at the rate of 18:1~22:1 and gas containing N2 and NH3 which are mixed at the rate of 8:1~12:1 at 200 °C~250 °C; forming a semiconductor layer(142) on the substrate with the gate insulation layer by using gas containing H2 and SiH4 which are mixed at the rate of 13:1~17:1 at 200 °C~250 °C; forming an ohmic contact layer(144) on the semiconductor layer at 200 °C~250 °C; forming source and drain electrodes(152,154) on the ohmic layer which are separated from each other, with having a channel forming region of the semiconductor layer.
Abstract:
A manufacturing method of an organic light emitting diode display is provided to improve Ion and Ioff characteristics of a thin film transistor through plasma treatment. A manufacturing method of an organic light emitting diode display includes the steps of: forming a gate line including a first control electrode(124a) and a second control electrode(124b) on a substrate; forming a gate insulating layer on the gate line and the second control electrode; forming an amorphous silicon layer on the gate insulating layer; forming a polycrystalline silicon layer by annealing the amorphous silicon layer; performing H2 plasma treatment on the polycrystalline silicon layer; forming first and second semiconductors(154a,154b) by patterning the polycrystalline silicon layer; forming a data line(171) having a first input electrode(173a), a driving voltage line(172) having a second input electrode(173b), and first and second output electrodes(175a,175b) on the first and second semiconductors; forming a passivation layer on the data line, the driving voltage line, and the first and second output electrodes; forming a connecting member(85) to connect the first output electrode and the second input electrode and a first electrode(191) connected to the second output electrode on the passivation layer; forming a partition including an opening on the first electrode; forming a light emitting member on the opening; and forming a second electrode on the light emitting member.
Abstract:
A method for manufacturing a TFT(Thin Film Transistor) substrate is provided to optimize plasma power or a gas type when performing the plasma processing of the channel area of a TFT in the manufacture of a TFT substrate using soda lime glass, thereby preventing the deterioration of the TFT and improving driving characteristics. A method for manufacturing a TFT substrate comprises the following steps of: forming gate wiring including a gate line(122) and a gate electrode(124) on a substrate(110); forming a gate insulating film(130) on the substrate on which the gate wiring is formed; forming data wiring including an active layer(140), a data line(152), a source electrode(154), and a drain electrode on the gate insulating layer; performing the plasma processing of the channel area of the active layer with a range of 500W to 1000W; forming a protection layer(170) at temperature below 250 degrees Celsius on the substrate on which the active layer and the data wiring are formed; and forming a pixel electrode(180) which is electrically connected to the drain electrode on the protection layer.
Abstract:
불량을 감소시킬 수 있는 금속배선을 포함하는 표시 기판의 제조 방법이 개시된다. 절연 기판 위에 인듐산화물층/은(Ag)/인듐산화물층으로 적층된 게이트 금속패턴을 형성하고, N2 가스와 SiH4 가스를 이용하여 게이트 절연막을 증착한다. 게이트 절연막 위에 인듐산화물층/은(Ag)/인듐산화물층으로 적층된 소스 금속패턴을 형성하고, N2 가스와 SiH4 가스를 이용하여 보호막을 증착한다. N2가스와 SiH4가스를 사용하여 증착하므로, 인듐산화물의 환원이 억제되어 층분리가 유지된다. 따라서 인듐산화물층이 고온에서 은(Ag) 보호층 역할을 수행할 수 있으므로, 배선용 물질인 은(Ag)의 뭉침이 방지되어, 표시 기판의 배선 불량을 감소시킬 수 있다. 질소 가스, 게이트 절연막, 보호막, 인듐산화물, 저저항 금속
Abstract:
A method for manufacturing a thin film transistor array panel is provided to enhance reliability by improving stability and mobility of a thin film transistor. A gate line is formed on a substrate(110). A gate insulating layer is formed on the gate line. An amorphous silicon layer having a thickness of 1500-1800 angstrom is formed on the gate insulating layer. An impure amorphous silicon layer having a thickness of 300-500 angstrom is formed on the amorphous silicon layer. An intrinsic semiconductor and an impure semiconductor are formed by etching the amorphous silicon layer and the impure amorphous silicon layer. A data line and a drain electrode(175) are formed on the impure semiconductor. A pixel electrode(191) is connected to the drain electrode.
Abstract:
A thin film transistor substrate and a method of manufacturing the thin film transistor substrate are provided to form a black matrix and a color filter pattern on the backside of a thin film transistor substrate to remove image sticking caused by ionic impurities according to the material of the color filter pattern and the black matrix and image sticking caused by light leakage current generated from an active layer. A thin film transistor substrate includes a plurality of gate lines, a plurality of data lines(62), a plurality of thin film transistors, a plurality of pixel electrodes(82), a black matrix(91), and red, green and blue color filters(92R,92G,92B). The gate lines are formed on one side of an insulating substrate and extended in a first direction. The data lines are extended in a second direction and intersect the gate lines. The thin film transistors are respectively connected to the gate lines and the data lines. The pixel electrodes are respectively connected to the thin film transistors. The black matrix is formed on the other side of the insulating substrate and superposed on the gate lines, the data lines and the thin film transistors. The color filters are formed on the other side of the insulating layer and superposed on the pixel electrodes.
Abstract:
전기적인 특성이 향상된 박막트랜지스터가 형성된 박막트랜지스터 기판 및 이의 제조방법과, 박막트랜지스터를 갖는 액정표시패널 및 전계발광 표시패널이 개시된다. 박막트랜지스터는 게이트전극, 액티브층, 소스전극, 드레인전극 및 버퍼층을 포함한다. 게이트전극은 기판 상에 형성된다. 액티브층은 게이트전극을 커버하도록 게이트전극의 상부에 형성된다. 소스전극 및 드레인전극은 액티브층의 상부에 소정의 간격으로 이격되어 형성된다. 버퍼층은 액티브층과 소스전극 사이 및 액티브층과 드레인전극 사이에 각각 형성되며, 두께에 따라 연속적으로 변동하는 함량비를 갖는 복수의 물질들로 이루어진다. 이와 같이, 소스전극과 드레인전극 및 액티브층 사이에 버퍼층이 형성됨에 따라, 산화에 의해 접촉저항이 증가하는 것을 방지함으로써, 박막트랜지스터의 전기적인 특성을 향상시킬 수 있다. 게이트전극, 소스전극, 드레인전극, 액티브층, 버퍼층
Abstract:
A display substrate including a thin film transistor having with reliability, a display device including the same, a manufacturing method of the display substrate are provided to reduce power consumption by reducing voltage range necessary for driving a thin film transistor. A gate insulating layer(30) is formed on a gate electrode(26). An oxide semiconductor pattern is formed on the gate isolation layer. A source electrode is formed in the oxide semiconductor pattern image. A drain electrode is formed in the oxide semiconductor pattern image. The drain electrode is separated from the source electrode. The gate isolation layer, contacting the oxide semiconductor pattern, at least partial area is plasma processed. The partial domain of the oxide semiconductor pattern which is plasma processed is exposed by the source electrode and drain electrode.
Abstract:
A display device and a method for manufacturing the same are provided to maintain a display quality stably by using a poly silicon thin film transistor as a driving thin film transistor. A display device includes an insulation substrate(11), a switching thin film transistor(51), a driving thin film transistor(21), an insulation layer(41), a first electrode(71), an organic light emitting layer(90), and a second electrode(95). The switching thin film transistor is formed on the insulation substrate, receives a data voltage, and has a first semiconductor layer. The driving thin film transistor is formed on the insulation substrate. A control terminal is coupled to an output terminal of the switching thin film transistor. The driving thin film transistor has a second semiconductor layer having a poly-silicon and a halogen material. The insulation layer is formed on the switching thin film transistor and the driving thin film transistor. The first electrode is formed on the insulation layer and is electrically coupled to an output terminal of the driving thin film transistor. The organic light emitting layer is formed on the first electrode. The second electrode is formed on the organic light emitting layer.
Abstract:
A display device and a manufacturing method of the same are provided to form first and second layers including polysilicon and a halogen material respectively and to form a channel region between source and drain electrodes so as to keep uniform quality of a thin film transistor. A display device comprises an insulating substrate, a semiconductor layer, a source electrode(240), a drain electrode(250), and a resist contact layer(230). The semiconductor layer includes a first layer(220a) including polysilicon and a halogen material of a first content, and a second layer(220b) including polysilicon and a halogen material of a second content which is lower than the first content. A part of the source electrode is on the semiconductor layer. A channel region(c) is formed between the source electrode and the drain electrode. The halogen material is fluorine.