실리콘 산화물층의 제거방법과 적층체
    2.
    发明授权
    실리콘 산화물층의 제거방법과 적층체 有权
    去除氧化硅层和层压结构的方法

    公开(公告)号:KR101377170B1

    公开(公告)日:2014-03-27

    申请号:KR1020130015577

    申请日:2013-02-13

    Abstract: The present invention relates to a method of removing a silicon oxide layer and a laminated structure. According to the present invention, the method of removing a silicon oxide layer includes a step of forming a silicon layer; a step of forming a metal layer after a silicon oxide layer on the silicon layer; a step of forming a carbon layer on the metal layer; a step of removing at least one part of the silicon oxide layer by combining the carbon of the carbon layer with the oxide of the silicon oxide layer by heating the carbon layer, the metal layer, and the silicon oxide layer.

    Abstract translation: 本发明涉及去除氧化硅层和叠层结构的方法。 根据本发明,除去硅氧化物层的方法包括形成硅层的步骤; 在硅层上形成氧化硅层之后的金属层的工序; 在所述金属层上形成碳层的步骤; 通过加热碳层,金属层和氧化硅层,通过将碳层的碳与氧化硅层的氧化物组合来除去至少一部分氧化硅层的步骤。

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