Abstract:
A varactor may have a first terminal connected to a gate. The gate may be formed from a p-type polysilicon gate conductor. The gate may also have a gate insulator formed from a layer of insulator such as silicon oxide. The gate insulator may be located between the gate conductor and a body region. Source and drain contact regions may be formed in a silicon body region. The body region and the source and drain may be doped with n-type dopant. The varactor may have a second terminal connected to the n-type source and drain. A control voltage may be used to adjust the level of capacitance produced by the varactor between the first and second terminals. A positive control voltage may produce a larger capacitance than a negative control voltage. Application of the negative control voltage may produce a depletion layer in the p+ polysilicon gate layer.
Abstract:
A method for improving analog circuits performance using a circuit design using forward bias and a modified mixed-signal process is presented. A circuit consisting plurality of NMOS and PMOS transistors is defined. The body terminal of the NMOS transistors are coupled to a first voltage source and the body terminal of the PMOS transistors are coupled a second voltage source. Transistors in the circuit are selectively biased by applying the first voltage source to the body terminal of each selected NMOS transistor and applying the second voltage source to the body terminal of each selected PMOS transistor. In one embodiment, the first voltage source and the second voltage source are modifiable to provide forward and reverse bias to the body terminal of the transistors.
Abstract:
PROBLEM TO BE SOLVED: To provide a reference circuit which operates with a low voltage.SOLUTION: A low-voltage reference circuit can comprise a pair of semiconductor devices. Each of the semiconductor devices can include an n-type semiconductor region, an n+ region in the n-type semiconductor region, a metal gate, and a gate insulator. The gate insulator is inserted between the metal gate and the n-type semiconductor region, and carriers tunnel through the metal gate and the n-type semiconductor region. The metal gate can have a work function which matches a work function of a p-type polysilicon. The gate insulator can have a thickness smaller than approximately 25 angstroms. The metal gate can form a first terminal in the semiconductor device. The n+ region and the n-type semiconductor region can form a second terminal in the semiconductor device. The second terminal can be coupled to the ground. A bias circuit can use the first terminal so as to supply a different current to the semiconductor device, and can supply a corresponding reference output voltage at a value less than 1 volt.