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    TUNABLE ECHELLE GRATING
    1.
    发明申请
    TUNABLE ECHELLE GRATING 审中-公开

    公开(公告)号：WO2022066321A1

    公开(公告)日：2022-03-31

    申请号：PCT/US2021/046359

    申请日：2021-08-17

    Applicant: APPLE INC.

    Inventor： TU, Yongming ,  BISMUTO, Alfredo

    IPC: G02B6/12 ,  G02B6/293 ,  G02F1/01

    Abstract: Configurations for a tunable Echelle grating are disclosed. The tunable Echelle grating may include an output waveguide centered in a waveguide array, with input waveguides on both sides of the output waveguide. A metal tuning pad may be located over the slab waveguide and may be heated to induce a temperature change in the slab waveguide. By increasing the temperature of the propagation region of the slab waveguide, the index of refraction may shift, thus causing the peak wavelength of the channel to shift. This may result in an optical component capable of multiplexing multiple light sources in an energy efficient manner while maintaining a small form factor.

    OPTICAL SYSTEM WITH PHASE SHIFTING ELEMENTS
    2.
    发明申请
    OPTICAL SYSTEM WITH PHASE SHIFTING ELEMENTS 审中-公开

    公开(公告)号：WO2022066322A1

    公开(公告)日：2022-03-31

    申请号：PCT/US2021/046367

    申请日：2021-08-17

    Applicant: APPLE INC.

    Inventor： TU, Yongming ,  BISMUTO, Alfredo

    IPC: G02F1/01 ,  G02B6/12 ,  G02B6/122

    Abstract: Configurations for an optical system with phase shifting elements are disclosed. The optical system may include a first waveguide that provides light to a second waveguide, which may be a slab waveguide. A phase shifting element may be disposed on the slab waveguide and may be heated to induce a temperature change in the slab waveguide. By increasing the temperature of the propagation region of the slab waveguide, the index of refraction of the propagation region of the slab waveguide may shift, thus causing the index of refraction of light propagating through the propagation region to shift, thus shifting the phase of the light. This may result in an optical component capable of phase shifting light for reducing coherent noise while being energy efficient and maintaining a small form factor.

    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES
    4.
    发明公开
    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES 审中-公开

    公开(公告)号：EP4249894A2

    公开(公告)日：2023-09-27

    申请号：EP23163015.3

    申请日：2023-03-21

    Applicant: Apple Inc.

    Inventor： PELC, Jason S. ,  ARBORE, Mark A. ,  TERREL, Matthew A. ,  GREENING, Thomas C. ,  TU, Yongming ,  GAN, Lucia

    IPC: G01N21/25 ,  G01N21/31

    Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES
    6.
    发明公开
    OPTICAL MEASUREMENT SYSTEM WITH MULTIPLE LAUNCH SITES 审中-公开

    公开(公告)号：EP4249894A3

    公开(公告)日：2023-10-04

    申请号：EP23163015.3

    申请日：2023-03-21

    Applicant: Apple Inc.

    Inventor： PELC, Jason S. ,  ARBORE, Mark A. ,  TERREL, Matthew A. ,  GREENING, Thomas C. ,  TU, Yongming ,  GAN, Lucia

    IPC: G01N21/25 ,  G01N21/31

    Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

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