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公开(公告)号：US09594308B2
公开(公告)日：2017-03-14
申请号：US14941320
申请日：2015-11-13
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus Sengers , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
CPC classification number: G03F7/70866 , G03F7/70341 , G03F7/70591 , G03F7/7085 , G03F7/7095
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
Abstract translation: 在光刻投影装置中，液体供应系统将液体保持在光刻投影装置的投影系统和基板之间的空间中。 位于衬底台上的传感器，其被固定在衬底上，被配置为当浸入液体中时（例如，在与衬底暴露于辐射相同的条件下）暴露于辐射。 通过具有由不超过一种金属类型形成的传感器的与液体接触的吸收元件的表面，可以获得传感器的长寿命。
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公开(公告)号：US20140313494A1
公开(公告)日：2014-10-23
申请号：US14262295
申请日：2014-04-25
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus SENGERS , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
IPC: G03F7/20
CPC classification number: G03F7/70866 , G03F7/70341 , G03F7/70591 , G03F7/7085 , G03F7/7095
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
Abstract translation: 在光刻投影装置中，液体供应系统将液体保持在光刻投影装置的投影系统和基板之间的空间中。 位于衬底台上的传感器，其被固定在衬底上，被配置为当浸入液体中时（例如，在与衬底暴露于辐射相同的条件下）暴露于辐射。 通过具有由不超过一种金属类型形成的传感器的与液体接触的吸收元件的表面，可以获得传感器的长寿命。
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公开(公告)号：US10146143B2
公开(公告)日：2018-12-04
申请号：US15795227
申请日：2017-10-26
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus Sengers , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
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公开(公告)号：US09773578B2
公开(公告)日：2017-09-26
申请号：US14765367
申请日：2014-01-14
Applicant: ASML Netherlands B.V.
Inventor： Alexey Sergeevich Kuznetsov , Arjen Boogaard , Jeroen Marcel Huijbregtse , Andrey Nikipelov , Maarten Van Kampen
CPC classification number: G21K1/062 , B82Y10/00 , C23C28/34 , G03F1/24 , G03F7/70033 , G21K2201/067 , H05G2/008
Abstract: A method of manufacturing a multi-layer mirror comprising a multi-layer stack of pairs of alternating layers of a first material and silicon, the method comprising depositing a stack of pairs of alternating layers of the first material and layers of silicon, the stack being supported by a substrate and doping at least a first layer of the first material with a dopant material.
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Patent Agency Ranking
公开(公告)号：US08830446B2
公开(公告)日：2014-09-09
申请号：US13928203
申请日：2013-06-26
Applicant: ASML Netherlands B.V.
Inventor： Arjen Boogaard , Timotheus Franciscus Sengers , Wilhelmus Sebastianus Marcus Maria Ketelaars , Carolus Ida Maria Antonius Spee
CPC classification number: G03F7/70058 , G03B27/42 , G03F7/70716 , G03F7/7085 , G03F7/70916 , G03F7/70958
Abstract: An extreme ultraviolet exposure apparatus includes a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with a coating, the coating comprising a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
Abstract translation: 一种极紫外曝光装置包括一个被配置为提供一束极紫外线辐射的辐射系统; 构造成支撑图案形成装置的支撑件，所述图案形成装置被配置为根据期望的图案来对所述紫外线辐射束进行图案化; 具有被配置为支撑衬底的区域的衬底台; 投影系统，被配置为将所述图案化的极紫外辐射束投影到所述基板的目标部分上，所述投影系统包括反射光学系统; 其中所述装置的至少一部分在所述装置的使用期间暴露于所述紫外线辐射束时被涂覆，所述涂层包含金属氧化物或光催化剂，或半导体或其任何组合。
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公开(公告)号：US10444644B2
公开(公告)日：2019-10-15
申请号：US16197461
申请日：2018-11-21
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus Sengers , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
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公开(公告)号：US10228615B2
公开(公告)日：2019-03-12
申请号：US15320749
申请日：2015-07-02
Applicant: ASML Netherlands B.V.
Inventor： Andrey Alexandrovich Nikipelov , Vadim Yevgenyevich Banine , Jozef Petrus Henricus Benschop , Arjen Boogaard , Florian Didier Albin Dhalluin , Alexey Sergeevich Kuznetsov , Mária Péter , Luigi Scaccabarozzi , Willem Joan Van Der Zande , Pieter-Jan Van Zwol , Andrei Mikhailovich Yakunin
Abstract: A membrane transmissive to EUV radiation, which may be used as a pellicle or spectral filter in a lithographic apparatus. The membrane includes one or more high doped regions wherein the membrane is doped with a dopant concentration greater than 1017 cm−3, and one or more regions with low (or no) doping. The membrane may have a main substrate having low doping and one or more additional layers, wherein the high doped regions are comprised within some or all of the additional layers.
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公开(公告)号：US09804509B2
公开(公告)日：2017-10-31
申请号：US15452403
申请日：2017-03-07
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus Sengers , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
CPC classification number: G03F7/70866 , G03F7/70341 , G03F7/70591 , G03F7/7085 , G03F7/7095
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
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公开(公告)号：US09213247B2
公开(公告)日：2015-12-15
申请号：US14262295
申请日：2014-04-25
Applicant: ASML NETHERLANDS B.V.
Inventor： Timotheus Franciscus Sengers , Sjoerd Nicolaas Lambertus Donders , Hans Jansen , Arjen Boogaard
CPC classification number: G03F7/70866 , G03F7/70341 , G03F7/70591 , G03F7/7085 , G03F7/7095
Abstract: In a lithographic projection apparatus, a liquid supply system maintains liquid in a space between a projection system of the lithographic projection apparatus and a substrate. A sensor positioned on a substrate table, which holds the substrate, is configured to be exposed to radiation when immersed in liquid (e.g., under the same conditions as the substrate will be exposed to radiation). By having a surface of an absorption element of the sensor, that is to be in contact with liquid, formed of no more than one metal type, long life of the sensor may be obtained.
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