APPARATUS FOR MONITORING A LITHOGRAPHIC PATTERNING DEVICE
    1.
    发明申请
    APPARATUS FOR MONITORING A LITHOGRAPHIC PATTERNING DEVICE 审中-公开
    用于监测地平面图案设备的装置

    公开(公告)号:WO2013037607A1

    公开(公告)日:2013-03-21

    申请号:PCT/EP2012/066223

    申请日:2012-08-21

    Abstract: A lithographic patterning device deformation monitoring apparatus (38) comprising a radiation source (40), an imaging device (42), and a processor (50). The radiation source being configured to direct a plurality of beams of radiation (41) with a predetermined diameter towards a lithographic patterning device (MA) such that they are reflected by the patterning device. The imaging detector configured to detect spatial positions of the radiation beams (41') after they have been reflected by the patterning device. The processor configured to monitor the spatial positions of the radiation beams and thereby determine the presence of a patterning device deformation. The imaging detector has an collection angle which is smaller than a minimum angle of diffraction of the radiation beams.

    Abstract translation: 一种包括辐射源(40),成像装置(42)和处理器(50)的平版印刷图案形成装置变形监测装置(38)。 辐射源被配置为将多个具有预定直径的辐射光束引向平版印刷图案形成装置(MA),使得它们被图案形成装置反射。 该成像检测器被配置为在被图案形成装置反射之后检测辐射束(41')的空间位置。 处理器被配置为监视辐射束的空间位置,从而确定图案形成装置变形的存在。 成像检测器的收集角度小于辐射束的最小衍射角。

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