Abstract:
PROBLEM TO BE SOLVED: To provide a cleaning structure for a lithographic apparatus module in a collector. SOLUTION: The cleaning structure includes a hydrogen radical source constituted to provide a gas including a hydrogen radical to at least a part of a module; and a pump constituted to carry out a pump exhaust of the gas from the module, so that a flow rate of the gas including the hydrogen radical provided through at least the part of the module may become at least 1 m/s. Moreover, the cleaning structure can be equipped with a gas shutter constituted to adjust a flow of the gas including the hydrogen radical to at least the part of the module, a buffer volume of at least 1 m 3 communicating with the module, and a pump constituted to provide a gas pressure between 0.001 mbar (0.1 Pa) to 1 mbar (100 Pa) to the buffer volume. The cleaning structure can further include a gas return system. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a contamination barrier minimizing undesirable deformation of thin films, which is related to a foil trap for a lithographic projection apparatus. SOLUTION: This foil trap has an open structure which transmits radiation from an EUV source or the like without interference. The foil trap is equipped with thin films positioned to trap scrap particles from a radiation source. The thin films extend in the radius direction from the foil trap axis. To avoid mechanical stress, the thin films are connected to one or both of the grooves of rings so that they can slide. This structure allows the thin films to extend easily and avoids mechanical stress, resulting in no deformation in the thin films. At least one of the outer ends of the thin films is thermally connected to the rings. These rings can be cooled with a cooling system. In a preferred embodiment, the foil trap is equipped with a shield which prevents the inner ring from being irradiated with an EUV beam. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
The invention relates to a method for determining a suppression factor of a suppression system. The suppression system is arranged to suppress migration of a contaminant gas out of a first system. The suppression factor is an indication of the performance of the suppression system. The method includes introducing a tracer gas in the sub-system, providing a detection system configured to detect the amount of tracer gas that has migrated out of the first system, determining a first suppression factor for the suppression system for the tracer gas. The method further includes determining a second suppression factor for the suppression system for the contaminant gas based on the first suppression factor.
Abstract:
A radiation system includes a contamination barrier configured to permit radiation from a radiation source to pass through and to capture debris coming from the radiation source. The contamination barrier includes a plurality of lamellas. The surface of the lamellas includes a material. The radiation system also includes a collector configured to collect radiation from the contamination barrier. An optical surface of the collector includes a material that is the same as the material of the surface of the lamellas.
Abstract:
A radiation system includes a contamination barrier configured to permit radiation from a radiation source to pass through and to capture debris coming from the radiation source. The contamination barrier includes a plurality of lamellas. The surface of the lamellas includes a material. The radiation system also includes a collector configured to collect radiation from the contamination barrier. An optical surface of the collector includes a material that is the same as the material of the surface of the lamellas.
Abstract:
A radiation system includes a contamination barrier configured to permit radiation from a radiation source to pass through and to capture debris coming from the radiation source. The contamination barrier includes a plurality of lamellas. The surface of the lamellas includes a material. The radiation system also includes a collector configured to collect radiation from the contamination barrier. An optical surface of the collector includes a material that is the same as the material of the surface of the lamellas.