Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus having an improved transfer unit. SOLUTION: The lithographic apparatus includes a processing unit that performs a lithographic process including exchangeable objects. The processing unit includes an illumination system that provides a beam of radiation; a support structure configured to support a patterning device that imparts a desired pattern to the beam of radiation; a substrate holder configured to hold a substrate; and a projection system configured to project the patterned beam to a target portion of the substrate. The lithographic apparatus also includes a transfer unit comprising a single robot. The single robot is configured to transfer a first exchangeable object from a loading station to the processing unit and to transfer a second exchangeable object from the processing unit to a discharge station. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide lithography equipment for reducing replacement time required for arranging another substrate on a substrate support. SOLUTION: The lithography equipment comprises a replaceable object handling device, capable of replacing a replaceable object using replaceable object station and support. The replaceable object is one substrate W. Pattern forming device and support are one of a substrate support WT and the pattern forming device support. The replaceable object handling device 1 comprises an intermediate holding device 3 for holding the replaceable object. The intermediate holding device 3 can act mutually with the support WT such that the substrate W is arranged on the support WT or the substrate W is taken out from the support WT. A robot 2 can replace the replaceable object, using the support WT, the intermediate holding device 3 and the replaceable object station. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a material for a reference frame that can solve the problems associated with conventional technique while avoiding performance problems.SOLUTION: A lithographic apparatus includes a substrate table WT for holding a substrate W, a projection system PL for projecting a patterned beam onto a target portion of the substrate W, and an independent reference frame MF for providing a reference surface with which the position of the substrate W is measured. The reference frame MF is made of a material having a high coefficient of thermal expansion.
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus including an improved pattering device handling apparatus which gives optimum conditions relative to an expense and a required space more favorable than those given by a conventional patterning device handling apparatus. SOLUTION: The present invention provides a lithographic apparatus including an illumination system for conditioning a radiation beam; a patterning device support for supporting a patterning device which can impart a pattern to the cross section of the radiation beam; a substrate table for holding a substrate; a projection system for projecting the patterned radiation beam to a target portion of the substrate; and a patterning device handling apparatus which comprises a single robot for exchanging the patterning device between the patterning device support and a loading station. The robot includes a first holding device for holding the patterning device in a first holding position and a second holding device for holding the patterning device in a second holding position. Such a robot allows the rapid and accurate exchange of the patterning device. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide reference frame materials which reduce production costs without encountering performance problems. SOLUTION: A lithographic apparatus comprises a substrate table WT for holding a substrate W, a projection system PL for projecting a patterned beam onto a target portion of the substrate W, and an isolated reference frame MF for providing a reference surface with respect to which the substrate W is measured. The reference frame MF comprises a material having a high coefficient of thermal expansion, and has a sandwich structure or a laminated structure when made of specified materials. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an end effector including an integral illumination system for a prealignment sensor. SOLUTION: Equipment includes a first support structure constituted so that it may support an element having an alignment marker. The equipment includes a light source and at least one detector, wherein the light source is integrally formed on the first support structure, and is constituted so that it may provide a light beam which illuminates the alignment marker, and the detector is constituted so that it may detect a position of the alignment marker, by analyzing the light beam transmitting the element. Such equipment can be used to align the element to the first support structure. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To solve such problems that: degraded dynamic behaviors may prolong a stable time (i.e. the desired time for bringing the position of an object table into a desired error bandwidth); larger forces are desirably provided in order to obtain the desired acceleration of a patterning device or a substrate; and the positioning accuracy of the object is affected as a result of that. SOLUTION: There is described a stage apparatus for displacing an object having a substantially flat surface. The stage apparatus is provided with an object table for supporting the object and a positioning device for displacing the object table in a first direction. The stage apparatus is further provided with a clamping device for clamping the object to the object table by a first clamping force that is controlled by an electronic control unit on the basis of the condition of the object. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography apparatus capable of arranging and removing objects, such as a quickly and effectively patterning device and substrate. SOLUTION: The lithography apparatus is provided with a lighting system that adjusts radiation beams, support that gives patterns to the cross-section of radiation beams and supports patterning devices to form patterning radiation beams, substrate table that holds a substrate, projection system that projects patterning radiation beams on the targeted part of the substrate, and robot that is configured to transmit replaceable objects, to and from a support region. The robot is provided with an arm and end-effecter equipped with first and second carriers that are configured to transmit each replaceable object. The end-effecter is connected with the arm of the robot so that it can be rotated about the axis of rotation that extends substantially in parallel with the support region. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a simpler lithographic apparatus which can image a pattern larger than an exposure field. SOLUTION: A lithographic apparatus has a mask table which is designed to hold a mask at two or more positions. Firstly, exposure is performed by using the mask at a first position. Next, secondary exposure is performed by using the mask at a second position. This allows a mask having a pattern region larger than the exposure field to be imaged. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To alleviate the problem caused by the fact that a lighting source has to supply a beam having a large area for illuminating an alignment marker. SOLUTION: The lithographic apparatus includes a support section for supporting a patterning device for forming a radiation beam with a pattern, by giving a pattern to the section of the radiation beam and a substrate table for holding a substrate. The projection system projects the radiation beam with a pattern to the target part of the substrate. The patterning device includes one or a plurality of alignment patterns, and the lithographic apparatus includes a sub-lighting system for lighting each of the alignment patterns by another radiation using the radiation beam. The projection system projects an image of the respective alignment patterns to the substrate table. The substrate table includes one or a plurality of sensors for detecting the projected image of the alignment pattern. COPYRIGHT: (C)2010,JPO&INPIT