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    METHOD AND DEVICE FOR SCREENING ACTIVE COMPOUND AND MULTIPLE SPECIMEN HOLDER USED FOR THE DEVICE
    1.
    发明专利
    METHOD AND DEVICE FOR SCREENING ACTIVE COMPOUND AND MULTIPLE SPECIMEN HOLDER USED FOR THE DEVICE 失效

    公开(公告)号：JPH1082793A

    公开(公告)日：1998-03-31

    申请号：JP20594997

    申请日：1997-07-31

    Applicant: BASF AG

    Inventor： FRIEDRICH THOMAS DR ,  SCHREPP WOLFGANG DR ,  AKARI SABRI DR

    IPC: G01N33/532 ,  G01N23/225 ,  G01N33/543 ,  G01Q60/42 ,  G01N37/00

    Abstract: PROBLEM TO BE SOLVED: To realize a screening method capable of analyzing multiple specimens in a short time by detecting an active compound based on the change of a signal which can be observed by using a device for a scanning atomic force microscopic inspection. SOLUTION: A receptor 5 is fixed on a surface 4 of a support. The change of connection of an active compound 3 to the receptor 5 is measured by using a signal S. The active compound 3 is similarly fixed on a chip 1 of a scanning atomic force microscope by means of a spacer 2 in convenient. The active compound 3 is fixed on the surface 4 of the support and the receptor 5 is on the chip 1 of the microscope. Firstly, the chip 1 is coated with an evaporation layer of chromium as an adhesion accelerator having a thickness of, for example, 5nm, then it is coated with a gold having a thickness of 50nm. The chip 1 coated with gold is similarly coated with mercapto carboxylic acid and a spacer 2 is suspended on the chip 1. When estimation is executed by simultaneously using a plurality of probes, a piezoelectric cantilever is utilized.

    2.
    发明专利
    未知

    公开(公告)号：DE19504855A1

    公开(公告)日：1996-08-22

    申请号：DE19504855

    申请日：1995-02-15

    Applicant: BASF AG

    Inventor： HORN DIETER DR ,  KELLER HARALD DR ,  SCHREPP WOLFGANG DR ,  AKARI SABRI DR

    IPC: G01B21/30 ,  G01B7/34 ,  G01L1/25 ,  G01N19/00 ,  G01Q60/42 ,  G11C13/02 ,  H01J37/28

    Abstract: The method for chemically differential imaging using a scanning force microscope uses chemically modified samples, where the imaging is in normal force, elasticity or tapping/non-contact mode. A detector (1), laser source (2), piezoelectric adjuster (3), tip and lever arm (4) are used to evaluate the sample (5). The scanning tip is either a metal or oxide layer, or it may be coated with one or more substances, such as thiol groups with additional acid or base functions, thiol with nuclein base, disulphide with acid base or nuclein base.

    3.
    发明专利
    未知

    公开(公告)号：ES2148603T3

    公开(公告)日：2000-10-16

    申请号：ES96101636

    申请日：1996-02-06

    Applicant: BASF AG

    Inventor： HORN DIETER DR ,  KELLER HARALD DR ,  SCHREPP WOLFGANG DR ,  AKARI SABRI DR

    IPC: G01B21/30 ,  G01B7/34 ,  G01L1/25 ,  G01N19/00 ,  G01Q60/42 ,  G11C13/02 ,  H01J37/28

    Abstract: The method for chemically differential imaging using a scanning force microscope uses chemically modified samples, where the imaging is in normal force, elasticity or tapping/non-contact mode. A detector (1), laser source (2), piezoelectric adjuster (3), tip and lever arm (4) are used to evaluate the sample (5). The scanning tip is either a metal or oxide layer, or it may be coated with one or more substances, such as thiol groups with additional acid or base functions, thiol with nuclein base, disulphide with acid base or nuclein base.

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