Abstract:
Method for compensating for brightness variations in a field emission device (100a). In one embodiment, a method and system are described for measuring the relative brightness of rows of a field emission display (FED) device (100a), storing information representing the measured brightness into a correction table and using the correction table to provide uniform row brightness in the display by adjusting row voltages and/or row on-time periods. A special measurement process is described for providing accurate current measurements on the rows. This embodiment compensates for brightness variations of the rows, e.g., for rows near the spacer walls (30). In another embodiment, a periodic signal, e.g., a high frequency noise signal (340), is added to the row on-time pulse in order to camouflage brightness variations in the rows near the spacer walls (30). In another embodiment, the area under the row on-time pulse is adjusted to provide row-by-row brightness compensation based on correction values stored in a memory resident correction table (60). In another embodiment, the brightness of each row is measured and compiled into a data profile for the FED. The data profile is used to control cathode burn-in processes so that brightness variations are corrected by physically altering the characteristics of the emitters of the rows.
Abstract:
In a field emission display (FED) device comprising: rows and columns of emitters; and an anode electrode, a method of measuring display attributes of said FED device comprising the steps of: a) in a scan fashion, individually driving each row and measuring the current drawn by each row, wherein a settling time is allowed after each row is driven; b) measuring a background current level during a vertical blanking interval; c) correcting current measurements taken during said step a) by said background current level to yield corrected current measurements; d) averaging multiple corrected current measurements taken over multiple display frames to produce averaged corrected current values for all rows of said FED device; and e) generating a memory resident correction table based on said averaged corrected current values.