STANDARDIZING THE OUTPUT OF AN ELECTRICAL PROPERTY SENSOR USING A REFERENCE MAGNITUDE OBTAINED BY AN OPTICAL SPECTROMETER

    公开(公告)号:WO2021038315A1

    公开(公告)日:2021-03-04

    申请号:PCT/IB2020/055064

    申请日:2020-05-28

    Abstract: A method of standardizing an output of an electrical property sensor (300) comprising the steps of: comparing in a data processor a measured magnitude (Condm) of the electrical property of an electrically conductive liquid obtained with the electrical property sensor with a reference magnitude (Condr) of the electrical property (320); and determining in the data processor a standardization factor (F) dependent on a ratio of the reference magnitude (Condr) and the measured magnitude (Condm) (340); wherein there is provided a step of calculating the reference magnitude (Condr) (330) comprising obtaining by a spectrometer spectral data resulting from an interaction of electromagnetic radiation with the electrically conductive liquid (310); and applying in the data processor a mathematical model to the spectral data to calculate the reference magnitude (Condr), which mathematical model links spectral data to magnitude of the electrical property.

    OPTICAL SPECTROMETER
    2.
    发明公开
    OPTICAL SPECTROMETER 有权
    光谱仪

    公开(公告)号:EP2856108A1

    公开(公告)日:2015-04-08

    申请号:EP12724957.1

    申请日:2012-05-25

    Abstract: An optical spectrometer may include: an adjustable sampling space having two opposing side-walls between which in use a sample for analysis is charged and in at least one of which is formed an optical interface translucent to optical energy emitted by an optical energy source; an actuator mechanically coupled to one or both of the opposing side-walls and configured to operate in response to a command signal applied thereto to effect relative movement of the opposing side-walls; and/or an optical position sensor configured to detect interference fringes generated by the optical energy traversing a distance between the side-walls a plurality of times, having passed through the at least one optical interface, and configured to generate the command signal in dependence thereof. The adjustable sampling space may be brought into an analysis position at which the side-walls are relatively inclined to form a wedge shape.

    A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM
    3.
    发明申请
    A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM 审中-公开
    用于补偿由光谱仪系统产生的间歇式时间周期性误差的光谱仪系统和方法

    公开(公告)号:WO2016124970A1

    公开(公告)日:2016-08-11

    申请号:PCT/IB2015/050778

    申请日:2015-02-02

    CPC classification number: G01J3/45 G01J3/4535

    Abstract: A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.

    Abstract translation: 光谱仪系统和用于补偿由光谱仪系统产生的干涉图的时间周期扰动的方法光谱仪系统(2)包括扫描干涉仪(4); 机械地耦合到扫描干涉仪(4)的可移动反射器元件(14)的驱动系统(6),并且可操作以实现可移动反射器元件(14)在多个,优选地多于两个,例如三个不同的位置的往复运动 扫描速度; 检测器装置(8),被配置为以等间隔的时间间隔对由扫描干涉仪(2)形成的干涉图进行采样以产生采样的干涉图; 并且数据处理器(10)适于在所述多个不同的扫描速度中的每一个处采集采样的干涉图,并执行如此获取的多个采样干涉图的内容的相对比较。

    A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM
    6.
    发明公开
    A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIODIC PERTURBATIONS OF AN INTERFEROGRAM GENERATED BY THE SPECTROMETER SYSTEM 审中-公开
    光谱仪系统产生干涉图时间周期扰动的谱仪系统及补偿方法

    公开(公告)号:EP3254073A1

    公开(公告)日:2017-12-13

    申请号:EP15703111.3

    申请日:2015-02-02

    CPC classification number: G01J3/45 G01J3/4535

    Abstract: A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.

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