Abstract:
A method of standardizing an output of an electrical property sensor (300) comprising the steps of: comparing in a data processor a measured magnitude (Condm) of the electrical property of an electrically conductive liquid obtained with the electrical property sensor with a reference magnitude (Condr) of the electrical property (320); and determining in the data processor a standardization factor (F) dependent on a ratio of the reference magnitude (Condr) and the measured magnitude (Condm) (340); wherein there is provided a step of calculating the reference magnitude (Condr) (330) comprising obtaining by a spectrometer spectral data resulting from an interaction of electromagnetic radiation with the electrically conductive liquid (310); and applying in the data processor a mathematical model to the spectral data to calculate the reference magnitude (Condr), which mathematical model links spectral data to magnitude of the electrical property.
Abstract:
An optical spectrometer may include: an adjustable sampling space having two opposing side-walls between which in use a sample for analysis is charged and in at least one of which is formed an optical interface translucent to optical energy emitted by an optical energy source; an actuator mechanically coupled to one or both of the opposing side-walls and configured to operate in response to a command signal applied thereto to effect relative movement of the opposing side-walls; and/or an optical position sensor configured to detect interference fringes generated by the optical energy traversing a distance between the side-walls a plurality of times, having passed through the at least one optical interface, and configured to generate the command signal in dependence thereof. The adjustable sampling space may be brought into an analysis position at which the side-walls are relatively inclined to form a wedge shape.
Abstract:
A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.
Abstract:
A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.