公开(公告)号：WO2016124970A1

公开(公告)日：2016-08-11

申请号：PCT/IB2015/050778

申请日：2015-02-02

Applicant: FOSS ANALYTICAL A/S

Inventor： ANDERSEN, Steen Kjaer ,  ANDERSEN, Mads Lykke

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/4535

Abstract: A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.

Abstract translation: 光谱仪系统和用于补偿由光谱仪系统产生的干涉图的时间周期扰动的方法光谱仪系统（2）包括扫描干涉仪（4）; 机械地耦合到扫描干涉仪（4）的可移动反射器元件（14）的驱动系统（6），并且可操作以实现可移动反射器元件（14）在多个，优选地多于两个，例如三个不同的位置的往复运动 扫描速度; 检测器装置（8），被配置为以等间隔的时间间隔对由扫描干涉仪（2）形成的干涉图进行采样以产生采样的干涉图; 并且数据处理器（10）适于在所述多个不同的扫描速度中的每一个处采集采样的干涉图，并执行如此获取的多个采样干涉图的内容的相对比较。

公开(公告)号：EP3254073A1

公开(公告)日：2017-12-13

申请号：EP15703111.3

申请日：2015-02-02

Applicant: FOSS Analytical A/S

Inventor： ANDERSEN, Steen Kjaer ,  ANDERSEN, Mads Lykke

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/4535

Abstract: A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.