Abstract:
There is disclosed a ferromagnetic article of manufacture comprising a crystalline EuO film disposed on a substrate such as glass and quartz. The film is doped with a metal selected from Fe, Co, Ni and Cr. The doped film has an increased Curie temperature of about 180* K., its optical absorption peak occurs at about 5,800 A. and has a sharply increased absorption coefficient of about 2.4 X 105/cm. The article also has a highmagneto-optic Faraday rotation at higher temperatures. Fabrication of the article is by the simultaneous vacuum evaporation of Eu, Eu2O3 and an inner transition metal.
Abstract:
A tape having a smooth surface upon which a low melting point ink has been flowed, has ink reflowed over those portions which have been struck by typewriter keys. To effect a redistribution of the ink on the tape, heat is imparted locally thereto, such heat being applied to the typewriter tape either by conduction or radiation. Alternatively, the ink may be caused to flow freely at ambient temperatures and then be permitted to dry to a film thickness.
Abstract:
This disclosure provides a bistable resistor and materials therefor. The bistable resistor has base electrode, intermediate layer and counter electrode. Illustratively, intermediate layer includes a rare earth chalcogenide, e.g., EuO or EuS, doped with a percentage by weight of either a group VA element, e.g., Bi, or a first row transition element, e.g., Cr. Further, the practice of the invention includes having the host intermediate layer comprised of a combination of a plurality of different rare earth chalcogenides, and having a dopant configuration which includes a combination of a plurality of the individually suitable dopants.
Abstract:
The present invention relates to a novel magneto-optical device composed of a rare-earth chalcogenide. When such rare-earth chalcogenides are made in the form of crystals or of thin layers, they are subject to deterioration by exposure to the atmosphere. The use of a thin overlying protective layer having optical and magnetic properties compatible with the underlying rare-earth chalcogenide is highly desireable. In one example, Eu2O2 is employed as the protective layer for EuO.
Abstract:
A mask for the manufacture of semiconductor and various small components. Rare earth elements capable of existing in the divalent state (Eu2 , Sm2 , Yb2 ) are combined with group VI elements (O, S, Se, Te) to provide the masking material. Trivalent rare earth elements, such as Eu3 , are also suitable if proper dopants are present. An example is Eu2O3 doped with Fe2O3. This masking material is harder than the components being manufactured and is opaque to the wavelength used in photoresist techniques while being transparent to visible wavelengths over broad thickness ranges. The mask can comprise a patterned layer on a substrate or patterned bulk crystals having regions of different thickness. Substrates such as soda-lime glass, sapphire, quartz, etc. are suitable. The masking material can be deposited as large area films having good uniformity and good optical properties. The material is readily etched but is not attacked by materials used in photoresist processing. Its reflectivity is very low, thereby providing easy alignment and good image definition during use.
Abstract:
THIS DISCLOSURE PROVIDES A MAGNETIC FILM WITH INDUCED UNIAXIAL ANISOTROPY, I.E., A FILM WITH AN EASY AXIS AND A HARD AXIS FOR MAGNETIZATION. THE PRACTIC OF THE DISCLOSURE INCLUDES DEPOSITION OF PARTIALLY IONIZED COMPONENTS OF A MAGNETIC MATERIAL ONTO A HEATED SUBSTRATE IN THE PRESENCE OF AN APPLIED ELECTRIC FIELD ADJACENT TO AND CONTIGUOUS WITH THE SURFACE OF THE SUBSTRATE. THE EASY AXIS OF THE INDUCED UNIAXIALY ANISTROPY IN THE DEPOSITED MAGNETIC FILM IS IN THE DIRECTION OF THE APPLIED ELECTRIC FIELD IN THE FILM. THE MAGNITUCES OF THE TEMPERATURE OF THE SURFACE OF THE SUBSTRATE AND OF THE ELECTRIC FIELD CONTROL BOTH THE MAGNITUDE AND DIRECTION OF THE UNIAXIAL ANISOTROPY IN THE FILM. THE DEGREE OF IONIZATION OF THE COMPONENTS OF THE FILM DURING VAPOR TRANSPORT TO THE SURFACE OF THE SUBSTRATE ESTABLISHES ANOTHER CONTROL OF THE RESULTANT INDUCED UNIAXIAL ANISTROPY IN THE FILM. EXEMPLARY MAGNETIC FILMS FOR THE PRACTICE OF THIS DISCLOSURE ARE NI-FE OF 81/19 RATIO OF THE ATOMIC COMPONENTS NI AND FE AND FILMS OF RARE EARTH COMPOUNDS AND ALLOYS, E.G., EUO COMPOUND AND EU-GD ALLOYS.
Abstract:
EPITAXIAL PROCESS OF FORMING FERRITE, Fe3O4 AND .gamma.Fe2O3 THIN FILMS ON SPECIAL MATERIALS A first thin film of appropriate texture, lattice constant, and crystal structure, such as body centered cubic vanadium or chromium with (110) texture is deposited upon a rigid or flexible substrate forming a plurality of polycrystals. A ferrite such as magnetite (Fe3O4) is sputtered from a target onto the first thin film forming a mixture of .gamma.Fe2O3 and Fe3O4 substantially completely without formation of Fe or other oxides of iron, providing good magnetic characteristics and resistance to corrosion. The substrate temperature can be maintained as low as 200.degree.C for both steps when sputtering or evaporation is employed.
Abstract:
A first thin film of appropriate texture, lattice constant, and crystal structure, such as body centered cubic vanadium or chromium with (110) texture is deposited upon a rigid or flexible substrate forming a plurality of polycrystals. A ferrite such as magnetite (Fe3O4) is sputtered from a target onto the first thin film forming a mixture of gamma Fe2O3 and Fe3O4 substantially completely without formation of Fe or other oxides of iron, providing good magnetic characteristics and resistance to corrosion. The substrate temperature can be maintained as low as 200 DEG C for both steps when sputtering or evaporation is employed.