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公开(公告)号:BE851929A
公开(公告)日:1977-06-16
申请号:BE175352
申请日:1977-02-28
Applicant: IBM
Inventor: BARILE C A , BRILL R M , FORNERIS J L , REGH J
IPC: H01L21/306 , H01L21/033 , H01L21/22 , H01L21/223 , H01L21/265 , H01L21/266 , H01L21/331 , H01L29/73 , H01L
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公开(公告)号:AU504131B2
公开(公告)日:1979-10-04
申请号:AU2365277
申请日:1977-03-25
Applicant: IBM
Inventor: BARILE C A , BRILL R M , FORNERIS J L , REGH J
IPC: H01L21/306 , H01L21/033 , H01L21/22 , H01L21/223 , H01L21/265 , H01L21/266 , H01L21/331 , H01L29/73 , H01L21/283 , H01L21/31 , H01L21/32 , H01L27/04
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公开(公告)号:SE7702443L
公开(公告)日:1977-10-06
申请号:SE7702443
申请日:1977-03-04
Applicant: IBM
Inventor: BARILE C A , BRILL R M , FORNERIS J L , REGH J
IPC: H01L21/306 , H01L21/033 , H01L21/22 , H01L21/223 , H01L21/265 , H01L21/266 , H01L21/331 , H01L29/73 , H05K3/00
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公开(公告)号:SE384761B
公开(公告)日:1976-05-17
申请号:SE7314793
申请日:1973-10-31
Applicant: IBM
Inventor: BARILE C A , DOCKERTY R C , NAGARAJAN A
IPC: H01L21/28 , H01L29/78 , H01L21/283 , H01L21/314 , H01L21/316 , H01L21/336 , H01L29/00 , H01L29/51
Abstract: Large threshold voltage shifts of silicon gate FET devices having a composite nitride-oxide gate dielectric are greatly reduced by subjecting the nitride to a dry oxygen annealing at temperatures between 970 DEG -1,150 DEG C prior to depositing the silicon gate electrode. Annealing at 1,050 DEG C applied for a duration of one-half to one hour produces excellent results.
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公开(公告)号:BE805959A
公开(公告)日:1974-02-01
申请号:BE136586
申请日:1973-10-11
Applicant: IBM
Inventor: BARILE C A , DOCKERTY R C , NAGARAJAN A
IPC: H01L29/78 , H01L21/28 , H01L21/283 , H01L21/314 , H01L21/316 , H01L21/336 , H01L29/00 , H01L29/51 , H01L
Abstract: Large threshold voltage shifts of silicon gate FET devices having a composite nitride-oxide gate dielectric are greatly reduced by subjecting the nitride to a dry oxygen annealing at temperatures between 970 DEG -1,150 DEG C prior to depositing the silicon gate electrode. Annealing at 1,050 DEG C applied for a duration of one-half to one hour produces excellent results.
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