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公开(公告)号:DE69309313T2
公开(公告)日:1997-09-25
申请号:DE69309313
申请日:1993-07-06
Applicant: IBM
Inventor: GERBER CHRISTOPH , GIMZEWSKI JAMES , REIHL BRUNO , SCHLITTLER RAETO
IPC: G01J3/42 , G01N25/22 , G01N13/10 , G01N13/16 , G01N21/27 , G01N25/34 , G01N25/36 , G01N25/48 , G01N27/00 , G01N37/00 , H01H1/00 , H01H37/52 , H01L41/08
Abstract: PCT No. PCT/EP94/00224 Sec. 371 Date Apr. 24, 1996 Sec. 102(e) Date Apr. 24, 1996 PCT Filed Jan. 27, 1994 PCT Pub. No. WO95/02170 PCT Pub. Date Jan. 19, 1995A spectrometer is described with a new intensity detector for electromagnetic radiation. The detector comprises means for detecting the deflection of a cantilever which has a bimetallic/bimorph structure. The deflection is proportional to the absorbed amount of radiation.
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公开(公告)号:AU1419002A
公开(公告)日:2002-05-21
申请号:AU1419002
申请日:2001-11-12
Applicant: IBM
Inventor: GIMZEWSKI JAMES , SEO JIN WON , SCHLITTLER RETO , WELLAND MARK E
Abstract: The invention is directed to a method of manufacturing single-walled carbon nanotubes comprising the steps of providing on a substrate at least one pillar comprising alternate layers of a first precursor material comprising fullerene molecules and a second precursor material comprising a catalyst, and heating the at least one pillar. It further is directed to a precursor arrangement for manufacturing single-walled carbon nanotubes comprising on a substrate at least one pillar comprising alternate layers of a first precursor material comprising fullerene molecules and a second precursor material comprising a catalyst. A third aspect is a nanotube arrangement comprising a substrate and thereupon at least one crystal comprising a bundle of single-walled carbon nanotubes with essentially identical orientation and structure.
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公开(公告)号:DE69309313D1
公开(公告)日:1997-04-30
申请号:DE69309313
申请日:1993-07-06
Applicant: IBM
Inventor: GERBER CHRISTOPH , GIMZEWSKI JAMES , REIHL BRUNO , SCHLITTLER RAETO
IPC: G01J3/42 , G01N25/22 , G01N13/10 , G01N13/16 , G01N21/27 , G01N25/34 , G01N25/36 , G01N25/48 , G01N27/00 , G01N37/00 , H01H1/00 , H01H37/52 , H01L41/08
Abstract: PCT No. PCT/EP94/00224 Sec. 371 Date Apr. 24, 1996 Sec. 102(e) Date Apr. 24, 1996 PCT Filed Jan. 27, 1994 PCT Pub. No. WO95/02170 PCT Pub. Date Jan. 19, 1995A spectrometer is described with a new intensity detector for electromagnetic radiation. The detector comprises means for detecting the deflection of a cantilever which has a bimetallic/bimorph structure. The deflection is proportional to the absorbed amount of radiation.
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公开(公告)号:DE60012962T2
公开(公告)日:2005-08-11
申请号:DE60012962
申请日:2000-10-16
Applicant: IBM , UNIV BASEL BASEL
Inventor: BALLER K , FRITZ JUERGEN , GERBER CHRISTOPH , GIMZEWSKI JAMES , LANG PETER
IPC: G01N33/53 , B81B3/00 , C12Q1/68 , G01N5/02 , G01N13/16 , G01N31/22 , G01N33/543 , G01N33/566 , G01N33/84 , G01N37/00
Abstract: Sensor system (70) for detecting a target substance in a reference liquid, comprising a measurement cantilever (71) being functionalized by application of a first coating to one of the measurement cantilever's surfaces, whereby this first coating is sensitive to the target substance. In addition, the system (70) comprises a reference cantilever (72) with a reference coating on one of the reference cantilever's surfaces, whereby this reference coating is less sensitive to the target substance than the first coating. Both cantilevers are arranged such that they can be exposed in a reference step to the reference liquid and in a detection step to the reference liquid with the target substance. A detector unit (73, 74, 83) is employed for determining the difference in the deflection of the measurement cantilever (71) and the reference cantilever (72) during the reference step and the detection step.
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公开(公告)号:DE60012962D1
公开(公告)日:2004-09-16
申请号:DE60012962
申请日:2000-10-16
Applicant: IBM , UNIV BASEL BASEL
Inventor: BALLER K , FRITZ JUERGEN , GERBER CHRISTOPH , GIMZEWSKI JAMES , LANG PETER
IPC: G01N33/53 , B81B3/00 , C12Q1/68 , G01N5/02 , G01N13/16 , G01N31/22 , G01N33/543 , G01N33/566 , G01N33/84 , G01N37/00
Abstract: Sensor system (70) for detecting a target substance in a reference liquid, comprising a measurement cantilever (71) being functionalized by application of a first coating to one of the measurement cantilever's surfaces, whereby this first coating is sensitive to the target substance. In addition, the system (70) comprises a reference cantilever (72) with a reference coating on one of the reference cantilever's surfaces, whereby this reference coating is less sensitive to the target substance than the first coating. Both cantilevers are arranged such that they can be exposed in a reference step to the reference liquid and in a detection step to the reference liquid with the target substance. A detector unit (73, 74, 83) is employed for determining the difference in the deflection of the measurement cantilever (71) and the reference cantilever (72) during the reference step and the detection step.
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公开(公告)号:AU7549700A
公开(公告)日:2001-05-14
申请号:AU7549700
申请日:2000-10-16
Inventor: BALLER MARKO K , FRITZ JUERGEN , GERBER CHRISTOPH , GIMZEWSKI JAMES , LANG HANS PETER
IPC: G01N33/53 , B81B3/00 , C12Q1/68 , G01N5/02 , G01N13/16 , G01N31/22 , G01N33/543 , G01N33/566 , G01N33/84 , G01N37/00
Abstract: Sensor system (70) for detecting a target substance in a reference liquid, comprising a measurement cantilever (71) being functionalized by application of a first coating to one of the measurement cantilever's surfaces, whereby this first coating is sensitive to the target substance. In addition, the system (70) comprises a reference cantilever (72) with a reference coating on one of the reference cantilever's surfaces, whereby this reference coating is less sensitive to the target substance than the first coating. Both cantilevers are arranged such that they can be exposed in a reference step to the reference liquid and in a detection step to the reference liquid with the target substance. A detector unit (73, 74, 83) is employed for determining the difference in the deflection of the measurement cantilever (71) and the reference cantilever (72) during the reference step and the detection step.
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