Si/SiGe HETEROSTRUCTURE FOR HIGH-SPEED COMPOSITE P-CHANNEL FIELD EFFECT DEVICE

    公开(公告)号:JP2000286413A

    公开(公告)日:2000-10-13

    申请号:JP2000065262

    申请日:2000-03-09

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To make applicable the structure of an epitaxial field effect transistor to the intended uses of high-speed low-noise microwave and quasi-millimetric- wave devices, etc., by integrating into the epitaxial field effect transistor a silicon layer, a germanium layer, and silicon-germanium layers which form jointly a modulatorily doped heterostructure. SOLUTION: After forming on a single-crystal semiconductor substrate 11 a buffer layer 12 including a layer 12A, a layer 12B, and a layer 12C, a p-type doped relaxation silicon-germanium layer 13 is formed on the layer 12C of the buffer layer 12. Then, thereon, as a spacer, a non-doped strained silicon layer 14 is grown epitaxially to grow further on the layer 14 epitaxially a non-doped thin relaxation silicon-germanium layer 15. Subsequently, on the layer 15, there are grown epitaxially in succession a germanium layer 16, a silicon-germanium layer 17, and a silicon-germanium cap layer 18 to form the laminated layer of them.

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