公开(公告)号：CA1241375A

公开(公告)日：1988-08-30

申请号：CA501737

申请日：1986-02-12

Applicant: IBM

Inventor： EICHELBERGER EDWARD B ,  LANGMAID ROGER N ,  LINDBLOOM ERIC ,  MOTIKA FRANCO ,  SINCHAK JOHN L ,  WAICUKAUSKI JOHN A

IPC: G02B13/04 ,  G01R31/28 ,  G02B13/06

Abstract: Weighted Random Pattern Testing Apparatus and Method A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.

公开(公告)号：DE3670697D1

公开(公告)日：1990-05-31

申请号：DE3670697

申请日：1986-06-18

Applicant: IBM

Inventor： EICHELBERGER EDWARD B ,  MOTIKA FRANCO ,  LANGMAID ROGER N ,  SINCHAK JOHN L ,  LINDBLOOM ERIC ,  WAICUKAUSKI JOHN A

IPC: G01R31/28 ,  G01R31/3183 ,  G01R31/3185 ,  G06F11/277 ,  G06F17/50