公开(公告)号：AT438864T

公开(公告)日：2009-08-15

申请号：AT03768630

申请日：2003-11-05

Applicant: IBM

Inventor： PASTEL LEAH

IPC: G01R31/30 ,  G01R31/26

Abstract: A voltage island system including a hot-switchable voltage bus for IDDQ current measurements. The voltage island system includes a plurality of voltage islands (V 1 , V 2 , . . . , Vn), a global power system, and a quiescent power system. The global power system includes a plurality of on-chip global header devices (H 1 , H 2 , . . . , Hn) for selectively providing a voltage VDDg to the plurality of voltage islands in response to global header control signals (x 1 , x 2 , . . . , xn), respectively. A global VDDg power supply provides power to the global header devices (H 1 , H 2 , . . . , Hn) via a VDDg power distribution grid/bus. The quiescent power system includes a plurality of on-chip quiescent header devices (H 1 q, H 2 q, . . . , Hnq) for selectively providing a quiescent voltage VDDq to the plurality of voltage islands in response to quiescent header control signals x 1 q, x 2 q, . . . , xnq, respectively. A quiescent VDDq power supply provides power to the quiescent header devices via a VDDq power distribution grid/bus.

公开(公告)号：AU2003213195A1

公开(公告)日：2004-09-17

申请号：AU2003213195

申请日：2003-02-20

Applicant: IBM

Inventor： ZUCHOWSKI PAUL S ,  OAKLAND STEVEN F ,  GATTIKER ANNE ,  NIGH PHIL ,  PASTEL LEAH ,  HORN JODY VAN

IPC: G01R31/3185 ,  H01L23/544 ,  H01L23/58 ,  H02J9/00

Abstract: A voltage island architecture wherein the source voltage of each voltage island can be independently turned on/off or adjusted during a scan-based test. The architecture includes a plurality of voltage islands, each powered by a respective island source voltage, and a testing circuit, coupled to the voltage islands, and powered by a global source voltage that is always on during test, wherein each island source voltage may be independently controlled during test.