公开(公告)号：AU2003217641A1

公开(公告)日：2004-09-17

申请号：AU2003217641

申请日：2003-02-20

Applicant: IBM

Inventor： HORN JODY VAN ,  ZUCHOWSKI PAUL S ,  GATTIKER ANNE ,  GROSCH DAVID A ,  KNOX MARC D ,  MOTIKA FRANCO ,  NIGH PHIL

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/26

公开(公告)号：AU2003213195A1

公开(公告)日：2004-09-17

申请号：AU2003213195

申请日：2003-02-20

Applicant: IBM

Inventor： ZUCHOWSKI PAUL S ,  OAKLAND STEVEN F ,  GATTIKER ANNE ,  NIGH PHIL ,  PASTEL LEAH ,  HORN JODY VAN

IPC: G01R31/3185 ,  H01L23/544 ,  H01L23/58 ,  H02J9/00

Abstract: A voltage island architecture wherein the source voltage of each voltage island can be independently turned on/off or adjusted during a scan-based test. The architecture includes a plurality of voltage islands, each powered by a respective island source voltage, and a testing circuit, coupled to the voltage islands, and powered by a global source voltage that is always on during test, wherein each island source voltage may be independently controlled during test.