ELECTROPLATING SOLDER TERMINAL AND ITS PREPARATION

    公开(公告)号:JPH0818205A

    公开(公告)日:1996-01-19

    申请号:JP14186495

    申请日:1995-06-08

    Applicant: IBM

    Abstract: PURPOSE: To allow a CrCu alloy layer to be selectively etched also and improve the yield and reliability of the structure of interconnection solder terminals, by etching a metal adhesive layer. CONSTITUTION: The electroplated solder terminal comprises a lower metal adhesive layer 80, a CrCu intermediate barrier layer 85 on the adhesive layer 80, a soldered joint layer 90 on the CrCu layer 85, and an upper solder layer 120. The adhesive layer 80 is a TiW layer or TiN layer. To manufacture this improved terminal metal, unnecessary regions, such as the soldered joint layer, the intermediate barrier layer and the lower joint layer, are removed from the area outside the solder region, and the soldered joint layer 90, the CrCu intermediate barrier layer 85 and the TiW lower metal adhesive layer 80 are formed. Specifically, after the deposition of TiW, the CrCu layer is deposited from a CrCu alloy target by sputtering, and further a Cu layer is deposited form a Cu target by sputtering. Thereafter, solder is selectively applied to the open positions between substrates to form the solder layer 120, and then etching is performed.

    CONTACT STUD STRUCTURE FOR CONNECTING SEMICONDUCTOR DEVICE

    公开(公告)号:JPH031570A

    公开(公告)日:1991-01-08

    申请号:JP20710589

    申请日:1989-08-11

    Applicant: IBM

    Abstract: PURPOSE: To provide a substrate contact point stud, having low electric migration characteristics without void, by comprising a first metal layer which, reaction with substrate material for sticking, is so deposited as to fill-up the hole of an insulation layer, a second metal layer of fire-proof metal deposited over it, and a third metal layer of fire-proof metal deposited over it. CONSTITUTION: An insulation body is deposited all over a substrate 1. Then, with the insulation body flattened, each part is selectively removed at a pre-determined position for a substrate surface for contact point to be exposed. Then, a reactive sticking layer 15 is deposited all over the insulation body and a contact point hole 5, and a crystal seed layer 21 is deposited on the sticking layer 15. These both layers are stuck by spattering with the sticking layer 15 being transition metal capable of reducing SiO2 , in addition, the crystal seed layer 21 preferred to be fire-proof metal. Then, fire-proof metal such as tungsten is chemically grown in gaseous atmosphere for completing formation of a contact point stud as a filler layer 17.

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