公开(公告)号：JPH10241399A

公开(公告)日：1998-09-11

申请号：JP3608898

申请日：1998-02-18

Applicant: IBM

Inventor： KALTER HOWARD L ,  JOHN EDWARD BASS JR ,  JEFFREY HARRIS DOREIBERUBISU ,  REX NUGO KOO ,  MORI YOTARO ,  JOHN STEWART PARENTEU JR ,  DONALD LAURENCE WEETER

IPC: G01R31/28 ,  G06F11/273 ,  G11C29/02 ,  G11C29/12 ,  G11C29/32 ,  G11C29/00

Abstract: PROBLEM TO BE SOLVED: To provide a built-in self test BIST macro of a processor base for testing a dynamic random access memory(DRAM) built in a logic chip. SOLUTION: A BIST macro 200 is provided with two ROMs in a sequencer 205, a first ROM is made a ROM for storing a test instruction, a second ROM is made a ROM for scanning, so as to perform sequencing of a test instruction stored in the first ROM as well as a branching function and a loop function. Further, the BIST macro 200 monitors obstacle in a DRAM, and is provided with a redundant allotting logic section 260 for exchanging an obstacle word line or a data line, or the both.

公开(公告)号：JPH11213700A

公开(公告)日：1999-08-06

申请号：JP1657598

申请日：1998-01-29

Applicant: IBM

Inventor： KALTER HOWARD L ,  JOHN EDWARD BASS JR ,  JEFFREY HARRIS DOREIBERUBISU ,  REX NUGO KOO ,  MORI YOTARO ,  JOHN STEWART PARENTEU JR ,  DONALD LAURENCE WEETER

IPC: G01R31/28 ,  G11C29/00 ,  G11C29/02 ,  G11C29/12

Abstract: PROBLEM TO BE SOLVED: To provide a built-in self inspection(BIST) for a processor base for testing a dynamic random access memory(DRAM) built in a logic chip. SOLUTION: A BIST 200 has two ROMs(read only memories) in a sequencer 205. One is to store test commands and the other is a ROM that can be scanned and provides not only a branch function and a loop function, but sequencing of test commands stored in the first ROM. A BIST macro has further a redundant allocation logic section 260 which monitors faults in a DRAM and exchanges a fault word line or a fault data line or both lines.