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公开(公告)号:US3564290A
公开(公告)日:1971-02-16
申请号:US3564290D
申请日:1969-03-13
Applicant: IBM
Inventor: SONODA GEORGE
IPC: H03K19/096 , H03K17/60
CPC classification number: H03K19/096
Abstract: This specification describes a logic circuit having a capacitor coupled between the gate and source of an FET to cause the potential at the gate to follow the potential at source. The charge of this capacitor is controlled to render the FET conductive or nonconductive so that pulses applied to the drain of the FET can be selectively gated or not gated through the FET to a load connected to the source of the FET. By operating the FET in this way small supply voltages may be used. These voltages can be in the order of the size of the signals transmitted to the load.
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公开(公告)号:CA1048645A
公开(公告)日:1979-02-13
申请号:CA225123
申请日:1975-04-17
Applicant: IBM
Inventor: CHU WILLIAM M , SONODA GEORGE
IPC: G11C11/413 , G06F11/22 , G11C11/412 , G11C29/00 , G11C29/04 , G11C29/14 , G11C29/50 , G11C29/56 , G01R31/00 , G01R31/26
Abstract: TEST TECHNIQUE FOR SEMICONDUCTOR MEMORY ARRAY Disclosed is a technique for testing electronic storage arrays including bistable storage cells fabricated in accordance with integrated semiconductor technology. Also described is the testing of load devices in a flip flop storage cell which is connected to a pair of bit lines that are inaccessible for the direct application of test signals. Testing is performed by altering the time duration of signals applied to the memory cells under test.
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公开(公告)号:CA1007371A
公开(公告)日:1977-03-22
申请号:CA172499
申请日:1973-05-28
Applicant: IBM
Inventor: SONODA GEORGE
IPC: G11C5/00 , G11C8/08 , H03K5/02 , H03K19/017 , H03K19/0185 , H03K19/096 , H03M7/00
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公开(公告)号:DE2621654A1
公开(公告)日:1977-01-20
申请号:DE2621654
申请日:1976-05-15
Applicant: IBM
Inventor: SONODA GEORGE
IPC: G11C11/412 , G11C7/00 , G11C11/40
Abstract: Disclosed is a field effect transistor (FET) memory array in which each of the cells forming the array comprises four FET's. The first and second of the four FET devices are cross-coupled while the third and fourth FET devices form loads for the cross-coupled pair. The load devices are never fully turned off so that complete D.C. stability is achieved with a four device cell because no one cell in an array of memory cells ever goes into a data retention mode.
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公开(公告)号:AU8067975A
公开(公告)日:1976-11-04
申请号:AU8067975
申请日:1975-04-30
Applicant: IBM
Inventor: CHU WILLIAM M , SONODA GEORGE
IPC: G11C11/413 , G06F11/22 , G11C11/412 , G11C29/00 , G11C29/04 , G11C29/14 , G11C29/50 , G11C29/56 , G01R31/28 , G11C11/34
Abstract: Disclosed is a technique for testing electronic storage arrays including bistable storage cells fabricated in accordance with integrated semiconductor technology. Also described is the testing of load devices in a flip flop storage cell which is connected to a pair of bit lines that are inaccessible for the direct application of test signals. Testing is performed by altering the time duration of signals applied to the memory cells under test.
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公开(公告)号:FR2296244A1
公开(公告)日:1976-07-23
申请号:FR7535239
申请日:1975-11-10
Applicant: IBM
Inventor: SONODA GEORGE
IPC: G11C11/412 , G11C11/40
Abstract: Disclosed is a field effect transistor (FET) memory array in which each of the cells forming the array comprises four FET's. The first and second of the four FET devices are cross-coupled while the third and fourth FET devices form loads for the cross-coupled pair. D.C. stability is achieved by conditioning the load FET devices into partial conduction during the stand-by state of the memory cell.
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公开(公告)号:DE2359151A1
公开(公告)日:1974-07-11
申请号:DE2359151
申请日:1973-11-28
Applicant: IBM
Inventor: CHU WILLIAM MAN-SIEW , LEE JAMES MINDA , SONODA GEORGE
IPC: H03K3/012 , H03K5/02 , H03K5/13 , H03K17/06 , H03K19/017
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公开(公告)号:DE2331442A1
公开(公告)日:1974-01-17
申请号:DE2331442
申请日:1973-06-20
Applicant: IBM
Inventor: SONODA GEORGE
IPC: G11C5/00 , G11C8/08 , H03K5/02 , H03K19/017 , H03K19/0185 , H03K19/096 , H03M7/00
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公开(公告)号:CA1060994A
公开(公告)日:1979-08-21
申请号:CA237271
申请日:1975-10-08
Applicant: IBM
Inventor: ASKIN HALUK O , JACOBSON EDWARD C , LEE JAMES M , SONODA GEORGE
Abstract: D.C. STABLE SEMICONDUCTOR MEMORY CELL Disclosed is a field effect transistor (FET) memory array in which each of the cells forming the array comprises four FET's . The first and second of the four FET devices are cross-coupled while the third and fourth FET devices form loads for the cross coupled pair. D.C. stability is achieved by conditioning the load FET devices into partial conduction during the stand-by state of the memory cell.
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公开(公告)号:CA1033410A
公开(公告)日:1978-06-20
申请号:CA201612
申请日:1974-06-04
Applicant: IBM
Inventor: LEE JAMES M , SONODA GEORGE
IPC: G11C11/41 , G01R31/28 , G05F3/20 , G11C11/407 , H01L21/822 , H01L27/04 , H01L29/78 , H03F1/30 , H03K19/094 , G01R31/26
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