METHOD FOR READING A SEMICONDUCTOR MEMORY

    公开(公告)号:DE3173744D1

    公开(公告)日:1986-03-20

    申请号:DE3173744

    申请日:1981-10-30

    Abstract: A method of and a circuit arrangement for reading an integrated MTL(I2L) store are described, wherein prior to or during a read operation, line capacities are discharged and in addition to the word line drivers and the bit line drivers, a read/write circuit is provided. Simultaneously with the selection of a word line (WL) or with a slight time delay (t1), two identical current sources (IRD0) are connected by means of two switches (S0 and S1) to the relevant bit lines (B0 and B1). As a result, the two injectors of the two bit line PNP transistors (T1 and T4) are supplied with the same currents. In a second phase (t2), the current sources (IRD0) are switched off so that the duration of the second time phase (t2) considerably exceeds the storage time constant ( tau e) of the bit line PNP transistor (T4) connected to the switched "OFF" NPN transistor (T3) of a cell. The effective storage time constant ( tau SAT) of the bit line PNP transistor (T1 ), connected to the switched on NPN cell transistor (T2), considerably exceeds the storage time constant ( tau e). As a result of the different time constants ( tau e and tau SAT), the two storage charges (Q1 and Q4) are discharged at different rates during the third phase (t3), thus generating a very fast and high output signal ( DELTA VBL=VS).

    MULTIPLE-ADDRESS HIGHLY INTEGRATED SEMI-CONDUCTOR MEMORY

    公开(公告)号:DE3070394D1

    公开(公告)日:1985-05-02

    申请号:DE3070394

    申请日:1980-11-26

    Abstract: A multiaddressable highly integrated semiconductor storage is provided, the storage locations of which are addressable by several independent address systems for parallel reading and/or writing. The storage locations are each made up of n storage elements. One storage location consists, for example, of at least two flip-flops which, via coupling elements are connected to associated separate bit and word lines. Each storage location has at least three independently selectable or addressable entry/exit ports permitting the following operations to be executed in parallel: Read word A, read word B, write word C as well as any combination of two or individual ones of those operations. The number of read ports can be increased by providing further address systems and by substituting triple, quadruple, etc., storage cells for a cell pair.

    6.
    发明专利
    未知

    公开(公告)号:CH596670A5

    公开(公告)日:1978-03-15

    申请号:CH254776

    申请日:1976-03-02

    Applicant: IBM

    Abstract: The disclosure is directed to the circuitry and monolithic semiconductor structure of Current Hogging Injection Logic Configurations. More specifically the disclosure relates to a semiconductor arrangement for the basic components of a highly integratable, logic semiconductor circuit concept predicated on multicollector inverter transistors which are fed by means of a carrier injection into their emitter/base zones.

    RECHARGE CIRCUIT FOR A SEMI-CONDUCTOR MEMORY

    公开(公告)号:DE3068176D1

    公开(公告)日:1984-07-19

    申请号:DE3068176

    申请日:1980-06-18

    Applicant: IBM

    Abstract: Disclosed is a restore circuit for restoring an integrated semiconductor storage array having storage cells consisting of bipolar transistors. The restore circuit includes a reference voltage generator, an impedance converter, and switches to connect the reference voltage generator and the impedance converter to the storage array. The reference voltage generating circuit includes a current source and at least one reference storage cell identical in construction to the storage cells of the array. The reference voltage generating circuit provides a reference voltage to the impedance converter which supplies a second reference voltage to the array at a greatly reduced impedance. The equivalent circuit of the storage cells is that of a capacitor in parallel with a diode. Thus, the impedance converter provides an initial surge of capacitive current which restores the cells, followed by a standby current which is a function of the diode characteristics of the cell equivalent circuit.

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