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公开(公告)号:AT456861T
公开(公告)日:2010-02-15
申请号:AT99870110
申请日:1999-06-01
Applicant: IMEC , ST MICROELECTRONICS NV
Inventor: GROESENEKEN GUIDO , RUSS CHRISTIAN
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公开(公告)号:DE69941977D1
公开(公告)日:2010-03-18
申请号:DE69941977
申请日:1999-06-01
Applicant: IMEC , ST MICROELECTRONICS NV
Inventor: GROESENEKEN GUIDO , RUSS CHRISTIAN
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公开(公告)号:JP2010067635A
公开(公告)日:2010-03-25
申请号:JP2008229949
申请日:2008-09-08
Inventor: THIJS STEVEN , TREMOUILLES DAVID ERIC , RUSS CHRISTIAN
IPC: H01L27/06 , H01L21/822 , H01L21/8234 , H01L27/04 , H01L27/088 , H01L29/78 , H01L29/786
Abstract: PROBLEM TO BE SOLVED: To provide an electronic circuit capable of protecting a circuit device from an ESD, in a FinFET integrated circuit generated at an ESD power level with a low ESD damage. SOLUTION: An electronic circuit 400' includes: at least one field-effect transistor which is protected from an electrostatic discharge phenomenon; and at least one protected field-effect transistor 400a. A protection field-effect transistor 400b includes a crystal orientation different from that of the protected field-effect transistor 400a. COPYRIGHT: (C)2010,JPO&INPIT
Abstract translation: 要解决的问题:提供一种能够在具有低ESD损伤的ESD功率电平下产生的FinFET集成电路中提供能够保护电路装置免受ESD的电子电路。 解决方案:电子电路400'包括:至少一个受到静电放电现象的场效晶体管; 和至少一个受保护的场效应晶体管400a。 保护场效应晶体管400b包括与受保护的场效应晶体管400a的晶体取向不同的晶体取向。 版权所有(C)2010,JPO&INPIT
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公开(公告)号:DE102008045551A1
公开(公告)日:2009-04-02
申请号:DE102008045551
申请日:2008-09-03
Applicant: IMEC VZW , INFINEON TECHNOLOGIES AG
Inventor: RUSS CHRISTIAN , THIJS STEVEN , TREMOUILLES DAVID
Abstract: An electronic circuit includes at least one field effect transistor that is to be protected against electrostatic discharge events, and at least one protection field effect transistor. The protection field effect transistor has a crystal orientation that is different from a crystal orientation of the field effect transistor to be protected.
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