公开(公告)号：DE10044537A1

公开(公告)日：2002-03-14

申请号：DE10044537

申请日：2000-09-05

Applicant: INFINEON TECHNOLOGIES AG

Inventor： GERSTMEIER GUENTER ,  MUTSCHALL DORIS ,  RICHTER FRANK ,  ROSSKOPF VALENTIN ,  SEITZ HELMUT

IPC: G11C29/02 ,  G11C29/50 ,  H01L21/8242 ,  H01L27/105 ,  H01L21/66 ,  G11C29/00 ,  H01L27/115

Abstract: The method involves contacting adjacent memory cells (2) via separate, spaced-apart conductive tracks (1), and then measuring the conductivity between the tracks. A pair of memory cells may be contacted to a predetermined number of parallel, spaced-apart conductive tracks. An Independent claim is included for a circuit device.