Abstract:
According to the invention, one or more external test connection contact points (pads; pins; balls), (2, 3) are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit (7, 8), and wherein the signals may be connected by means of routes located internally in the component from switch points that are not directly accessible, e.g. points inside the chip (15 to 20) or covered contact points. The device according to the invention is particularly useful for highly integrated semiconductor chips.
Abstract:
The invention relates to a device for cooling an integrated circuit of an electronic, preferably mobile, appliance. The device for cooling is provided with a cooling element. The integrated circuit is provided with areas, wherein the power is consumed in different manners. The inventive device is characterised in that said device is provided with at least two cooling element for selectively cooling a partial surface of the integrated circuit respectively. The temperature of heavily used or speed-determining areas of a circuit is thus specifically influenced. Different cooling elements can be controlled according to the temperature to be maintained or the current computing power of the area to be cooled respectively.