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    TUNABLE PHOTONIC CRYSTAL
    2.
    发明申请
    TUNABLE PHOTONIC CRYSTAL 审中-公开
    可调光子晶体

    公开(公告)号：WO2006010133A3

    公开(公告)日：2006-05-04

    申请号：PCT/US2005024654

    申请日：2005-07-08

    Applicant: ION OPTICS INC ,  PUSCASU IRINA ,  PRALLE MARTIN U ,  DALY JAMES T ,  MCNEAL MARK P ,  JOHNSON EDWARD A

    Inventor： PUSCASU IRINA ,  PRALLE MARTIN U ,  DALY JAMES T ,  MCNEAL MARK P ,  JOHNSON EDWARD A

    IPC: H01L33/00

    CPC classification number: G01N21/255 ,  B82Y20/00 ,  B82Y30/00 ,  G01J1/42 ,  G01J3/108 ,  G01J5/20 ,  G01N21/3504 ,  H01L31/101

    Abstract: An infrared emitter (10), which utilizes a photonic crystal (PC) structure to produce electromagnetic emissions with a narrow band of wavelengths, includes a semiconductor material layer (12), a dielectric material layer (14) overlaying the semiconductor material layer, and a metallic material layer (16) having an inner side overlaying the dielectric material layer. The semiconductor material layer (12) is capable of being coupled to an energy source for introducing energy to the semiconductor material layer. An array of surface features (18) are defined in the device in a periodic or quasi-periodic manner. The emitter device is adapted to emit electromagnetic energy having spectral characteristics determined by parameters of the periodically distributed surface features, the parameters including shape, size, depth, distribution geometry, periodicity, material properties and defects. The emitter device may also function as a selective detector of electromagnetic radiation.

    Abstract translation: 利用光子晶体（PC）结构产生具有窄波长带的电磁发射的红外发射器（10）包括半导体材料层（12），覆盖半导体材料层的电介质材料层（14），以及 金属材料层（16），其具有覆盖介电材料层的内侧。 半导体材料层（12）能够耦合到用于将能量引入半导体材料层的能量源。 表面特征（18）的阵列以周期性或准周期性方式在器件中定义。 发射器件适于发射具有通过周期性分布的表面特征的参数确定的光谱特性的电磁能，参数包括形状，尺寸，深度，分布几何形状，周期性，材料性质和缺陷。 发射器件还可以用作电磁辐射的选择性检测器。

    MONOLITHIC INFRARED SPECTROMETER APPARATUS AND METHODS
    3.
    发明申请
    MONOLITHIC INFRARED SPECTROMETER APPARATUS AND METHODS 审中-公开
    单色红外光谱仪器和方法

    公开(公告)号：WO9953350A9

    公开(公告)日：2000-03-02

    申请号：PCT/US9907781

    申请日：1999-04-09

    Applicant: ION OPTICS INC

    Inventor： DALY JAMES T ,  BODKIN ANDREW ,  GRODEN MICHAEL J ,  JOHNSON EDWARD A

    IPC: G01J3/18 ,  G01J3/28 ,  G01J3/42 ,  G02B6/34 ,  G02B6/293 ,  G01N21/35

    CPC classification number: G02B17/086 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/0259 ,  G01J3/0264 ,  G01J3/0283 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/18 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/42 ,  G01J2005/0077 ,  G02B6/29328

    Abstract: A monolithic spectrometer system providing vibration immunity and thermal stability, designed for infrared gas detection and chemical identification in the field or on the loading dock. One embodiment of the invention includes a spectrometer system (10) with the following elements: a silicon block waveguide (12); a cylindrical mirror (14); a diffraction grating (16); and a linear detector array (18). Electronics (20) can couple to the array (18) so as to collect electronic data representative of the spectral characteristics of the light (22) entering the system (10). Control of the system (10) is obtained through user interface (24). A battery (26) can be used to power the system (10).

    Abstract translation: 提供抗振动和热稳定性的单片光谱仪系统，专为红外气体检测和现场或装载码头的化学鉴定而设计。 本发明的一个实施例包括具有以下元件的光谱仪系统（10）：硅块波导（12）; 圆柱形镜（14）; 衍射光栅（16）; 和线性检测器阵列（18）。 电子器件（20）可以耦合到阵列（18），以便收集表示进入系统（10）的光（22）的光谱特性的电子数据。 通过用户界面（24）获得系统（10）的控制。 可以使用电池（26）为系统（10）供电。

    GAS DETECTION APPARATUS USING A COMBINED INFRARED SOURCE ANDHIGH TEMPERATURE BOLOMETER
    4.
    发明专利
    GAS DETECTION APPARATUS USING A COMBINED INFRARED SOURCE ANDHIGH TEMPERATURE BOLOMETER 未知

    公开(公告)号：CA2312706C

    公开(公告)日：2009-07-07

    申请号：CA2312706

    申请日：1998-12-04

    Applicant: ION OPTICS INC

    Inventor： JOHNSON EDWARD A ,  BODKIN WILLIAM ANDREW

    IPC: G01N21/61 ,  G01J5/08 ,  G01J5/20 ,  G01J5/24 ,  G01N21/35

    Abstract: An improved gas detector apparatus (100) includes a spectral source/bolomete r (102) for conducting an electrical current and for producing infrared radiation. The source/bolometer has a characteristic resistance that is a predetermined function of the source/bolometer temperature. A concentrating reflector (104) directs the infrared radiation through a spectral filter (106) and the gas. A return reflector (108) is disposed along the axis beyond the spectral filter and the gas, such that at least a portion of the infrared radiation passing through the filter and the gas is reflected back through the gas and the filter to the source/bolometer. A driver/detector (110) drives a current through the source/bolometer, determines the characteristic resistance of the source/bolometer, and detects the gas from a variation of the characteristic resistance.

    7.
    发明专利
    未知

    公开(公告)号：DE69839095T2

    公开(公告)日：2009-01-29

    申请号：DE69839095

    申请日：1998-12-04

    Applicant: ION OPTICS INC

    Inventor： JOHNSON EDWARD A ,  BODKIN WILLIAM ANDREW

    IPC: G01N21/35 ,  G01J3/10 ,  G01J5/02 ,  G01J5/08 ,  G01J5/20 ,  G01J5/24

    Abstract: An apparatus for detecting a gas having distinct infrared radiation absorption characteristics. The apparatus includes a spectral source/bolometer for conducting an electrical current and for producing an infrared radiation. The source/bolometer is disposed along an axis and has a temperature and a characteristic resistance, and the characteristic resistance is a predetermined function of the temperature. A return reflector is disposed along the axis beyond the gas such that at least a portion of the infrared radiation passing through the gas is reflected back through the gas to the source/bolometer. The apparatus also includes a driver/detector for driving a current through the source/bolometer, for determining the characteristic resistance, and for detecting the gas from a variation of the characteristic resistance.

    8.
    发明专利
    未知

    公开(公告)号：DE69839095D1

    公开(公告)日：2008-03-20

    申请号：DE69839095

    申请日：1998-12-04

    Applicant: ION OPTICS INC

    Inventor： JOHNSON EDWARD A ,  BODKIN WILLIAM ANDREW

    IPC: G01N21/35 ,  G01J3/10 ,  G01J5/02 ,  G01J5/08 ,  G01J5/20 ,  G01J5/24

    Abstract: An apparatus for detecting a gas having distinct infrared radiation absorption characteristics. The apparatus includes a spectral source/bolometer for conducting an electrical current and for producing an infrared radiation. The source/bolometer is disposed along an axis and has a temperature and a characteristic resistance, and the characteristic resistance is a predetermined function of the temperature. A return reflector is disposed along the axis beyond the gas such that at least a portion of the infrared radiation passing through the gas is reflected back through the gas to the source/bolometer. The apparatus also includes a driver/detector for driving a current through the source/bolometer, for determining the characteristic resistance, and for detecting the gas from a variation of the characteristic resistance.

    TUNABLE PHOTONIC CRYSTAL
    9.
    发明专利
    TUNABLE PHOTONIC CRYSTAL 未知

    公开(公告)号：CA2573149A1

    公开(公告)日：2006-01-26

    申请号：CA2573149

    申请日：2005-07-08

    Applicant: ION OPTICS INC

    Inventor： PUSCASU IRINA ,  PRALLE MARTIN U ,  DALY JAMES T ,  JOHNSON EDWARD A ,  MCNEAL MARK P

    IPC: H01L33/00

    Abstract: An infrared emitter, which utilizes a photonic crystal (PC) structure to produce electromagnetic emissions with a narrow hand of wavelengths, includes a semiconductor material layer, a dielectric material layer overlaying the semiconductor material layer, and a metallic material layer having an inner side overlaying the dielectric material layer. The semiconductor material layer is capable of being coupled to an energy source for introducing energy to the semiconductor material layer. An array of surface features are defined in the device in a periodic manner or quasi-periodic. The emitter device is adapted to emit electromagnetic energy having spectral characteristics determined by parameters of the periodically distributed surface features, the parameters including shape, size, depth, distribution geometry, periodicity, material properties and defects.

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