Abstract:
Provided is a method of depositing an amorphous silicon thin film by chemical vapor deposition (CVD) to prevent bubble defect occurring when an amorphous silicon thin film is deposited on a substrate contaminated by air exposure. The deposition method includes cleaning a surface of the contaminated substrate with a reaction gas activated by plasma and depositing an amorphous silicon thin film on the cleaned substrate. Here, a vacuum state is maintained from the substrate cleaning step to the thin film deposition step in order to prevent contamination of the surface of the cleaned substrate by re-exposure to air.
Abstract:
Provided is an apparatus and method of initializing a recording layer used in manufacturing a phase-change optical disk for storing information. The optical disk (200) is initialized using a UV lamp (110) in order to initialize the recording layer of the phase-change optical disk (200) capable of repeatedly writing information, without a separate optical head, whereby it is possible to increase productivity by remarkably reducing an initialization time of the optical disk since a large area is initialized using a UV beam. The recording layer may have a main component made of at least one selected from a group consisting of Ge, Sb, Te, In, Sn and Ga, and an additive made of at least one of Ag and Bi.
Abstract:
Provided is an apparatus and method of initializing a recording layer used in manufacturing a phase-change optical disk for storing information. The optical disk (200) is initialized using a UV lamp (110) in order to initialize the recording layer of the phase-change optical disk (200) capable of repeatedly writing information, without a separate optical head, whereby it is possible to increase productivity by remarkably reducing an initialization time of the optical disk since a large area is initialized using a UV beam. The recording layer may have a main component made of at least one selected from a group consisting of Ge, Sb, Te, In, Sn and Ga, and an additive made of at least one of Ag and Bi.
Abstract:
PURPOSE: A method for depositing of an amorphous silicon thin film is provided to prevent the deformity of the bubble type due to the evaporation of the amorphous silicon thin film to the polluted top of the substrate. The manufacture yield of device is improved. CONSTITUTION: A polluted substrate is provided by a reaction chamber(S20). Here, the polluted substrate comes due to exposure among the air. The surface of substrate is washed with a reaction gas(S22). Here, the reaction gas is activated with the plasma. The amorphous silicon thin film is evaporated in the washed substrate(S24). In the cleaning step of substrate, vacuum maintains for the deposition step of the thin film.
Abstract:
PURPOSE: A resistive materials for a bolometer, the bolometer for an infrared detector using the materials, and a method for preparing the same are provided to have high TCR, low resistivity and low noise constant by adding at least one element selected from nitrogen, oxygen, and germanium into antimony. CONSTITUTION: A detection circuit is formed inside a semiconductor substrate(110). A reflective film(112) is formed in the partial domain of the surface of the semiconductor substrate. A metal pad(114) is spaced from both sides of a reflective film by a certain interval. A sensor structure(130) is located on the top of the semiconductor substrate. The sensor structure comprises a register(142).