APPARATUS AND METHOD FOR STABILIZING FREQUENCY OF LASER
    1.
    发明申请
    APPARATUS AND METHOD FOR STABILIZING FREQUENCY OF LASER 审中-公开
    用于稳定激光频率的装置和方法

    公开(公告)号:WO2009031769A3

    公开(公告)日:2009-05-07

    申请号:PCT/KR2008004799

    申请日:2008-08-19

    Abstract: A frequency- stabilized laser apparatus and a method for stabilizing the frequency of a laser are disclosed. A semiconductor laser emits a beam. An external reflector has a resonance frequency and feeds back the emitted beam to the semiconductor laser if the frequency of the emitted beam is equal to the resonance frequency. An interference signal generator generates an interference signal for detecting the wavelength of the emitted beam and a controller detects the wavelength of the beam from the generated interference signal. According to the frequency- stabilized laser apparatus and the method for stabilizing the frequency of the laser, it is possible to stabilize the frequency of the beam emitted from the semiconductor laser and output the beam having the stable frequency for a long period of time.

    Abstract translation: 公开了一种频率稳定的激光装置和用于稳定激光器频率的方法。 半导体激光器发射光束。 如果发射光束的频率等于谐振频率,则外部反射器具有谐振频率并将发射的光束反馈到半导体激光器。 干扰信号发生器产生用于检测发射波束的波长的干扰信号,并且控制器根据所产生的干扰信号来检测波束的波长。 根据频率稳定的激光装置和稳定激光器的频率的方法,可以稳定从半导体激光器发射的光束的频率并输出长时间具有稳定频率的光束。

    ABSOLUTE POSITION MEASUREMENT METHOD, ABSOLUTE POSITION MEASUREMENT DEVICE, AND SCALE
    2.
    发明申请
    ABSOLUTE POSITION MEASUREMENT METHOD, ABSOLUTE POSITION MEASUREMENT DEVICE, AND SCALE 审中-公开
    绝对位置测量方法,绝对位置测量装置和尺寸

    公开(公告)号:WO2013172561A3

    公开(公告)日:2014-01-03

    申请号:PCT/KR2013003469

    申请日:2013-04-23

    Abstract: The present invention provides an absolute position measurement method, absolute position measurement device, and scale. The scale includes a scale pattern formed by replacing repetitively arranged pseudo-random codes with a sequence of N-stage linear feedback transition resisters by using a first symbol having a first width and representing a first state and a second symbol having the first width and representing a second state. The first symbol is divided into two or more first symbol areas, the second symbol is divided into two or more second symbol areas, and there is at least one overlap area having the same structure due to the overlap of the first symbol and the second symbol.

    Abstract translation: 本发明提供绝对位置测量方法,绝对位置测量装置和刻度。 缩放比例包括通过使用具有第一宽度并表示第一状态的第一符号和具有第一宽度的第二符号代替重复排列的伪随机码与N级线性反馈转换电阻序列而形成的比例模式, 第二个状态 第一符号被划分为两个或更多个第一符号区域,第二符号被划分为两个或更多个第二符号区域,并且由于第一符号和第二符号的重叠而存在具有相同结构的至少一个重叠区域 。

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