Abstract:
The present invention relates to a Fourier transform deflectometry system (1) and method for the optical inspection of a phase and amplitude object (2) placed in an optical path between a grating (3) and an imaging system (4), at a distance h of said grating 3. The grating (3) forms a contrast-based periodic pattern with spatial frequencies μ 0 , v 0 in, respectively, orthogonal axes x,y in an image plane, and the imaging system (4) comprises an objective (5) and an imaging sensor (6) comprising a plurality of photosensitive elements. Spatial frequencies μ 0 , v 0 are equal or lower than the Nyquist frequencies of the imaging system in the respective x and y axes. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object (2), is first captured through the objective (5) by the imaging sensor (6). Then, a Fourier transform of said first image in a spatial frequency domain is calculated, at least one first- or higher-order spectrum of said Fourier transform is selected and shifted in said frequency domain, so as to substantially place it at a central frequency of said Fourier transform, and a reverse Fourier transform of said at least one shifted first- or higher-order spectrum of said Fourier transform is performed so as to obtain a complex function g(x,y)=l(x,y)eiφ(x,y), wherein l(x,y) is an intensity and φ(x,y) a phase linked to optical deflection angles θ x , θ y in, respectively, the directions of the x and y axes, in the following form: φ(x,y)=- 2ττh(μ 0 tanθ x +v 0 tanθ y ).
Abstract:
Described herein is a hyperspectral imaging system (500) in which a polarising beam splitter (510), a Wollaston prism (520), an optical system (530), and a plane mirror (540) are arranged on an optical axis (550) of the imaging system (500). An imaging detector (560) is provided on which radiation is focussed by an imaging lens (570). The Wollaston prism (520) is imaged on itself by the optical system (530) and the plane mirror (540) so that translation of the Wollaston prism (520) in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.
Abstract:
Described herein is a hyperspectral imaging system (500) in which a polarising beam splitter (510), a Wollaston prism (520), an optical system (530), and a plane mirror (540) are arranged on an optical axis (550) of the imaging system (500). An imaging detector (560) is provided on which radiation is focussed by an imaging lens (570). The Wollaston prism (520) is imaged on itself by the optical system (530) and the plane mirror (540) so that translation of the Wollaston prism (520) in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.
Abstract:
The present invention relates to a Fourier transform deflectometry system 1 and method for the optical inspection of a phase and amplitude object 2 placed in an optical path between a grating 3 and an imaging system 4, at a distance h of said grating 3. The grating 3 forms a contrast-based periodic pattern with spatial frequencies µ 0 , v 0 in, respectively, orthogonal axes x,y in an image plane, and the imaging system 4 comprises an objective 5 and an imaging sensor 6 comprising a plurality of photosensitive elements. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object 2, is first captured through the objective 5 by the imaging sensor 6. Then, a Fourier transform of said first image in a spatial frequency domain is calculated, at least one first- or higher-order spectrum of said Fourier transform is selected and shifted in said frequency domain, so as to substantially place it at a central frequency of said Fourier transform, and a reverse Fourier transform of said at least one shifted first- or higher-order spectrum of said Fourier transform is performed so as to obtain a complex function g(x,y)=I(x,y)e iÕp(x,y) , wherein I(x,y) is an intensity and Õ(x,y) a phase linked to optical deflection angles ¸ x , ¸ y in, respectively, the directions of the x and y axes, in the following form: Õ(x,y)=-2Àh(µ 0 tan¸ x +v 0 tan¸ y ).
Abstract translation:本发明涉及一种傅里叶变换折射系统1和方法,用于光栅3和成像系统4之间的光路中放置的相位和幅度物体2的光学检查,光栅3的距离为h。光栅 3在图像平面中分别形成具有空间频率μ0,v 0正交轴x,y的基于对比度的周期性图案,并且成像系统4包括物镜5和成像传感器6,成像传感器6包括多个光敏元件 。 根据本发明的方法,首先通过成像传感器6通过物镜5捕获由相位和幅度物体2失真的所述图案的第一图像。然后,以空间频率对所述第一图像进行傅里叶变换 计算所述傅立叶变换的至少一个一阶或更高阶谱,并且在所述频域中移动所述傅立叶变换的至少一个一阶或更高阶谱,以便将其基本上置于所述傅立叶变换的中心频率处,并且所述傅里叶变换的傅立叶逆变换 (x,y)= I(x,y),其中I(x,y)= I )是一个强度和Õ(x,y)a相,它们分别与x和y轴方向上的光学偏转角x,y y相关联,形式如下:Õ(x,y)= - 2 - h (μ0 tan?x + v 0 tan?y)。
Abstract:
The present invention relates to a Fourier transform deflectometry system (1) and method for the optical inspection of a phase and amplitude object (2) placed in an optical path between a grating (3) and an imaging system (4), at a distance h of said grating 3. The grating (3) forms a contrast-based periodic pattern with spatial frequencies μ0, v0 in, respectively, orthogonal axes x,y in an image plane, and the imaging system (4) comprises an objective (5) and an imaging sensor (6) comprising a plurality of photosensitive elements. Spatial frequencies μ0, v0 are equal or lower than the Nyquist frequencies of the imaging system in the respective x and y axes. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object (2), is first captured through the objective (5) by the imaging sensor (6). Then, a Fourier transform of said first image in a spatial frequency domain is calculated, at least one first- or higher-order spectrum of said Fourier transform is selected and shifted in said frequency domain, so as to substantially place it at a central frequency of said Fourier transform, and a reverse Fourier transform of said at least one shifted first- or higher-order spectrum of said Fourier transform is performed so as to obtain a complex function g(x,y)=l(x,y)eiφ(x,y), wherein l(x,y) is an intensity and φ(x,y) a phase linked to optical deflection angles ϑx, ϑy in, respectively, the directions of the x and y axes, in the following form: φ(x,y)=- 2ττh(μ0tanϑx+v0tanϑy).